Electromagnetic nondestructive evaluation (XII):
Gespeichert in:
Körperschaft: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Amsterdam
IOS
2009
|
Schriftenreihe: | Studies in applied electromagnetics and mechanics
v. 32 |
Schlagworte: | |
Beschreibung: | Includes bibliographical references and index |
Beschreibung: | xxvii, 416 p. |
ISBN: | 9781607500230 |
Internformat
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082 | 0 | |a 620.1127 |2 22 | |
110 | 2 | |a International Workshop on Electromagnetic Nondestructive Evaluation < 2008, Seoul, Korea> |e Verfasser |4 aut | |
245 | 1 | 0 | |a Electromagnetic nondestructive evaluation (XII) |c edited by Young-Kil Shin, Hyang-Beom Lee and Sung-Jin Song |
264 | 1 | |a Amsterdam |b IOS |c 2009 | |
300 | |a xxvii, 416 p. | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 0 | |a Studies in applied electromagnetics and mechanics |v v. 32 | |
500 | |a Includes bibliographical references and index | ||
650 | 4 | |a Electromagnetic measurements |v Congresses | |
650 | 4 | |a Nondestructive testing |v Congresses | |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
700 | 1 | |a Shin, Young-Kil |e Sonstige |4 oth | |
700 | 1 | |a Lee, Hyang-Beom |e Sonstige |4 oth | |
700 | 1 | |a Song, Sung-Jin |e Sonstige |4 oth | |
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Datensatz im Suchindex
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author_corporate | International Workshop on Electromagnetic Nondestructive Evaluation < 2008, Seoul, Korea> |
author_corporate_role | aut |
author_facet | International Workshop on Electromagnetic Nondestructive Evaluation < 2008, Seoul, Korea> |
author_sort | International Workshop on Electromagnetic Nondestructive Evaluation < 2008, Seoul, Korea> |
building | Verbundindex |
bvnumber | BV044140262 |
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dewey-full | 620.1127 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 620 - Engineering and allied operations |
dewey-raw | 620.1127 |
dewey-search | 620.1127 |
dewey-sort | 3620.1127 |
dewey-tens | 620 - Engineering and allied operations |
format | Electronic eBook |
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illustrated | Not Illustrated |
indexdate | 2024-07-10T07:44:51Z |
institution | BVB |
isbn | 9781607500230 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029547107 |
oclc_num | 491265005 |
open_access_boolean | |
physical | xxvii, 416 p. |
psigel | ZDB-30-PAD |
publishDate | 2009 |
publishDateSearch | 2009 |
publishDateSort | 2009 |
publisher | IOS |
record_format | marc |
series2 | Studies in applied electromagnetics and mechanics |
spelling | International Workshop on Electromagnetic Nondestructive Evaluation < 2008, Seoul, Korea> Verfasser aut Electromagnetic nondestructive evaluation (XII) edited by Young-Kil Shin, Hyang-Beom Lee and Sung-Jin Song Amsterdam IOS 2009 xxvii, 416 p. txt rdacontent c rdamedia cr rdacarrier Studies in applied electromagnetics and mechanics v. 32 Includes bibliographical references and index Electromagnetic measurements Congresses Nondestructive testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content Shin, Young-Kil Sonstige oth Lee, Hyang-Beom Sonstige oth Song, Sung-Jin Sonstige oth |
spellingShingle | Electromagnetic nondestructive evaluation (XII) Electromagnetic measurements Congresses Nondestructive testing Congresses |
subject_GND | (DE-588)1071861417 |
title | Electromagnetic nondestructive evaluation (XII) |
title_auth | Electromagnetic nondestructive evaluation (XII) |
title_exact_search | Electromagnetic nondestructive evaluation (XII) |
title_full | Electromagnetic nondestructive evaluation (XII) edited by Young-Kil Shin, Hyang-Beom Lee and Sung-Jin Song |
title_fullStr | Electromagnetic nondestructive evaluation (XII) edited by Young-Kil Shin, Hyang-Beom Lee and Sung-Jin Song |
title_full_unstemmed | Electromagnetic nondestructive evaluation (XII) edited by Young-Kil Shin, Hyang-Beom Lee and Sung-Jin Song |
title_short | Electromagnetic nondestructive evaluation (XII) |
title_sort | electromagnetic nondestructive evaluation xii |
topic | Electromagnetic measurements Congresses Nondestructive testing Congresses |
topic_facet | Electromagnetic measurements Congresses Nondestructive testing Congresses Konferenzschrift |
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