Electromigration inside logic cells: modeling, analyzing and mitigating signal electromigration in NanoCMOS
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer
2017
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| Schlagworte: | |
| Online-Zugang: | BTU01 FAB01 FAW01 FHA01 FHI01 FHN01 FHR01 FKE01 FLA01 FRO01 FWS01 FWS02 TUM01 UBY01 Volltext |
| Beschreibung: | 1 Online Ressource (xx, 118 Seiten) Illustrationen, Diagramme |
| ISBN: | 9783319488998 |
| DOI: | 10.1007/978-3-319-48899-8 |
Internformat
MARC
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Datensatz im Suchindex
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| _version_ | 1806180501839413248 |
| any_adam_object | |
| author | Posser, Gracieli Sapatnekar, Sachin S. Reis, Ricardo |
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| author_facet | Posser, Gracieli Sapatnekar, Sachin S. Reis, Ricardo |
| author_role | aut aut aut |
| author_sort | Posser, Gracieli |
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| building | Verbundindex |
| bvnumber | BV043934368 |
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| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
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| dewey-sort | 3621.3815 |
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| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
| doi_str_mv | 10.1007/978-3-319-48899-8 |
| format | Electronic eBook |
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| id | DE-604.BV043934368 |
| illustrated | Not Illustrated |
| indexdate | 2024-08-01T12:25:55Z |
| institution | BVB |
| isbn | 9783319488998 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029343383 |
| oclc_num | 967752745 |
| open_access_boolean | |
| owner | DE-859 DE-1046 DE-860 DE-898 DE-BY-UBR DE-706 DE-92 DE-1043 DE-91 DE-BY-TUM DE-Aug4 DE-861 DE-573 DE-863 DE-BY-FWS DE-634 DE-862 DE-BY-FWS |
| owner_facet | DE-859 DE-1046 DE-860 DE-898 DE-BY-UBR DE-706 DE-92 DE-1043 DE-91 DE-BY-TUM DE-Aug4 DE-861 DE-573 DE-863 DE-BY-FWS DE-634 DE-862 DE-BY-FWS |
| physical | 1 Online Ressource (xx, 118 Seiten) Illustrationen, Diagramme |
| psigel | ZDB-2-ENG ZDB-2-ENG_2017 |
| publishDate | 2017 |
| publishDateSearch | 2017 |
| publishDateSort | 2017 |
| publisher | Springer |
| record_format | marc |
| spellingShingle | Posser, Gracieli Sapatnekar, Sachin S. Reis, Ricardo Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS Engineering Microprocessors Electronic circuits Circuits and Systems Electronic Circuits and Devices Processor Architectures Ingenieurwissenschaften |
| title | Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS |
| title_auth | Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS |
| title_exact_search | Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS |
| title_full | Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis |
| title_fullStr | Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis |
| title_full_unstemmed | Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis |
| title_short | Electromigration inside logic cells |
| title_sort | electromigration inside logic cells modeling analyzing and mitigating signal electromigration in nanocmos |
| title_sub | modeling, analyzing and mitigating signal electromigration in NanoCMOS |
| topic | Engineering Microprocessors Electronic circuits Circuits and Systems Electronic Circuits and Devices Processor Architectures Ingenieurwissenschaften |
| topic_facet | Engineering Microprocessors Electronic circuits Circuits and Systems Electronic Circuits and Devices Processor Architectures Ingenieurwissenschaften |
| url | https://doi.org/10.1007/978-3-319-48899-8 |
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