Digital holography for MEMS and microsystem metrology:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Chichester, West Sussex, U.K.
Wiley
2011
|
| Schriftenreihe: | Wiley microsystem and nanotechnology series
|
| Schlagworte: | |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | xxii, 205 p. |
| ISBN: | 9781119997306 9781119997290 9781119972785 9781119972792 |
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| 245 | 1 | 0 | |a Digital holography for MEMS and microsystem metrology |c edited by Anand Asundi |
| 264 | 1 | |a Chichester, West Sussex, U.K. |b Wiley |c 2011 | |
| 300 | |a xxii, 205 p. | ||
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| 490 | 0 | |a Wiley microsystem and nanotechnology series | |
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| 650 | 4 | |a Holographic testing | |
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Datensatz im Suchindex
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| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
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| id | DE-604.BV044154635 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:45:15Z |
| institution | BVB |
| isbn | 9781119997306 9781119997290 9781119972785 9781119972792 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029561480 |
| oclc_num | 746324291 |
| open_access_boolean | |
| physical | xxii, 205 p. |
| psigel | ZDB-30-PAD |
| publishDate | 2011 |
| publishDateSearch | 2011 |
| publishDateSort | 2011 |
| publisher | Wiley |
| record_format | marc |
| series2 | Wiley microsystem and nanotechnology series |
| spelling | Digital holography for MEMS and microsystem metrology edited by Anand Asundi Chichester, West Sussex, U.K. Wiley 2011 xxii, 205 p. txt rdacontent c rdamedia cr rdacarrier Wiley microsystem and nanotechnology series Includes bibliographical references and index Microelectromechanical systems Measurement Microelectronics Measurement Holographic testing Image processing Digital techniques Asundi, Anand Sonstige oth Erscheint auch als Druck-Ausgabe, Hardcover 978-0-470-97869-6 |
| spellingShingle | Digital holography for MEMS and microsystem metrology Microelectromechanical systems Measurement Microelectronics Measurement Holographic testing Image processing Digital techniques |
| title | Digital holography for MEMS and microsystem metrology |
| title_auth | Digital holography for MEMS and microsystem metrology |
| title_exact_search | Digital holography for MEMS and microsystem metrology |
| title_full | Digital holography for MEMS and microsystem metrology edited by Anand Asundi |
| title_fullStr | Digital holography for MEMS and microsystem metrology edited by Anand Asundi |
| title_full_unstemmed | Digital holography for MEMS and microsystem metrology edited by Anand Asundi |
| title_short | Digital holography for MEMS and microsystem metrology |
| title_sort | digital holography for mems and microsystem metrology |
| topic | Microelectromechanical systems Measurement Microelectronics Measurement Holographic testing Image processing Digital techniques |
| topic_facet | Microelectromechanical systems Measurement Microelectronics Measurement Holographic testing Image processing Digital techniques |
| work_keys_str_mv | AT asundianand digitalholographyformemsandmicrosystemmetrology |