Terrestrial radiation effects in ULSI devices and electronic systems:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Singapore
IEEE Wiley
2015
|
| Schlagworte: | |
| Online-Zugang: | Buchcover |
| Beschreibung: | Description based on print version record |
| Beschreibung: | 1 online resource (295 pages) illustrations |
| ISBN: | 9781118479292 9781118479315 |
Internformat
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| 650 | 4 | |a Integrated circuits |x Ultra large scale integration |x Reliability | |
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| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |a Ibe, Eishi H |t . Terrestrial radiation effects in ULSI devices and electronic systems |
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Datensatz im Suchindex
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| any_adam_object | 1 |
| author | Ibe, Eishi H. |
| author_facet | Ibe, Eishi H. |
| author_role | aut |
| author_sort | Ibe, Eishi H. |
| author_variant | e h i eh ehi |
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| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV044072807 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T07:42:50Z |
| institution | BVB |
| isbn | 9781118479292 9781118479315 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029479652 |
| oclc_num | 899942102 |
| open_access_boolean | |
| physical | 1 online resource (295 pages) illustrations |
| psigel | ZDB-30-PAD |
| publishDate | 2015 |
| publishDateSearch | 2015 |
| publishDateSort | 2015 |
| publisher | IEEE Wiley |
| record_format | marc |
| spelling | Ibe, Eishi H. aut Terrestrial radiation effects in ULSI devices and electronic systems Eishi H. Ibe Singapore IEEE Wiley 2015 © 2015 1 online resource (295 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Description based on print version record Electronic circuits Effect of radiation on Integrated circuits Ultra large scale integration Reliability Integrated circuits Effect of radiation on Erscheint auch als Druck-Ausgabe Ibe, Eishi H . Terrestrial radiation effects in ULSI devices and electronic systems SWB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029479652&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Buchcover |
| spellingShingle | Ibe, Eishi H. Terrestrial radiation effects in ULSI devices and electronic systems Electronic circuits Effect of radiation on Integrated circuits Ultra large scale integration Reliability Integrated circuits Effect of radiation on |
| title | Terrestrial radiation effects in ULSI devices and electronic systems |
| title_auth | Terrestrial radiation effects in ULSI devices and electronic systems |
| title_exact_search | Terrestrial radiation effects in ULSI devices and electronic systems |
| title_full | Terrestrial radiation effects in ULSI devices and electronic systems Eishi H. Ibe |
| title_fullStr | Terrestrial radiation effects in ULSI devices and electronic systems Eishi H. Ibe |
| title_full_unstemmed | Terrestrial radiation effects in ULSI devices and electronic systems Eishi H. Ibe |
| title_short | Terrestrial radiation effects in ULSI devices and electronic systems |
| title_sort | terrestrial radiation effects in ulsi devices and electronic systems |
| topic | Electronic circuits Effect of radiation on Integrated circuits Ultra large scale integration Reliability Integrated circuits Effect of radiation on |
| topic_facet | Electronic circuits Effect of radiation on Integrated circuits Ultra large scale integration Reliability Integrated circuits Effect of radiation on |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029479652&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT ibeeishih terrestrialradiationeffectsinulsidevicesandelectronicsystems |