Introduction to conventional transmission electron microscopy:
This 2003 book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free F...
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Cambridge
Cambridge University Press
[2003]
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Schlagworte: | |
Online-Zugang: | BSB01 FHN01 UBT01 UER01 URL des Erstveröffentlichers |
Zusammenfassung: | This 2003 book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field |
Beschreibung: | 1 Online-Ressource (xxi, 718 Seiten) |
ISBN: | 9780511615092 |
DOI: | 10.1017/CBO9780511615092 |
Internformat
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Datensatz im Suchindex
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any_adam_object | |
author | De Graef, Marc 1961- |
author_GND | (DE-588)134090667 |
author_facet | De Graef, Marc 1961- |
author_role | aut |
author_sort | De Graef, Marc 1961- |
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dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 620 - Engineering and allied operations |
dewey-raw | 620.1/1299 |
dewey-search | 620.1/1299 |
dewey-sort | 3620.1 41299 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Physik |
doi_str_mv | 10.1017/CBO9780511615092 |
format | Electronic eBook |
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indexdate | 2024-07-10T07:39:19Z |
institution | BVB |
isbn | 9780511615092 |
language | English |
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spelling | De Graef, Marc 1961- Verfasser (DE-588)134090667 aut Introduction to conventional transmission electron microscopy Marc De Graef Cambridge Cambridge University Press [2003] © 2003 1 Online-Ressource (xxi, 718 Seiten) txt rdacontent c rdamedia cr rdacarrier This 2003 book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field Transmission electron microscopy Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s DE-604 Erscheint auch als Druck-Ausgabe, Paperback 978-0-521-62995-9 Erscheint auch als Druck-Ausgabe, Hardcover 978-0-521-62006-2 https://doi.org/10.1017/CBO9780511615092 Verlag URL des Erstveröffentlichers Volltext |
spellingShingle | De Graef, Marc 1961- Introduction to conventional transmission electron microscopy Transmission electron microscopy Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
subject_GND | (DE-588)4215608-7 |
title | Introduction to conventional transmission electron microscopy |
title_auth | Introduction to conventional transmission electron microscopy |
title_exact_search | Introduction to conventional transmission electron microscopy |
title_full | Introduction to conventional transmission electron microscopy Marc De Graef |
title_fullStr | Introduction to conventional transmission electron microscopy Marc De Graef |
title_full_unstemmed | Introduction to conventional transmission electron microscopy Marc De Graef |
title_short | Introduction to conventional transmission electron microscopy |
title_sort | introduction to conventional transmission electron microscopy |
topic | Transmission electron microscopy Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
topic_facet | Transmission electron microscopy Durchstrahlungselektronenmikroskopie |
url | https://doi.org/10.1017/CBO9780511615092 |
work_keys_str_mv | AT degraefmarc introductiontoconventionaltransmissionelectronmicroscopy |