ISTFA 2001: proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
c2001
|
| Schlagworte: | |
| Beschreibung: | Sponsored by EDFAS, ISTFA. Includes bibliographical references and index |
| Beschreibung: | xix, 485 p. |
| ISBN: | 9780871707468 0871707462 |
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Datensatz im Suchindex
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| dewey-hundreds | 600 - Technology (Applied sciences) |
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| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
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| indexdate | 2024-07-10T07:46:00Z |
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| isbn | 9780871707468 0871707462 |
| language | English |
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| spelling | International Symposium for Testing and Failure Analysis < 2001, Santa Clara, Calif.> Verfasser aut ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California sponsored by EDFAS. Proceedings of the 27th International Symposium or Testing and Failure Analysis Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis Materials Park, OH ASM International c2001 xix, 485 p. txt rdacontent c rdamedia cr rdacarrier Sponsored by EDFAS, ISTFA. Includes bibliographical references and index Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Prüftechnik (DE-588)4047610-8 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Elektronik (DE-588)4014346-6 s Prüftechnik (DE-588)4047610-8 s DE-604 ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth |
| spellingShingle | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Prüftechnik (DE-588)4047610-8 gnd Elektronik (DE-588)4014346-6 gnd |
| subject_GND | (DE-588)4047610-8 (DE-588)4014346-6 (DE-588)1071861417 |
| title | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California |
| title_alt | Proceedings of the 27th International Symposium or Testing and Failure Analysis Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California |
| title_exact_search | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California |
| title_full | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California sponsored by EDFAS. |
| title_fullStr | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California sponsored by EDFAS. |
| title_full_unstemmed | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California sponsored by EDFAS. |
| title_short | ISTFA 2001 |
| title_sort | istfa 2001 proceedings of the 27th international symposium for testing and failure analysis 11 15 november 2001 santa clara convention center santa clara california |
| title_sub | proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California |
| topic | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Prüftechnik (DE-588)4047610-8 gnd Elektronik (DE-588)4014346-6 gnd |
| topic_facet | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Prüftechnik Elektronik Konferenzschrift |
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