Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
London
Springer London
2009
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Schriftenreihe: | Engineering Materials and Processes
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Schlagworte: | |
Online-Zugang: | TUM01 Volltext |
Beschreibung: | 1 Online-Ressource (XIV, 298 p) |
ISBN: | 9781848820593 |
ISSN: | 1619-0181 |
DOI: | 10.1007/978-1-84882-059-3 |
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Datensatz im Suchindex
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any_adam_object | |
author | Seebauer, Edmund G. |
author_facet | Seebauer, Edmund G. |
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author_sort | Seebauer, Edmund G. |
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discipline | Physik |
doi_str_mv | 10.1007/978-1-84882-059-3 |
format | Electronic eBook |
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illustrated | Not Illustrated |
indexdate | 2024-07-10T07:40:25Z |
institution | BVB |
isbn | 9781848820593 |
issn | 1619-0181 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029394659 |
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owner_facet | DE-91 DE-BY-TUM |
physical | 1 Online-Ressource (XIV, 298 p) |
psigel | ZDB-2-PHA ZDB-2-PHA_2009_Fremddaten |
publishDate | 2009 |
publishDateSearch | 2009 |
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publisher | Springer London |
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series2 | Engineering Materials and Processes |
spelling | Seebauer, Edmund G. Verfasser aut Charged Semiconductor Defects Structure, Thermodynamics and Diffusion by Edmund G. Seebauer, Meredith C. Kratzer London Springer London 2009 1 Online-Ressource (XIV, 298 p) txt rdacontent c rdamedia cr rdacarrier Engineering Materials and Processes 1619-0181 Physics Solid state physics Spectroscopy Microscopy Thermodynamics Heat engineering Heat transfer Mass transfer Continuum mechanics Electronics Microelectronics Optical materials Electronic materials Solid State Physics Spectroscopy and Microscopy Optical and Electronic Materials Continuum Mechanics and Mechanics of Materials Electronics and Microelectronics, Instrumentation Engineering Thermodynamics, Heat and Mass Transfer Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf Halbleiter (DE-588)4022993-2 s Gitterbaufehler (DE-588)4125030-8 s 1\p DE-604 Kratzer, Meredith C. Sonstige oth Erscheint auch als Druckausgabe 978-1-84882-058-6 https://doi.org/10.1007/978-1-84882-059-3 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Seebauer, Edmund G. Charged Semiconductor Defects Structure, Thermodynamics and Diffusion Physics Solid state physics Spectroscopy Microscopy Thermodynamics Heat engineering Heat transfer Mass transfer Continuum mechanics Electronics Microelectronics Optical materials Electronic materials Solid State Physics Spectroscopy and Microscopy Optical and Electronic Materials Continuum Mechanics and Mechanics of Materials Electronics and Microelectronics, Instrumentation Engineering Thermodynamics, Heat and Mass Transfer Gitterbaufehler (DE-588)4125030-8 gnd Halbleiter (DE-588)4022993-2 gnd |
subject_GND | (DE-588)4125030-8 (DE-588)4022993-2 |
title | Charged Semiconductor Defects Structure, Thermodynamics and Diffusion |
title_auth | Charged Semiconductor Defects Structure, Thermodynamics and Diffusion |
title_exact_search | Charged Semiconductor Defects Structure, Thermodynamics and Diffusion |
title_full | Charged Semiconductor Defects Structure, Thermodynamics and Diffusion by Edmund G. Seebauer, Meredith C. Kratzer |
title_fullStr | Charged Semiconductor Defects Structure, Thermodynamics and Diffusion by Edmund G. Seebauer, Meredith C. Kratzer |
title_full_unstemmed | Charged Semiconductor Defects Structure, Thermodynamics and Diffusion by Edmund G. Seebauer, Meredith C. Kratzer |
title_short | Charged Semiconductor Defects |
title_sort | charged semiconductor defects structure thermodynamics and diffusion |
title_sub | Structure, Thermodynamics and Diffusion |
topic | Physics Solid state physics Spectroscopy Microscopy Thermodynamics Heat engineering Heat transfer Mass transfer Continuum mechanics Electronics Microelectronics Optical materials Electronic materials Solid State Physics Spectroscopy and Microscopy Optical and Electronic Materials Continuum Mechanics and Mechanics of Materials Electronics and Microelectronics, Instrumentation Engineering Thermodynamics, Heat and Mass Transfer Gitterbaufehler (DE-588)4125030-8 gnd Halbleiter (DE-588)4022993-2 gnd |
topic_facet | Physics Solid state physics Spectroscopy Microscopy Thermodynamics Heat engineering Heat transfer Mass transfer Continuum mechanics Electronics Microelectronics Optical materials Electronic materials Solid State Physics Spectroscopy and Microscopy Optical and Electronic Materials Continuum Mechanics and Mechanics of Materials Electronics and Microelectronics, Instrumentation Engineering Thermodynamics, Heat and Mass Transfer Gitterbaufehler Halbleiter |
url | https://doi.org/10.1007/978-1-84882-059-3 |
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