Resonant X-Ray Scattering in Correlated Systems:
Gespeichert in:
| Weitere Verfasser: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin ; Heidelberg
Springer
[2017]
|
| Schriftenreihe: | Springer Tracts in Modern Physics
volume 269 |
| Schlagworte: | |
| Online-Zugang: | TUM01 TUM02 UBM01 UBT01 Volltext |
| Beschreibung: | 1 Online-Ressource (VII, 241 p. 151 illus., 25 illus. in color) |
| ISBN: | 9783662532270 |
| DOI: | 10.1007/978-3-662-53227-0 |
Internformat
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Datensatz im Suchindex
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| author2 | Murakami, Youichi Ishihara, Sumio |
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| discipline | Physik |
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| indexdate | 2024-07-10T07:40:32Z |
| institution | BVB |
| isbn | 9783662532270 |
| language | English |
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| series | Springer Tracts in Modern Physics |
| series2 | Springer Tracts in Modern Physics |
| spelling | Resonant X-Ray Scattering in Correlated Systems Youichi Murakami, Sumio Ishihara (editors) Berlin ; Heidelberg Springer [2017] © 2017 1 Online-Ressource (VII, 241 p. 151 illus., 25 illus. in color) txt rdacontent c rdamedia cr rdacarrier Springer Tracts in Modern Physics volume 269 Physics Condensed matter Spectroscopy Microscopy Nanotechnology Materials science Condensed Matter Physics Characterization and Evaluation of Materials Spectroscopy and Microscopy Nanotechnology and Microengineering Röntgenstreuung (DE-588)4178324-4 gnd rswk-swf Resonanzstreuung (DE-588)4177861-3 gnd rswk-swf Röntgenstreuung (DE-588)4178324-4 s Resonanzstreuung (DE-588)4177861-3 s DE-604 Murakami, Youichi (DE-588)1123103127 edt Ishihara, Sumio (DE-588)1123103623 edt Erscheint auch als Druckausgabe 978-3-662-53225-6 Springer Tracts in Modern Physics volume 269 (DE-604)BV013437585 269 https://doi.org/10.1007/978-3-662-53227-0 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Resonant X-Ray Scattering in Correlated Systems Springer Tracts in Modern Physics Physics Condensed matter Spectroscopy Microscopy Nanotechnology Materials science Condensed Matter Physics Characterization and Evaluation of Materials Spectroscopy and Microscopy Nanotechnology and Microengineering Röntgenstreuung (DE-588)4178324-4 gnd Resonanzstreuung (DE-588)4177861-3 gnd |
| subject_GND | (DE-588)4178324-4 (DE-588)4177861-3 |
| title | Resonant X-Ray Scattering in Correlated Systems |
| title_auth | Resonant X-Ray Scattering in Correlated Systems |
| title_exact_search | Resonant X-Ray Scattering in Correlated Systems |
| title_full | Resonant X-Ray Scattering in Correlated Systems Youichi Murakami, Sumio Ishihara (editors) |
| title_fullStr | Resonant X-Ray Scattering in Correlated Systems Youichi Murakami, Sumio Ishihara (editors) |
| title_full_unstemmed | Resonant X-Ray Scattering in Correlated Systems Youichi Murakami, Sumio Ishihara (editors) |
| title_short | Resonant X-Ray Scattering in Correlated Systems |
| title_sort | resonant x ray scattering in correlated systems |
| topic | Physics Condensed matter Spectroscopy Microscopy Nanotechnology Materials science Condensed Matter Physics Characterization and Evaluation of Materials Spectroscopy and Microscopy Nanotechnology and Microengineering Röntgenstreuung (DE-588)4178324-4 gnd Resonanzstreuung (DE-588)4177861-3 gnd |
| topic_facet | Physics Condensed matter Spectroscopy Microscopy Nanotechnology Materials science Condensed Matter Physics Characterization and Evaluation of Materials Spectroscopy and Microscopy Nanotechnology and Microengineering Röntgenstreuung Resonanzstreuung |
| url | https://doi.org/10.1007/978-3-662-53227-0 |
| volume_link | (DE-604)BV013437585 |
| work_keys_str_mv | AT murakamiyouichi resonantxrayscatteringincorrelatedsystems AT ishiharasumio resonantxrayscatteringincorrelatedsystems |