Modern Theory of Gratings: Resonant Scattering: Analysis Techniques and Phenomena
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York, NY
Springer New York
2010
|
| Schriftenreihe: | Springer Series in Optical Sciences
153 |
| Schlagworte: | |
| Online-Zugang: | TUM01 Volltext |
| Beschreibung: | 1 Online-Ressource (XVI, 390 p. 120 illus., 43 illus. in color) |
| ISBN: | 9781441912008 |
| ISSN: | 0342-4111 |
| DOI: | 10.1007/978-1-4419-1200-8 |
Internformat
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Datensatz im Suchindex
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| dewey-full | 537.6 535.2 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics 535 - Light and related radiation |
| dewey-raw | 537.6 535.2 |
| dewey-search | 537.6 535.2 |
| dewey-sort | 3537.6 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| doi_str_mv | 10.1007/978-1-4419-1200-8 |
| format | Electronic eBook |
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| id | DE-604.BV043986316 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:40:25Z |
| institution | BVB |
| isbn | 9781441912008 |
| issn | 0342-4111 |
| language | English |
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| physical | 1 Online-Ressource (XVI, 390 p. 120 illus., 43 illus. in color) |
| psigel | ZDB-2-PHA ZDB-2-PHA_2010_Fremddaten |
| publishDate | 2010 |
| publishDateSearch | 2010 |
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| publisher | Springer New York |
| record_format | marc |
| series2 | Springer Series in Optical Sciences |
| spelling | Modern Theory of Gratings Resonant Scattering: Analysis Techniques and Phenomena edited by Yuriy K. Sirenko, Staffan Ström New York, NY Springer New York 2010 1 Online-Ressource (XVI, 390 p. 120 illus., 43 illus. in color) txt rdacontent c rdamedia cr rdacarrier Springer Series in Optical Sciences 153 0342-4111 Physics Optics Electrodynamics Lasers Photonics Optoelectronics Plasmons (Physics) Microwaves Optical engineering Optics and Electrodynamics Microwaves, RF and Optical Engineering Laser Technology, Photonics Optics, Optoelectronics, Plasmonics and Optical Devices Sirenko, Yuriy K. Sonstige oth Ström, Staffan Sonstige oth Erscheint auch als Druckausgabe 978-1-4419-1199-5 https://doi.org/10.1007/978-1-4419-1200-8 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Modern Theory of Gratings Resonant Scattering: Analysis Techniques and Phenomena Physics Optics Electrodynamics Lasers Photonics Optoelectronics Plasmons (Physics) Microwaves Optical engineering Optics and Electrodynamics Microwaves, RF and Optical Engineering Laser Technology, Photonics Optics, Optoelectronics, Plasmonics and Optical Devices |
| title | Modern Theory of Gratings Resonant Scattering: Analysis Techniques and Phenomena |
| title_auth | Modern Theory of Gratings Resonant Scattering: Analysis Techniques and Phenomena |
| title_exact_search | Modern Theory of Gratings Resonant Scattering: Analysis Techniques and Phenomena |
| title_full | Modern Theory of Gratings Resonant Scattering: Analysis Techniques and Phenomena edited by Yuriy K. Sirenko, Staffan Ström |
| title_fullStr | Modern Theory of Gratings Resonant Scattering: Analysis Techniques and Phenomena edited by Yuriy K. Sirenko, Staffan Ström |
| title_full_unstemmed | Modern Theory of Gratings Resonant Scattering: Analysis Techniques and Phenomena edited by Yuriy K. Sirenko, Staffan Ström |
| title_short | Modern Theory of Gratings |
| title_sort | modern theory of gratings resonant scattering analysis techniques and phenomena |
| title_sub | Resonant Scattering: Analysis Techniques and Phenomena |
| topic | Physics Optics Electrodynamics Lasers Photonics Optoelectronics Plasmons (Physics) Microwaves Optical engineering Optics and Electrodynamics Microwaves, RF and Optical Engineering Laser Technology, Photonics Optics, Optoelectronics, Plasmonics and Optical Devices |
| topic_facet | Physics Optics Electrodynamics Lasers Photonics Optoelectronics Plasmons (Physics) Microwaves Optical engineering Optics and Electrodynamics Microwaves, RF and Optical Engineering Laser Technology, Photonics Optics, Optoelectronics, Plasmonics and Optical Devices |
| url | https://doi.org/10.1007/978-1-4419-1200-8 |
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