High-resolution electron microscopy:
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
New York
Oxford University Press
2009
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Schriftenreihe: | Monographs on the physics and chemistry of materials
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Schlagworte: | |
Beschreibung: | Includes bibliographies and index |
Beschreibung: | xvii, 401, [4] p. |
ISBN: | 9780199552757 |
Internformat
MARC
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Datensatz im Suchindex
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any_adam_object | |
author | Spence, John C. H. |
author_facet | Spence, John C. H. |
author_role | aut |
author_sort | Spence, John C. H. |
author_variant | j c h s jch jchs |
building | Verbundindex |
bvnumber | BV044135596 |
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dewey-full | 502.825 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 502 - Miscellany |
dewey-raw | 502.825 |
dewey-search | 502.825 |
dewey-sort | 3502.825 |
dewey-tens | 500 - Natural sciences and mathematics |
discipline | Allgemeine Naturwissenschaft |
format | Electronic eBook |
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illustrated | Not Illustrated |
indexdate | 2024-07-10T07:44:43Z |
institution | BVB |
isbn | 9780199552757 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029542441 |
oclc_num | 609832302 |
open_access_boolean | |
physical | xvii, 401, [4] p. |
psigel | ZDB-30-PAD |
publishDate | 2009 |
publishDateSearch | 2009 |
publishDateSort | 2009 |
publisher | Oxford University Press |
record_format | marc |
series2 | Monographs on the physics and chemistry of materials |
spelling | Spence, John C. H. Verfasser aut High-resolution electron microscopy John C.H. Spence New York Oxford University Press 2009 xvii, 401, [4] p. txt rdacontent c rdamedia cr rdacarrier Monographs on the physics and chemistry of materials Includes bibliographies and index Transmission electron microscopes Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Festkörper (DE-588)4016918-2 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Elektronenbeugung (DE-588)4151862-7 gnd rswk-swf Hochauflösendes Verfahren (DE-588)4287503-1 gnd rswk-swf Struktur (DE-588)4058125-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Hochauflösendes Verfahren (DE-588)4287503-1 s 1\p DE-604 Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s 2\p DE-604 Struktur (DE-588)4058125-1 s 3\p DE-604 Festkörper (DE-588)4016918-2 s 4\p DE-604 Elektronenbeugung (DE-588)4151862-7 s 5\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Spence, John C. H. High-resolution electron microscopy Transmission electron microscopes Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd Festkörper (DE-588)4016918-2 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Elektronenbeugung (DE-588)4151862-7 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd Struktur (DE-588)4058125-1 gnd |
subject_GND | (DE-588)4014327-2 (DE-588)4016918-2 (DE-588)4215608-7 (DE-588)4151862-7 (DE-588)4287503-1 (DE-588)4058125-1 |
title | High-resolution electron microscopy |
title_auth | High-resolution electron microscopy |
title_exact_search | High-resolution electron microscopy |
title_full | High-resolution electron microscopy John C.H. Spence |
title_fullStr | High-resolution electron microscopy John C.H. Spence |
title_full_unstemmed | High-resolution electron microscopy John C.H. Spence |
title_short | High-resolution electron microscopy |
title_sort | high resolution electron microscopy |
topic | Transmission electron microscopes Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd Festkörper (DE-588)4016918-2 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Elektronenbeugung (DE-588)4151862-7 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd Struktur (DE-588)4058125-1 gnd |
topic_facet | Transmission electron microscopes Electron microscopy Elektronenmikroskopie Festkörper Durchstrahlungselektronenmikroskopie Elektronenbeugung Hochauflösendes Verfahren Struktur |
work_keys_str_mv | AT spencejohnch highresolutionelectronmicroscopy |