Atomic force microscopy: exploring basic modes and advanced applications
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Hoboken, N.J.
John Wiley & Sons
c2012
|
| Schlagworte: | |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | xxii, 464 p. |
| ISBN: | 9780470638828 9781118360699 |
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| 650 | 4 | |a Scanning proble microscopy | |
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| isbn | 9780470638828 9781118360699 |
| language | English |
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| spelling | Haugstad, Greg 1963- Verfasser aut Atomic force microscopy exploring basic modes and advanced applications Greg Haugstad Hoboken, N.J. John Wiley & Sons c2012 xxii, 464 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Atomic force microscopy Scanning proble microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 s 1\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Haugstad, Greg 1963- Atomic force microscopy exploring basic modes and advanced applications Atomic force microscopy Scanning proble microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4274473-8 |
| title | Atomic force microscopy exploring basic modes and advanced applications |
| title_auth | Atomic force microscopy exploring basic modes and advanced applications |
| title_exact_search | Atomic force microscopy exploring basic modes and advanced applications |
| title_full | Atomic force microscopy exploring basic modes and advanced applications Greg Haugstad |
| title_fullStr | Atomic force microscopy exploring basic modes and advanced applications Greg Haugstad |
| title_full_unstemmed | Atomic force microscopy exploring basic modes and advanced applications Greg Haugstad |
| title_short | Atomic force microscopy |
| title_sort | atomic force microscopy exploring basic modes and advanced applications |
| title_sub | exploring basic modes and advanced applications |
| topic | Atomic force microscopy Scanning proble microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Atomic force microscopy Scanning proble microscopy Rasterkraftmikroskopie |
| work_keys_str_mv | AT haugstadgreg atomicforcemicroscopyexploringbasicmodesandadvancedapplications |