Atom-probe field ion microscopy: field ion emission and surfaces and interfaces at atomic resolution
Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analysing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals...
Gespeichert in:
| 1. Verfasser: | |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cambridge
Cambridge University Press
1990
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| Schlagworte: | |
| Online-Zugang: | BSB01 FHN01 Volltext |
| Zusammenfassung: | Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analysing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals and many alloys, and recently good field ion images of some semiconductors and even ceramic materials such as high temperature superconductors have been obtained. Although other microscopies are capable of achieving the same resolution, there are some experiments unique to field ion microscopy - for example the study of the behaviour of single atoms and clusters on a solid surface. The elegant development of the field ion microscope with the atom probe has provided a powerful and useful technique for highly sensitive chemical analysis. This book presents the basic principles of atom-probe field ion microscopy and illustrates the various capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution. A useful comparison is given with two related techniques, electron microscopy and scanning tunnelling microscopy. The book will be of interest to scientists working on surfaces and interfaces of materials at the atomic level and will provide a useful reference for those using this technique |
| Beschreibung: | Title from publisher's bibliographic system (viewed on 05 Oct 2015) |
| Beschreibung: | 1 online resource (x, 387 pages) |
| ISBN: | 9780511599842 |
| DOI: | 10.1017/CBO9780511599842 |
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| 520 | |a Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analysing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals and many alloys, and recently good field ion images of some semiconductors and even ceramic materials such as high temperature superconductors have been obtained. Although other microscopies are capable of achieving the same resolution, there are some experiments unique to field ion microscopy - for example the study of the behaviour of single atoms and clusters on a solid surface. The elegant development of the field ion microscope with the atom probe has provided a powerful and useful technique for highly sensitive chemical analysis. This book presents the basic principles of atom-probe field ion microscopy and illustrates the various capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution. A useful comparison is given with two related techniques, electron microscopy and scanning tunnelling microscopy. The book will be of interest to scientists working on surfaces and interfaces of materials at the atomic level and will provide a useful reference for those using this technique | ||
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Datensatz im Suchindex
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| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| doi_str_mv | 10.1017/CBO9780511599842 |
| format | Electronic eBook |
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| id | DE-604.BV043945882 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:39:24Z |
| institution | BVB |
| isbn | 9780511599842 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029354853 |
| oclc_num | 849795766 |
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| owner_facet | DE-12 DE-92 |
| physical | 1 online resource (x, 387 pages) |
| psigel | ZDB-20-CBO ZDB-20-CBO BSB_PDA_CBO ZDB-20-CBO FHN_PDA_CBO |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| publisher | Cambridge University Press |
| record_format | marc |
| spelling | Tsong, Tien Tsou 1934- Verfasser aut Atom-probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution Tien T. Tsong Cambridge Cambridge University Press 1990 1 online resource (x, 387 pages) txt rdacontent c rdamedia cr rdacarrier Title from publisher's bibliographic system (viewed on 05 Oct 2015) Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analysing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals and many alloys, and recently good field ion images of some semiconductors and even ceramic materials such as high temperature superconductors have been obtained. Although other microscopies are capable of achieving the same resolution, there are some experiments unique to field ion microscopy - for example the study of the behaviour of single atoms and clusters on a solid surface. The elegant development of the field ion microscope with the atom probe has provided a powerful and useful technique for highly sensitive chemical analysis. This book presents the basic principles of atom-probe field ion microscopy and illustrates the various capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution. A useful comparison is given with two related techniques, electron microscopy and scanning tunnelling microscopy. The book will be of interest to scientists working on surfaces and interfaces of materials at the atomic level and will provide a useful reference for those using this technique Atom-probe field ion microscopy Feldionenmikroskopie (DE-588)4153929-1 gnd rswk-swf Feldionenmikroskopie (DE-588)4153929-1 s 1\p DE-604 Erscheint auch als Druckausgabe 978-0-521-01993-4 Erscheint auch als Druckausgabe 978-0-521-36379-2 https://doi.org/10.1017/CBO9780511599842 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Tsong, Tien Tsou 1934- Atom-probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution Atom-probe field ion microscopy Feldionenmikroskopie (DE-588)4153929-1 gnd |
| subject_GND | (DE-588)4153929-1 |
| title | Atom-probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution |
| title_auth | Atom-probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution |
| title_exact_search | Atom-probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution |
| title_full | Atom-probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution Tien T. Tsong |
| title_fullStr | Atom-probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution Tien T. Tsong |
| title_full_unstemmed | Atom-probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution Tien T. Tsong |
| title_short | Atom-probe field ion microscopy |
| title_sort | atom probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution |
| title_sub | field ion emission and surfaces and interfaces at atomic resolution |
| topic | Atom-probe field ion microscopy Feldionenmikroskopie (DE-588)4153929-1 gnd |
| topic_facet | Atom-probe field ion microscopy Feldionenmikroskopie |
| url | https://doi.org/10.1017/CBO9780511599842 |
| work_keys_str_mv | AT tsongtientsou atomprobefieldionmicroscopyfieldionemissionandsurfacesandinterfacesatatomicresolution |