Characterization of high Tc materials and devices by electron microscopy:
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microsc...
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| Weitere Verfasser: | , |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cambridge
Cambridge University Press
2000
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| Schlagworte: | |
| Online-Zugang: | BSB01 FHN01 URL des Erstveröffentlichers |
| Zusammenfassung: | This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included |
| Beschreibung: | Title from publisher's bibliographic system (viewed on 05 Oct 2015) |
| Beschreibung: | 1 online resource (xii, 391 pages) |
| ISBN: | 9780511534829 |
| DOI: | 10.1017/CBO9780511534829 |
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| 505 | 8 | 0 | |g 1 |t High-resolution transmission electron microscopy |r S. Horiuchi and L. He |g 2 |t Holography in the transmission electron microscope |r A. Tonomura |g 3 |t Microanalysis by scanning transmission electron microscopy |r L.M. Brown and J. Yuan |g 4 |t Specimen preparation for transmission electron microscopy |r J.G. Wen |g 5 |t Low-temperature scanning electron microscopy |r R.P. Huebener |g 6 |t Scanning tunneling microscopy |r M.E. Hawley |g 7 |t Identification of new superconducting compounds by electron microscopy |r G. Van Tendeloo and T. Krekels |g 8 |t Valence band electron energy loss spectroscopy (EELS) of oxide superconductors |r Y.Y. Wang and V.P. Dravid |
| 520 | |a This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included | ||
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Datensatz im Suchindex
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| any_adam_object | |
| author2 | Browning, Nigel D. Pennycook, Stephen J. |
| author2_role | edt edt |
| author2_variant | n d b nd ndb s j p sj sjp |
| author_additional | S. Horiuchi and L. He A. Tonomura L.M. Brown and J. Yuan J.G. Wen R.P. Huebener M.E. Hawley G. Van Tendeloo and T. Krekels Y.Y. Wang and V.P. Dravid |
| author_facet | Browning, Nigel D. Pennycook, Stephen J. |
| building | Verbundindex |
| bvnumber | BV043944927 |
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| contents | High-resolution transmission electron microscopy Holography in the transmission electron microscope Microanalysis by scanning transmission electron microscopy Specimen preparation for transmission electron microscopy Low-temperature scanning electron microscopy Scanning tunneling microscopy Identification of new superconducting compounds by electron microscopy Valence band electron energy loss spectroscopy (EELS) of oxide superconductors |
| ctrlnum | (ZDB-20-CBO)CR9780511534829 (OCoLC)704508935 (DE-599)BVBBV043944927 |
| dewey-full | 537.6/23/0284 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.6/23/0284 |
| dewey-search | 537.6/23/0284 |
| dewey-sort | 3537.6 223 3284 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| doi_str_mv | 10.1017/CBO9780511534829 |
| format | Electronic eBook |
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| id | DE-604.BV043944927 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:39:22Z |
| institution | BVB |
| isbn | 9780511534829 |
| language | English |
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| spelling | Characterization of high Tc materials and devices by electron microscopy edited by Nigel D. Browning, Stephen J. Pennycook Characterization of High Tc Materials & Devices by Electron Microscopy Cambridge Cambridge University Press 2000 1 online resource (xii, 391 pages) txt rdacontent c rdamedia cr rdacarrier Title from publisher's bibliographic system (viewed on 05 Oct 2015) 1 High-resolution transmission electron microscopy S. Horiuchi and L. He 2 Holography in the transmission electron microscope A. Tonomura 3 Microanalysis by scanning transmission electron microscopy L.M. Brown and J. Yuan 4 Specimen preparation for transmission electron microscopy J.G. Wen 5 Low-temperature scanning electron microscopy R.P. Huebener 6 Scanning tunneling microscopy M.E. Hawley 7 Identification of new superconducting compounds by electron microscopy G. Van Tendeloo and T. Krekels 8 Valence band electron energy loss spectroscopy (EELS) of oxide superconductors Y.Y. Wang and V.P. Dravid This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included High temperature superconductors Electron microscopy / Technique Hochtemperatursupraleiter (DE-588)4220922-5 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Hochtemperatursupraleiter (DE-588)4220922-5 s Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Browning, Nigel D. edt Pennycook, Stephen J. edt Erscheint auch als Druckausgabe 978-0-521-03170-7 Erscheint auch als Druckausgabe 978-0-521-55490-9 https://doi.org/10.1017/CBO9780511534829 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Characterization of high Tc materials and devices by electron microscopy High-resolution transmission electron microscopy Holography in the transmission electron microscope Microanalysis by scanning transmission electron microscopy Specimen preparation for transmission electron microscopy Low-temperature scanning electron microscopy Scanning tunneling microscopy Identification of new superconducting compounds by electron microscopy Valence band electron energy loss spectroscopy (EELS) of oxide superconductors High temperature superconductors Electron microscopy / Technique Hochtemperatursupraleiter (DE-588)4220922-5 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4220922-5 (DE-588)4014327-2 |
| title | Characterization of high Tc materials and devices by electron microscopy |
| title_alt | Characterization of High Tc Materials & Devices by Electron Microscopy High-resolution transmission electron microscopy Holography in the transmission electron microscope Microanalysis by scanning transmission electron microscopy Specimen preparation for transmission electron microscopy Low-temperature scanning electron microscopy Scanning tunneling microscopy Identification of new superconducting compounds by electron microscopy Valence band electron energy loss spectroscopy (EELS) of oxide superconductors |
| title_auth | Characterization of high Tc materials and devices by electron microscopy |
| title_exact_search | Characterization of high Tc materials and devices by electron microscopy |
| title_full | Characterization of high Tc materials and devices by electron microscopy edited by Nigel D. Browning, Stephen J. Pennycook |
| title_fullStr | Characterization of high Tc materials and devices by electron microscopy edited by Nigel D. Browning, Stephen J. Pennycook |
| title_full_unstemmed | Characterization of high Tc materials and devices by electron microscopy edited by Nigel D. Browning, Stephen J. Pennycook |
| title_short | Characterization of high Tc materials and devices by electron microscopy |
| title_sort | characterization of high tc materials and devices by electron microscopy |
| topic | High temperature superconductors Electron microscopy / Technique Hochtemperatursupraleiter (DE-588)4220922-5 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | High temperature superconductors Electron microscopy / Technique Hochtemperatursupraleiter Elektronenmikroskopie |
| url | https://doi.org/10.1017/CBO9780511534829 |
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