Advanced production testing of RF, SoC, and SiP devices:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston
Artech House
2007
|
| Schriftenreihe: | Artech House microwave library
|
| Schlagworte: | |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | xx, 301 p. |
| ISBN: | 158053709X 9781580537094 9781580537100 |
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| 264 | 1 | |a Boston |b Artech House |c 2007 | |
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| 650 | 4 | |a Systems on a chip |x Testing | |
| 650 | 4 | |a Embedded computer systems | |
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Datensatz im Suchindex
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| author | Kelly, Joe |
| author_facet | Kelly, Joe |
| author_role | aut |
| author_sort | Kelly, Joe |
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| bvnumber | BV044129167 |
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| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:44:33Z |
| institution | BVB |
| isbn | 158053709X 9781580537094 9781580537100 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029536012 |
| oclc_num | 437208186 |
| open_access_boolean | |
| physical | xx, 301 p. |
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| publishDate | 2007 |
| publishDateSearch | 2007 |
| publishDateSort | 2007 |
| publisher | Artech House |
| record_format | marc |
| series2 | Artech House microwave library |
| spelling | Kelly, Joe Verfasser aut Advanced production testing of RF, SoC, and SiP devices Joe Kelly, Michael Engelhardt Boston Artech House 2007 xx, 301 p. txt rdacontent c rdamedia cr rdacarrier Artech House microwave library Includes bibliographical references and index Systems on a chip Testing Embedded computer systems Engelhardt, M. Sonstige oth |
| spellingShingle | Kelly, Joe Advanced production testing of RF, SoC, and SiP devices Systems on a chip Testing Embedded computer systems |
| title | Advanced production testing of RF, SoC, and SiP devices |
| title_auth | Advanced production testing of RF, SoC, and SiP devices |
| title_exact_search | Advanced production testing of RF, SoC, and SiP devices |
| title_full | Advanced production testing of RF, SoC, and SiP devices Joe Kelly, Michael Engelhardt |
| title_fullStr | Advanced production testing of RF, SoC, and SiP devices Joe Kelly, Michael Engelhardt |
| title_full_unstemmed | Advanced production testing of RF, SoC, and SiP devices Joe Kelly, Michael Engelhardt |
| title_short | Advanced production testing of RF, SoC, and SiP devices |
| title_sort | advanced production testing of rf soc and sip devices |
| topic | Systems on a chip Testing Embedded computer systems |
| topic_facet | Systems on a chip Testing Embedded computer systems |
| work_keys_str_mv | AT kellyjoe advancedproductiontestingofrfsocandsipdevices AT engelhardtm advancedproductiontestingofrfsocandsipdevices |