Reflection electron microscopy and spectroscopy for surface analysis:
In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffract...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cambridge
Cambridge University Press
1996
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| Schlagworte: | |
| Online-Zugang: | BSB01 FHN01 UER01 URL des Erstveröffentlichers |
| Zusammenfassung: | In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature |
| Beschreibung: | Title from publisher's bibliographic system (viewed on 05 Oct 2015) |
| Beschreibung: | 1 online resource (xix, 436 pages) |
| ISBN: | 9780511525254 |
| DOI: | 10.1017/CBO9780511525254 |
Internformat
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| 520 | |a In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature | ||
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Datensatz im Suchindex
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| dewey-full | 620/.44 |
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| discipline | Physik Biologie |
| doi_str_mv | 10.1017/CBO9780511525254 |
| format | Electronic eBook |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:39:24Z |
| institution | BVB |
| isbn | 9780511525254 |
| language | English |
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| spelling | Wang, Zhong Lin Verfasser aut Reflection electron microscopy and spectroscopy for surface analysis Zhong Lin Wang Reflection Electron Microscopy & Spectroscopy for Surface Analysis Cambridge Cambridge University Press 1996 1 online resource (xix, 436 pages) txt rdacontent c rdamedia cr rdacarrier Title from publisher's bibliographic system (viewed on 05 Oct 2015) In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature Materials / Microscopy Surfaces (Technology) / Analysis Reflection electron microscopy Reflexionselektronenmikroskopie (DE-588)4295699-7 gnd rswk-swf Reflexionselektronenmikroskopie (DE-588)4295699-7 s 1\p DE-604 Erscheint auch als Druck-Ausgabe, Hardcover 978-0-521-48266-0 Erscheint auch als Druck-Ausgabe, Softcover 978-0-521-01795-4 https://doi.org/10.1017/CBO9780511525254 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Wang, Zhong Lin Reflection electron microscopy and spectroscopy for surface analysis Materials / Microscopy Surfaces (Technology) / Analysis Reflection electron microscopy Reflexionselektronenmikroskopie (DE-588)4295699-7 gnd |
| subject_GND | (DE-588)4295699-7 |
| title | Reflection electron microscopy and spectroscopy for surface analysis |
| title_alt | Reflection Electron Microscopy & Spectroscopy for Surface Analysis |
| title_auth | Reflection electron microscopy and spectroscopy for surface analysis |
| title_exact_search | Reflection electron microscopy and spectroscopy for surface analysis |
| title_full | Reflection electron microscopy and spectroscopy for surface analysis Zhong Lin Wang |
| title_fullStr | Reflection electron microscopy and spectroscopy for surface analysis Zhong Lin Wang |
| title_full_unstemmed | Reflection electron microscopy and spectroscopy for surface analysis Zhong Lin Wang |
| title_short | Reflection electron microscopy and spectroscopy for surface analysis |
| title_sort | reflection electron microscopy and spectroscopy for surface analysis |
| topic | Materials / Microscopy Surfaces (Technology) / Analysis Reflection electron microscopy Reflexionselektronenmikroskopie (DE-588)4295699-7 gnd |
| topic_facet | Materials / Microscopy Surfaces (Technology) / Analysis Reflection electron microscopy Reflexionselektronenmikroskopie |
| url | https://doi.org/10.1017/CBO9780511525254 |
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