Cluster secondary ion mass spectrometry: principles and applications
Gespeichert in:
Format: | Elektronisch E-Book |
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Sprache: | English |
Veröffentlicht: |
Hoboken, N.J.
John Wiley & Sons, Inc.
2013
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Schlagworte: | |
Beschreibung: | Includes bibliographical references and index |
Beschreibung: | 348 p |
ISBN: | 9781118589250 |
Internformat
MARC
LEADER | 00000nmm a2200000zc 4500 | ||
---|---|---|---|
001 | BV044174646 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | cr|uuu---uuuuu | ||
008 | 170217s2013 |||| o||u| ||||||eng d | ||
020 | |a 9781118589250 |9 978-1-118-58925-0 | ||
035 | |a (ZDB-30-PAD)EBC1169505 | ||
035 | |a (ZDB-89-EBL)EBL1169505 | ||
035 | |a (OCoLC)841914445 | ||
035 | |a (DE-599)BVBBV044174646 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
082 | 0 | |a 543/.65 |2 23 | |
084 | |a UM 3120 |0 (DE-625)145868: |2 rvk | ||
084 | |a VE 8600 |0 (DE-625)147149:253 |2 rvk | ||
084 | |a VG 9800 |0 (DE-625)147244:253 |2 rvk | ||
245 | 1 | 0 | |a Cluster secondary ion mass spectrometry |b principles and applications |c edited by Christine M. Mahoney |
264 | 1 | |a Hoboken, N.J. |b John Wiley & Sons, Inc. |c 2013 | |
300 | |a 348 p | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
500 | |a Includes bibliographical references and index | ||
650 | 4 | |a Secondary ion mass spectrometry | |
650 | 4 | |a Mass spectrometry | |
650 | 0 | 7 | |a Clusterion |0 (DE-588)4148106-9 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Sekundärionen-Massenspektrometrie |0 (DE-588)4077346-2 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Sekundärionen-Massenspektrometrie |0 (DE-588)4077346-2 |D s |
689 | 0 | 1 | |a Clusterion |0 (DE-588)4148106-9 |D s |
689 | 0 | |8 1\p |5 DE-604 | |
700 | 1 | |a Mahoney, Christine M. |e Sonstige |4 oth | |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe, Hardcover |z 978-0-470-88605-2 |
912 | |a ZDB-30-PAD | ||
999 | |a oai:aleph.bib-bvb.de:BVB01-029581491 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk |
Datensatz im Suchindex
_version_ | 1804177295139667968 |
---|---|
any_adam_object | |
building | Verbundindex |
bvnumber | BV044174646 |
classification_rvk | UM 3120 VE 8600 VG 9800 |
collection | ZDB-30-PAD |
ctrlnum | (ZDB-30-PAD)EBC1169505 (ZDB-89-EBL)EBL1169505 (OCoLC)841914445 (DE-599)BVBBV044174646 |
dewey-full | 543/.65 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 543 - Analytical chemistry |
dewey-raw | 543/.65 |
dewey-search | 543/.65 |
dewey-sort | 3543 265 |
dewey-tens | 540 - Chemistry and allied sciences |
discipline | Chemie / Pharmazie Physik |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01633nmm a2200445zc 4500</leader><controlfield tag="001">BV044174646</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170217s2013 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118589250</subfield><subfield code="9">978-1-118-58925-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC1169505</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL1169505</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)841914445</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044174646</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">543/.65</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UM 3120</subfield><subfield code="0">(DE-625)145868:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VE 8600</subfield><subfield code="0">(DE-625)147149:253</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VG 9800</subfield><subfield code="0">(DE-625)147244:253</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Cluster secondary ion mass spectrometry</subfield><subfield code="b">principles and applications</subfield><subfield code="c">edited by Christine M. Mahoney</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hoboken, N.J.</subfield><subfield code="b">John Wiley & Sons, Inc.</subfield><subfield code="c">2013</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">348 p</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Secondary ion mass spectrometry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mass spectrometry</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Clusterion</subfield><subfield code="0">(DE-588)4148106-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Sekundärionen-Massenspektrometrie</subfield><subfield code="0">(DE-588)4077346-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Sekundärionen-Massenspektrometrie</subfield><subfield code="0">(DE-588)4077346-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Clusterion</subfield><subfield code="0">(DE-588)4148106-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Mahoney, Christine M.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe, Hardcover</subfield><subfield code="z">978-0-470-88605-2</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PAD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029581491</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
id | DE-604.BV044174646 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T07:45:48Z |
institution | BVB |
isbn | 9781118589250 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029581491 |
oclc_num | 841914445 |
open_access_boolean | |
physical | 348 p |
psigel | ZDB-30-PAD |
publishDate | 2013 |
publishDateSearch | 2013 |
publishDateSort | 2013 |
publisher | John Wiley & Sons, Inc. |
record_format | marc |
spelling | Cluster secondary ion mass spectrometry principles and applications edited by Christine M. Mahoney Hoboken, N.J. John Wiley & Sons, Inc. 2013 348 p txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Secondary ion mass spectrometry Mass spectrometry Clusterion (DE-588)4148106-9 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s Clusterion (DE-588)4148106-9 s 1\p DE-604 Mahoney, Christine M. Sonstige oth Erscheint auch als Druck-Ausgabe, Hardcover 978-0-470-88605-2 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Cluster secondary ion mass spectrometry principles and applications Secondary ion mass spectrometry Mass spectrometry Clusterion (DE-588)4148106-9 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
subject_GND | (DE-588)4148106-9 (DE-588)4077346-2 |
title | Cluster secondary ion mass spectrometry principles and applications |
title_auth | Cluster secondary ion mass spectrometry principles and applications |
title_exact_search | Cluster secondary ion mass spectrometry principles and applications |
title_full | Cluster secondary ion mass spectrometry principles and applications edited by Christine M. Mahoney |
title_fullStr | Cluster secondary ion mass spectrometry principles and applications edited by Christine M. Mahoney |
title_full_unstemmed | Cluster secondary ion mass spectrometry principles and applications edited by Christine M. Mahoney |
title_short | Cluster secondary ion mass spectrometry |
title_sort | cluster secondary ion mass spectrometry principles and applications |
title_sub | principles and applications |
topic | Secondary ion mass spectrometry Mass spectrometry Clusterion (DE-588)4148106-9 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
topic_facet | Secondary ion mass spectrometry Mass spectrometry Clusterion Sekundärionen-Massenspektrometrie |
work_keys_str_mv | AT mahoneychristinem clustersecondaryionmassspectrometryprinciplesandapplications |