ISTFA 2002: proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz.
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
2002
|
| Schlagworte: | |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | xxiv, 789 p. |
| ISBN: | 0871707713 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044182278 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170217s2002 |||| o||u| ||||||eng d | ||
| 020 | |a 0871707713 |9 0-87170-771-3 | ||
| 035 | |a (ZDB-30-PAD)EBC3002336 | ||
| 035 | |a (ZDB-89-EBL)EBL3002336 | ||
| 035 | |a (OCoLC)842666320 | ||
| 035 | |a (DE-599)BVBBV044182278 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 110 | 2 | |a International Symposium for Testing and Failure Analysis < 2002, Phoenix, Ariz.> |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a ISTFA 2002 |b proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. |c sponsored by EDFAS, ISTFA. |
| 246 | 1 | 3 | |a Proceedings of the 28th International Symposium for Testing and Failure Analysis |
| 246 | 1 | 3 | |a Conference proceedings from the 28th International Symposium for Testing and Failure Analysis |
| 264 | 1 | |a Materials Park, OH |b ASM International |c 2002 | |
| 300 | |a xxiv, 789 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Electronics |x Materials |x Testing |v Congresses | |
| 650 | 4 | |a Electronic apparatus and appliances |x Testing |v Congresses | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 710 | 2 | |a ASM International |e Sonstige |4 oth | |
| 710 | 2 | |a Electronic Device Failure Analysis Society |e Sonstige |4 oth | |
| 912 | |a ZDB-30-PAD | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029589123 | ||
Datensatz im Suchindex
| _version_ | 1804177307692171264 |
|---|---|
| any_adam_object | |
| author_corporate | International Symposium for Testing and Failure Analysis < 2002, Phoenix, Ariz.> |
| author_corporate_role | aut |
| author_facet | International Symposium for Testing and Failure Analysis < 2002, Phoenix, Ariz.> |
| author_sort | International Symposium for Testing and Failure Analysis < 2002, Phoenix, Ariz.> |
| building | Verbundindex |
| bvnumber | BV044182278 |
| collection | ZDB-30-PAD |
| ctrlnum | (ZDB-30-PAD)EBC3002336 (ZDB-89-EBL)EBL3002336 (OCoLC)842666320 (DE-599)BVBBV044182278 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01583nmm a2200373zc 4500</leader><controlfield tag="001">BV044182278</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170217s2002 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0871707713</subfield><subfield code="9">0-87170-771-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC3002336</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL3002336</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)842666320</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044182278</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">International Symposium for Testing and Failure Analysis < 2002, Phoenix, Ariz.></subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">ISTFA 2002</subfield><subfield code="b">proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz.</subfield><subfield code="c">sponsored by EDFAS, ISTFA.</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Proceedings of the 28th International Symposium for Testing and Failure Analysis</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Conference proceedings from the 28th International Symposium for Testing and Failure Analysis</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Materials Park, OH</subfield><subfield code="b">ASM International</subfield><subfield code="c">2002</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xxiv, 789 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ASM International</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Electronic Device Failure Analysis Society</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PAD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029589123</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV044182278 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:46:00Z |
| institution | BVB |
| isbn | 0871707713 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029589123 |
| oclc_num | 842666320 |
| open_access_boolean | |
| physical | xxiv, 789 p. |
| psigel | ZDB-30-PAD |
| publishDate | 2002 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| publisher | ASM International |
| record_format | marc |
| spelling | International Symposium for Testing and Failure Analysis < 2002, Phoenix, Ariz.> Verfasser aut ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. sponsored by EDFAS, ISTFA. Proceedings of the 28th International Symposium for Testing and Failure Analysis Conference proceedings from the 28th International Symposium for Testing and Failure Analysis Materials Park, OH ASM International 2002 xxiv, 789 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth |
| spellingShingle | ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. |
| title_alt | Proceedings of the 28th International Symposium for Testing and Failure Analysis Conference proceedings from the 28th International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. |
| title_exact_search | ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. |
| title_full | ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. sponsored by EDFAS, ISTFA. |
| title_fullStr | ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. sponsored by EDFAS, ISTFA. |
| title_full_unstemmed | ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. sponsored by EDFAS, ISTFA. |
| title_short | ISTFA 2002 |
| title_sort | istfa 2002 proceedings of the 28th international symposium for testing and failure analysis 3 7 november 2002 phoenix civic center phoenix ariz |
| title_sub | proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. |
| topic | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| topic_facet | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Konferenzschrift |
| work_keys_str_mv | AT internationalsymposiumfortestingandfailureanalysis2002phoenixariz istfa2002proceedingsofthe28thinternationalsymposiumfortestingandfailureanalysis37november2002phoenixciviccenterphoenixariz AT asminternational istfa2002proceedingsofthe28thinternationalsymposiumfortestingandfailureanalysis37november2002phoenixciviccenterphoenixariz AT electronicdevicefailureanalysissociety istfa2002proceedingsofthe28thinternationalsymposiumfortestingandfailureanalysis37november2002phoenixciviccenterphoenixariz AT internationalsymposiumfortestingandfailureanalysis2002phoenixariz proceedingsofthe28thinternationalsymposiumfortestingandfailureanalysis AT asminternational proceedingsofthe28thinternationalsymposiumfortestingandfailureanalysis AT electronicdevicefailureanalysissociety proceedingsofthe28thinternationalsymposiumfortestingandfailureanalysis AT internationalsymposiumfortestingandfailureanalysis2002phoenixariz conferenceproceedingsfromthe28thinternationalsymposiumfortestingandfailureanalysis AT asminternational conferenceproceedingsfromthe28thinternationalsymposiumfortestingandfailureanalysis AT electronicdevicefailureanalysissociety conferenceproceedingsfromthe28thinternationalsymposiumfortestingandfailureanalysis |