Advanced transmission electron microscopy: imaging and diffraction in nanoscience
Saved in:
Bibliographic Details
Main Authors: Zuo, Jian Min (Author), Spence, John C. H. (Author)
Format: Book
Language:English
Published: New York Springer [2017]
Subjects:
Physical Description:xxvi, 729 Seiten Illustrationen, Diagramme (teilweise farbig)
ISBN:9781493966059

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!