Simulation based analysis of LED package reliability regarding encapsulant related failures:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Buch |
| Sprache: | English |
| Veröffentlicht: |
Stuttgart
Fraunhofer Verlag
[2016]
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| Schlagworte: | |
| Online-Zugang: | Inhaltstext Inhaltsverzeichnis Abstract Abstract Inhaltsverzeichnis |
| Beschreibung: | XXV, 138 Seiten Illustrationen, Diagramme 21 cm |
| ISBN: | 9783839609569 3839609569 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV044047396 | ||
| 003 | DE-604 | ||
| 005 | 20170320 | ||
| 007 | t | ||
| 008 | 170216s2016 gw a||| m||| 00||| eng d | ||
| 015 | |a 16,N07 |2 dnb | ||
| 015 | |a 16,A22 |2 dnb | ||
| 015 | |a 16,H06 |2 dnb | ||
| 016 | 7 | |a 1082379255 |2 DE-101 | |
| 020 | |a 9783839609569 |c Broschur : EUR 72.00 (AT), sfr 111.00 (freier Preis), EUR 70.00 (DE) |9 978-3-8396-0956-9 | ||
| 020 | |a 3839609569 |9 3-8396-0956-9 | ||
| 024 | 3 | |a 9783839609569 | |
| 028 | 5 | 2 | |a Bestellnummer: fhg-izm_15 |
| 035 | |a (OCoLC)939674228 | ||
| 035 | |a (DE-599)DNB1082379255 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 044 | |a gw |c XA-DE-BW | ||
| 049 | |a DE-83 | ||
| 082 | 0 | |a 621.3815220284 |2 22/ger | |
| 084 | |a ZN 5040 |0 (DE-625)157432: |2 rvk | ||
| 084 | |a 620 |2 sdnb | ||
| 084 | |a 621.3 |2 sdnb | ||
| 100 | 1 | |a Watzke, Stefan |e Verfasser |0 (DE-588)1090916957 |4 aut | |
| 245 | 1 | 0 | |a Simulation based analysis of LED package reliability regarding encapsulant related failures |c von Stefan Watzke |
| 264 | 1 | |a Stuttgart |b Fraunhofer Verlag |c [2016] | |
| 264 | 4 | |c © 2016 | |
| 300 | |a XXV, 138 Seiten |b Illustrationen, Diagramme |c 21 cm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 502 | |b Dissertation |c Technische Universität Berlin |d 2015 | ||
| 650 | 0 | 7 | |a Lumineszenzdiode |0 (DE-588)4125154-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Stoffeigenschaft |0 (DE-588)4192147-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Werkstoffprüfung |0 (DE-588)4037934-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Ausfall |g Technik |0 (DE-588)4510528-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Silicone |0 (DE-588)4127342-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Verbindungstechnik |0 (DE-588)4129183-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Degradation |g Technik |0 (DE-588)4206992-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Finite-Elemente-Methode |0 (DE-588)4017233-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Epoxide |0 (DE-588)4152561-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Vergussmasse |0 (DE-588)4128787-3 |2 gnd |9 rswk-swf |
| 653 | |a Dynamik und Statik | ||
| 653 | |a Fraunhofer IZM | ||
| 653 | |a Materialcharakterisierung | ||
| 653 | |a Materialwissenschaftler | ||
| 653 | |a Mechanik von Festkörpern | ||
| 653 | |a Modellierung und Simulation | ||
| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Lumineszenzdiode |0 (DE-588)4125154-4 |D s |
| 689 | 0 | 1 | |a Ausfall |g Technik |0 (DE-588)4510528-5 |D s |
| 689 | 0 | 2 | |a Verbindungstechnik |0 (DE-588)4129183-9 |D s |
| 689 | 0 | 3 | |a Silicone |0 (DE-588)4127342-4 |D s |
| 689 | 0 | 4 | |a Epoxide |0 (DE-588)4152561-9 |D s |
| 689 | 0 | 5 | |a Vergussmasse |0 (DE-588)4128787-3 |D s |
| 689 | 0 | 6 | |a Stoffeigenschaft |0 (DE-588)4192147-1 |D s |
| 689 | 0 | 7 | |a Werkstoffprüfung |0 (DE-588)4037934-6 |D s |
| 689 | 0 | 8 | |a Degradation |g Technik |0 (DE-588)4206992-0 |D s |
| 689 | 0 | 9 | |a Finite-Elemente-Methode |0 (DE-588)4017233-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 710 | 2 | |a Fraunhofer IRB-Verlag |0 (DE-588)4786605-6 |4 pbl | |
| 856 | 4 | 2 | |m X:MVB |q text/html |u http://deposit.dnb.de/cgi-bin/dokserv?id=118bae83b9844b12a977a92e4cc52d1d&prov=M&dok_var=1&dok_ext=htm |3 Inhaltstext |
| 856 | 4 | 2 | |m B:DE-101 |q application/pdf |u http://d-nb.info/1082379255/04 |3 Inhaltsverzeichnis |
| 856 | 4 | |u http://www.verlag.tu-berlin.de/abstracts/diss/watzke_stefan_dt.pdf |3 Abstract | |
| 856 | 4 | |u http://www.verlag.tu-berlin.de/abstracts/diss/watzke_stefan_engl.pdf |3 Abstract | |
| 856 | 4 | |u http://www.verlag.tu-berlin.de/abstracts/diss/watzke_stefan_inhalt.pdf |3 Inhaltsverzeichnis | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-029454301 | |
