Zhang, W., Chou, X., Shi, T., Ma, Z., Bao, H., & Chen, J. (2017). Measurement technology for micro-nanometer devices. Wiley.
Chicago Style (17th ed.) CitationZhang, Wendong, Xiujian Chou, Tielin Shi, Zongmin Ma, Haifei Bao, and Jing Chen. Measurement Technology for Micro-nanometer Devices. Singapore: Wiley, 2017.
MLA (9th ed.) CitationZhang, Wendong, et al. Measurement Technology for Micro-nanometer Devices. Wiley, 2017.
Warning: These citations may not always be 100% accurate.