Scanning probe microscopy for industrial applications: nanomechanical characterization
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Hoboken, New Jersey
Wiley
2014
|
| Schlagworte: | |
| Beschreibung: | Description based on print version record |
| Beschreibung: | 1 online resource (385 pages) illustrations (some color), graphs |
| ISBN: | 9781118288238 9781118723142 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044064213 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170217s2014 |||| o||u| ||||||eng d | ||
| 020 | |a 9781118288238 |c Print |9 978-1-118-28823-8 | ||
| 020 | |a 9781118723142 |c ebook |9 978-1-118-72314-2 | ||
| 035 | |a (ZDB-30-PAD)EBC1483726 | ||
| 035 | |a (ZDB-89-EBL)EBL1483726 | ||
| 035 | |a (ZDB-38-EBR)ebr10788041 | ||
| 035 | |a (OCoLC)868954409 | ||
| 035 | |a (DE-599)BVBBV044064213 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 620.1/127 |2 23 | |
| 245 | 1 | 0 | |a Scanning probe microscopy for industrial applications |b nanomechanical characterization |c edited by Dalia G. Yablon |
| 264 | 1 | |a Hoboken, New Jersey |b Wiley |c 2014 | |
| 264 | 4 | |c © 2014 | |
| 300 | |a 1 online resource (385 pages) |b illustrations (some color), graphs | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Description based on print version record | ||
| 650 | 4 | |a Materials |x Microscopy | |
| 650 | 4 | |a Scanning probe microscopy |x Industrial applications | |
| 650 | 0 | 7 | |a Nanostrukturiertes Material |0 (DE-588)4342626-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Rastersondenmikroskopie |0 (DE-588)4330328-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Industrie |0 (DE-588)4026779-9 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4143413-4 |a Aufsatzsammlung |2 gnd-content | |
| 689 | 0 | 0 | |a Rastersondenmikroskopie |0 (DE-588)4330328-6 |D s |
| 689 | 0 | 1 | |a Nanostrukturiertes Material |0 (DE-588)4342626-8 |D s |
| 689 | 0 | 2 | |a Industrie |0 (DE-588)4026779-9 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Yablon, Dalia G. |d 1975- |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |a Scanning probe microscopy for industrial applications : nanomechanical characterization |
| 912 | |a ZDB-30-PAD |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029471058 | ||
Datensatz im Suchindex
| _version_ | 1804177092618747904 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV044064213 |
| collection | ZDB-30-PAD ZDB-38-ESG |
| ctrlnum | (ZDB-30-PAD)EBC1483726 (ZDB-89-EBL)EBL1483726 (ZDB-38-EBR)ebr10788041 (OCoLC)868954409 (DE-599)BVBBV044064213 |
| dewey-full | 620.1/127 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.1/127 |
| dewey-search | 620.1/127 |
| dewey-sort | 3620.1 3127 |
| dewey-tens | 620 - Engineering and allied operations |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01863nmm a2200469zc 4500</leader><controlfield tag="001">BV044064213</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170217s2014 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118288238</subfield><subfield code="c">Print</subfield><subfield code="9">978-1-118-28823-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118723142</subfield><subfield code="c">ebook</subfield><subfield code="9">978-1-118-72314-2</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC1483726</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL1483726</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-38-EBR)ebr10788041</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)868954409</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044064213</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620.1/127</subfield><subfield code="2">23</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Scanning probe microscopy for industrial applications</subfield><subfield code="b">nanomechanical characterization</subfield><subfield code="c">edited by Dalia G. Yablon</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hoboken, New Jersey</subfield><subfield code="b">Wiley</subfield><subfield code="c">2014</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2014</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (385 pages)</subfield><subfield code="b">illustrations (some color), graphs</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Description based on print version record</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials</subfield><subfield code="x">Microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scanning probe microscopy</subfield><subfield code="x">Industrial