Electromigration in ULSI interconnections:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Hackensack, N.J.
World Scientific
c2010
|
| Schriftenreihe: | International series on advances in solid state electronics and technology
|
| Schlagworte: | |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | xix, 291 p. |
| ISBN: | 9814273325 9789814273329 9789814273336 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044156277 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170217s2010 |||| o||u| ||||||eng d | ||
| 020 | |a 9814273325 |9 981-4273-32-5 | ||
| 020 | |a 9789814273329 |9 978-981-4273-32-9 | ||
| 020 | |a 9789814273336 |c Online |9 978-981-4273-33-6 | ||
| 035 | |a (ZDB-30-PAD)EBC731200 | ||
| 035 | |a (ZDB-89-EBL)EBL731200 | ||
| 035 | |a (OCoLC)714877548 | ||
| 035 | |a (DE-599)BVBBV044156277 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 621.3815284 |2 22 | |
| 100 | 1 | |a Tan, Cher Ming |d 1959- |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Electromigration in ULSI interconnections |c Cher Ming Tan |
| 264 | 1 | |a Hackensack, N.J. |b World Scientific |c c2010 | |
| 300 | |a xix, 291 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a International series on advances in solid state electronics and technology | |
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Integrated circuits |x Ultra large scale integration | |
| 650 | 4 | |a Electrodiffusion | |
| 912 | |a ZDB-30-PAD | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029563122 | ||
Datensatz im Suchindex
| _version_ | 1804177263787245568 |
|---|---|
| any_adam_object | |
| author | Tan, Cher Ming 1959- |
| author_facet | Tan, Cher Ming 1959- |
| author_role | aut |
| author_sort | Tan, Cher Ming 1959- |
| author_variant | c m t cm cmt |
| building | Verbundindex |
| bvnumber | BV044156277 |
| collection | ZDB-30-PAD |
| ctrlnum | (ZDB-30-PAD)EBC731200 (ZDB-89-EBL)EBL731200 (OCoLC)714877548 (DE-599)BVBBV044156277 |
| dewey-full | 621.3815284 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815284 |
| dewey-search | 621.3815284 |
| dewey-sort | 3621.3815284 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01197nmm a2200361zc 4500</leader><controlfield tag="001">BV044156277</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170217s2010 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9814273325</subfield><subfield code="9">981-4273-32-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789814273329</subfield><subfield code="9">978-981-4273-32-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789814273336</subfield><subfield code="c">Online</subfield><subfield code="9">978-981-4273-33-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC731200</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL731200</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)714877548</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044156277</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815284</subfield><subfield code="2">22</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Tan, Cher Ming</subfield><subfield code="d">1959-</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Electromigration in ULSI interconnections</subfield><subfield code="c">Cher Ming Tan</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hackensack, N.J.</subfield><subfield code="b">World Scientific</subfield><subfield code="c">c2010</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xix, 291 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">International series on advances in solid state electronics and technology</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Ultra large scale integration</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrodiffusion</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PAD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029563122</subfield></datafield></record></collection> |
| id | DE-604.BV044156277 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:45:18Z |
| institution | BVB |
| isbn | 9814273325 9789814273329 9789814273336 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029563122 |
| oclc_num | 714877548 |
| open_access_boolean | |
| physical | xix, 291 p. |
| psigel | ZDB-30-PAD |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | World Scientific |
| record_format | marc |
| series2 | International series on advances in solid state electronics and technology |
| spelling | Tan, Cher Ming 1959- Verfasser aut Electromigration in ULSI interconnections Cher Ming Tan Hackensack, N.J. World Scientific c2010 xix, 291 p. txt rdacontent c rdamedia cr rdacarrier International series on advances in solid state electronics and technology Includes bibliographical references and index Integrated circuits Ultra large scale integration Electrodiffusion |
| spellingShingle | Tan, Cher Ming 1959- Electromigration in ULSI interconnections Integrated circuits Ultra large scale integration Electrodiffusion |
| title | Electromigration in ULSI interconnections |
| title_auth | Electromigration in ULSI interconnections |
| title_exact_search | Electromigration in ULSI interconnections |
| title_full | Electromigration in ULSI interconnections Cher Ming Tan |
| title_fullStr | Electromigration in ULSI interconnections Cher Ming Tan |
| title_full_unstemmed | Electromigration in ULSI interconnections Cher Ming Tan |
| title_short | Electromigration in ULSI interconnections |
| title_sort | electromigration in ulsi interconnections |
| topic | Integrated circuits Ultra large scale integration Electrodiffusion |
| topic_facet | Integrated circuits Ultra large scale integration Electrodiffusion |
| work_keys_str_mv | AT tancherming electromigrationinulsiinterconnections |