Datensatz im Suchindex
| _version_ | 1809773236436598784 |
|---|---|
| adam_text | |
| any_adam_object | |
| author | Watzke, Stefan |
| author_GND | (DE-588)1090916957 |
| author_facet | Watzke, Stefan |
| author_role | aut |
| author_sort | Watzke, Stefan |
| author_variant | s w sw |
| building | Verbundindex |
| bvnumber | BV044047396 |
| classification_rvk | ZN 5040 |
| ctrlnum | (OCoLC)939674228 (DE-599)DNB1082379255 |
| dewey-full | 621.3815220284 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815220284 |
| dewey-search | 621.3815220284 |
| dewey-sort | 3621.3815220284 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Maschinenbau / Maschinenwesen Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Thesis Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000 c 4500</leader><controlfield tag="001">BV044047396</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20170320</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">170216s2016 gw a||| m||| 00||| eng d</controlfield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">16,N07</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">16,A22</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">16,H06</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">1082379255</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783839609569</subfield><subfield code="c">Broschur : EUR 72.00 (AT), sfr 111.00 (freier Preis), EUR 70.00 (DE)</subfield><subfield code="9">978-3-8396-0956-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3839609569</subfield><subfield code="9">3-8396-0956-9</subfield></datafield><datafield tag="024" ind1="3" ind2=" "><subfield code="a">9783839609569</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">Bestellnummer: fhg-izm_15</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)939674228</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)DNB1082379255</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">XA-DE-BW</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815220284</subfield><subfield code="2">22/ger</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 5040</subfield><subfield code="0">(DE-625)157432:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">620</subfield><subfield code="2">sdnb</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">621.3</subfield><subfield code="2">sdnb</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Watzke, Stefan</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1090916957</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Simulation based analysis of LED package reliability regarding encapsulant related failures</subfield><subfield code="c">von Stefan Watzke</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Stuttgart</subfield><subfield code="b">Fraunhofer Verlag</subfield><subfield code="c">[2016]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2016</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XXV, 138 Seiten</subfield><subfield code="b">Illustrationen, Diagramme</subfield><subfield code="c">21 cm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="502" ind1=" " ind2=" "><subfield code="b">Dissertation</subfield><subfield code="c">Technische Universität Berlin</subfield><subfield code="d">2015</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Lumineszenzdiode</subfield><subfield code="0">(DE-588)4125154-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Stoffeigenschaft</subfield><subfield code="0">(DE-588)4192147-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Werkstoffprüfung</subfield><subfield code="0">(DE-588)4037934-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Ausfall</subfield><subfield code="g">Technik</subfield><subfield code="0">(DE-588)4510528-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Silicone</subfield><subfield code="0">(DE-588)4127342-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Verbindungstechnik</subfield><subfield code="0">(DE-588)4129183-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Degradation</subfield><subfield code="g">Technik</subfield><subfield code="0">(DE-588)4206992-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Finite-Elemente-Methode</subfield><subfield