applications</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Nanostrukturiertes Material</subfield><subfield code="0">(DE-588)4342626-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rastersondenmikroskopie</subfield><subfield code="0">(DE-588)4330328-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Industrie</subfield><subfield code="0">(DE-588)4026779-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4143413-4</subfield><subfield code="a">Aufsatzsammlung</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rastersondenmikroskopie</subfield><subfield code="0">(DE-588)4330328-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Nanostrukturiertes Material</subfield><subfield code="0">(DE-588)4342626-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Industrie</subfield><subfield code="0">(DE-588)4026779-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Yablon, Dalia G.</subfield><subfield code="d">1975-</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="a">Scanning probe microscopy for industrial applications : nanomechanical characterization</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PAD</subfield><subfield code="a">ZDB-38-ESG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029471058</subfield></datafield></record></collection> |
| genre | (DE-588)4143413-4 Aufsatzsammlung gnd-content |
| genre_facet | Aufsatzsammlung |
| id | DE-604.BV044064213 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T07:42:35Z |
| institution | BVB |
| isbn | 9781118288238 9781118723142 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029471058 |
| oclc_num | 868954409 |
| open_access_boolean | |
| physical | 1 online resource (385 pages) illustrations (some color), graphs |
| psigel | ZDB-30-PAD ZDB-38-ESG |
| publishDate | 2014 |
| publishDateSearch | 2014 |
| publishDateSort | 2014 |
| publisher | Wiley |
| record_format | marc |
| spelling | Scanning probe microscopy for industrial applications nanomechanical characterization edited by Dalia G. Yablon Hoboken, New Jersey Wiley 2014 © 2014 1 online resource (385 pages) illustrations (some color), graphs txt rdacontent c rdamedia cr rdacarrier Description based on print version record Materials Microscopy Scanning probe microscopy Industrial applications Nanostrukturiertes Material (DE-588)4342626-8 gnd rswk-swf Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Industrie (DE-588)4026779-9 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content Rastersondenmikroskopie (DE-588)4330328-6 s Nanostrukturiertes Material (DE-588)4342626-8 s Industrie (DE-588)4026779-9 s DE-604 Yablon, Dalia G. 1975- Sonstige oth Erscheint auch als Druck-Ausgabe Scanning probe microscopy for industrial applications : nanomechanical characterization |
| spellingShingle | Scanning probe microscopy for industrial applications nanomechanical characterization Materials Microscopy Scanning probe microscopy Industrial applications Nanostrukturiertes Material (DE-588)4342626-8 gnd Rastersondenmikroskopie (DE-588)4330328-6 gnd Industrie (DE-588)4026779-9 gnd |
| subject_GND | (DE-588)4342626-8 (DE-588)4330328-6 (DE-588)4026779-9 (DE-588)4143413-4 |
| title | Scanning probe microscopy for industrial applications nanomechanical characterization |
| title_auth | Scanning probe microscopy for industrial applications nanomechanical characterization |
| title_exact_search | Scanning probe microscopy for industrial applications nanomechanical characterization |
| title_full | Scanning probe microscopy for industrial applications nanomechanical characterization edited by Dalia G. Yablon |
| title_fullStr | Scanning probe microscopy for industrial applications nanomechanical characterization edited by Dalia G. Yablon |
| title_full_unstemmed | Scanning probe microscopy for industrial applications nanomechanical characterization edited by Dalia G. Yablon |
| title_short | Scanning probe microscopy for industrial applications |
| title_sort | scanning probe microscopy for industrial applications nanomechanical characterization |
| title_sub | nanomechanical characterization |
| topic | Materials Microscopy Scanning probe microscopy Industrial applications Nanostrukturiertes Material (DE-588)4342626-8 gnd Rastersondenmikroskopie (DE-588)4330328-6 gnd Industrie (DE-588)4026779-9 gnd |
| topic_facet | Materials Microscopy Scanning probe microscopy Industrial applications Nanostrukturiertes Material Rastersondenmikroskopie Industrie Aufsatzsammlung |
| work_keys_str_mv | AT yablondaliag scanningprobemicroscopyforindustrialapplicationsnanomechanicalcharacterization |