ISTFA 2007: proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
c2007
|
| Schlagworte: | |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | xvi, 356 p. |
| ISBN: | 0871708639 9780871708632 |
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| 246 | 1 | 3 | |a Proceedings of the 33rd International Symposium for Testing and Failure Analysis |
| 246 | 1 | 3 | |a 33rd International Symposium for Testing and Failure Analysis |
| 246 | 1 | 3 | |a Thirty-third International Symposium for Testing and Failure Analysis |
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Datensatz im Suchindex
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| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:46:12Z |
| institution | BVB |
| isbn | 0871708639 9780871708632 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029596358 |
| oclc_num | 647828198 |
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| physical | xvi, 356 p. |
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| publishDate | 2007 |
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| publisher | ASM International |
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| spelling | International Symposium for Testing and Failure Analysis < 2007, San Jose, Calif.> Verfasser aut ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International Proceedings of the 33rd International Symposium for Testing and Failure Analysis 33rd International Symposium for Testing and Failure Analysis Thirty-third International Symposium for Testing and Failure Analysis Materials Park, OH ASM International c2007 xvi, 356 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth |
| spellingShingle | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA |
| title_alt | Proceedings of the 33rd International Symposium for Testing and Failure Analysis 33rd International Symposium for Testing and Failure Analysis Thirty-third International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA |
| title_exact_search | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA |
| title_full | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International |
| title_fullStr | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International |
| title_full_unstemmed | ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International |
| title_short | ISTFA 2007 |
| title_sort | istfa 2007 proceedings of the 33rd international symposium for testing and failure analysis november 4 8 2007 san jose mcenery convention center san jose california usa |
| title_sub | proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA |
| topic | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| topic_facet | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Konferenzschrift |
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