Electromigration inside logic cells: modeling, analyzing and mitigating signal electromigration in NanoCMOS
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Bibliographic Details
Main Authors: Posser, Gracieli (Author), Sapatnekar, Sachin S. (Author), Reis, Ricardo (Author)
Format: Electronic eBook
Language:English
Published: Cham Springer 2017
Subjects:
Online Access:BTU01
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Volltext
Physical Description:1 Online Ressource (xx, 118 Seiten) Illustrationen, Diagramme
ISBN:9783319488998
DOI:10.1007/978-3-319-48899-8