code="0">(DE-588)4017233-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Epoxide</subfield><subfield code="0">(DE-588)4152561-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Vergussmasse</subfield><subfield code="0">(DE-588)4128787-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Dynamik und Statik</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Fraunhofer IZM</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Materialcharakterisierung</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Materialwissenschaftler</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Mechanik von Festkörpern</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Modellierung und Simulation</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4113937-9</subfield><subfield code="a">Hochschulschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Lumineszenzdiode</subfield><subfield code="0">(DE-588)4125154-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Ausfall</subfield><subfield code="g">Technik</subfield><subfield code="0">(DE-588)4510528-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Verbindungstechnik</subfield><subfield code="0">(DE-588)4129183-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="3"><subfield code="a">Silicone</subfield><subfield code="0">(DE-588)4127342-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="4"><subfield code="a">Epoxide</subfield><subfield code="0">(DE-588)4152561-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="5"><subfield code="a">Vergussmasse</subfield><subfield code="0">(DE-588)4128787-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="6"><subfield code="a">Stoffeigenschaft</subfield><subfield code="0">(DE-588)4192147-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="7"><subfield code="a">Werkstoffprüfung</subfield><subfield code="0">(DE-588)4037934-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="8"><subfield code="a">Degradation</subfield><subfield code="g">Technik</subfield><subfield code="0">(DE-588)4206992-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="9"><subfield code="a">Finite-Elemente-Methode</subfield><subfield code="0">(DE-588)4017233-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Fraunhofer IRB-Verlag</subfield><subfield code="0">(DE-588)4786605-6</subfield><subfield code="4">pbl</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">X:MVB</subfield><subfield code="q">text/html</subfield><subfield code="u">http://deposit.dnb.de/cgi-bin/dokserv?id=118bae83b9844b12a977a92e4cc52d1d&prov=M&dok_var=1&dok_ext=htm</subfield><subfield code="3">Inhaltstext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">B:DE-101</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://d-nb.info/1082379255/04</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="856" ind1="4" ind2=" "><subfield code="u">http://www.verlag.tu-berlin.de/abstracts/diss/watzke_stefan_dt.pdf</subfield><subfield code="3">Abstract</subfield></datafield><datafield tag="856" ind1="4" ind2=" "><subfield code="u">http://www.verlag.tu-berlin.de/abstracts/diss/watzke_stefan_engl.pdf</subfield><subfield code="3">Abstract</subfield></datafield><datafield tag="856" ind1="4" ind2=" "><subfield code="u">http://www.verlag.tu-berlin.de/abstracts/diss/watzke_stefan_inhalt.pdf</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029454301</subfield></datafield></record></collection> |
| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV044047396 |
| illustrated | Illustrated |
| indexdate | 2024-09-10T02:10:53Z |
| institution | BVB |
| institution_GND | (DE-588)4786605-6 |
| isbn | 9783839609569 3839609569 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029454301 |
| oclc_num | 939674228 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | XXV, 138 Seiten Illustrationen, Diagramme 21 cm |
| publishDate | 2016 |
| publishDateSearch | 2016 |
| publishDateSort | 2016 |
| publisher | Fraunhofer Verlag |
| record_format | marc |
| spelling | Watzke, Stefan Verfasser (DE-588)1090916957 aut Simulation based analysis of LED package reliability regarding encapsulant related failures von Stefan Watzke Stuttgart Fraunhofer Verlag [2016] © 2016 XXV, 138 Seiten Illustrationen, Diagramme 21 cm txt rdacontent n rdamedia nc rdacarrier Dissertation Technische Universität Berlin 2015 Lumineszenzdiode (DE-588)4125154-4 gnd rswk-swf Stoffeigenschaft (DE-588)4192147-1 gnd rswk-swf Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf Ausfall Technik (DE-588)4510528-5 gnd rswk-swf Silicone (DE-588)4127342-4 gnd rswk-swf Verbindungstechnik (DE-588)4129183-9 gnd rswk-swf Degradation Technik (DE-588)4206992-0 gnd rswk-swf Finite-Elemente-Methode (DE-588)4017233-8 gnd rswk-swf Epoxide (DE-588)4152561-9 gnd rswk-swf Vergussmasse (DE-588)4128787-3 gnd rswk-swf Dynamik und Statik Fraunhofer IZM Materialcharakterisierung Materialwissenschaftler Mechanik von Festkörpern Modellierung und Simulation (DE-588)4113937-9 Hochschulschrift gnd-content Lumineszenzdiode (DE-588)4125154-4 s Ausfall Technik (DE-588)4510528-5 s Verbindungstechnik (DE-588)4129183-9 s Silicone (DE-588)4127342-4 s Epoxide (DE-588)4152561-9 s Vergussmasse (DE-588)4128787-3 s Stoffeigenschaft (DE-588)4192147-1 s Werkstoffprüfung (DE-588)4037934-6 s Degradation Technik (DE-588)4206992-0 s Finite-Elemente-Methode (DE-588)4017233-8 s DE-604 Fraunhofer IRB-Verlag (DE-588)4786605-6 pbl X:MVB text/html http://deposit.dnb.de/cgi-bin/dokserv?id=118bae83b9844b12a977a92e4cc52d1d&prov=M&dok_var=1&dok_ext=htm Inhaltstext B:DE-101 application/pdf http://d-nb.info/1082379255/04 Inhaltsverzeichnis http://www.verlag.tu-berlin.de/abstracts/diss/watzke_stefan_dt.pdf Abstract http://www.verlag.tu-berlin.de/abstracts/diss/watzke_stefan_engl.pdf Abstract http://www.verlag.tu-berlin.de/abstracts/diss/watzke_stefan_inhalt.pdf Inhaltsverzeichnis |
| spellingShingle | Watzke, Stefan Simulation based analysis of LED package reliability regarding encapsulant related failures Lumineszenzdiode (DE-588)4125154-4 gnd Stoffeigenschaft (DE-588)4192147-1 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Ausfall Technik (DE-588)4510528-5 gnd Silicone (DE-588)4127342-4 gnd Verbindungstechnik (DE-588)4129183-9 gnd Degradation Technik (DE-588)4206992-0 gnd Finite-Elemente-Methode (DE-588)4017233-8 gnd Epoxide (DE-588)4152561-9 gnd Vergussmasse (DE-588)4128787-3 gnd |
| subject_GND | (DE-588)4125154-4 (DE-588)4192147-1 (DE-588)4037934-6 (DE-588)4510528-5 (DE-588)4127342-4 (DE-588)4129183-9 (DE-588)4206992-0 (DE-588)4017233-8 (DE-588)4152561-9 (DE-588)4128787-3 (DE-588)4113937-9 |
| title | Simulation based analysis of LED package reliability regarding encapsulant related failures |
| title_auth | Simulation based analysis of LED package reliability regarding encapsulant related failures |
| title_exact_search | Simulation based analysis of LED package reliability regarding encapsulant related failures |
| title_full | Simulation based analysis of LED package reliability regarding encapsulant related failures von Stefan Watzke |
| title_fullStr | Simulation based analysis of LED package reliability regarding encapsulant related failures von Stefan Watzke |
| title_full_unstemmed | Simulation based analysis of LED package reliability regarding encapsulant related failures von Stefan Watzke |
| title_short | Simulation based analysis of LED package reliability regarding encapsulant related failures |
| title_sort | simulation based analysis of led package reliability regarding encapsulant related failures |
| topic | Lumineszenzdiode (DE-588)4125154-4 gnd Stoffeigenschaft (DE-588)4192147-1 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Ausfall Technik (DE-588)4510528-5 gnd Silicone (DE-588)4127342-4 gnd Verbindungstechnik (DE-588)4129183-9 gnd Degradation Technik (DE-588)4206992-0 gnd Finite-Elemente-Methode (DE-588)4017233-8 gnd Epoxide (DE-588)4152561-9 gnd Vergussmasse (DE-588)4128787-3 gnd |
| topic_facet | Lumineszenzdiode Stoffeigenschaft Werkstoffprüfung Ausfall Technik Silicone Verbindungstechnik Degradation Technik Finite-Elemente-Methode Epoxide Vergussmasse Hochschulschrift |
| url | http://deposit.dnb.de/cgi-bin/dokserv?id=118bae83b9844b12a977a92e4cc52d1d&prov=M&dok_var=1&dok_ext=htm http://d-nb.info/1082379255/04 http://www.verlag.tu-berlin.de/abstracts/diss/watzke_stefan_dt.pdf http://www.verlag.tu-berlin.de/abstracts/diss/watzke_stefan_engl.pdf http://www.verlag.tu-berlin.de/abstracts/diss/watzke_stefan_inhalt.pdf |
| work_keys_str_mv | AT watzkestefan simulationbasedanalysisofledpackagereliabilityregardingencapsulantrelatedfailures AT fraunhoferirbverlag simulationbasedanalysisofledpackagereliabilityregardingencapsulantrelatedfailures |