Assessing microstrain in polycrystalline thin films by means of various diffraction and spectroscopy techniques:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin
2016
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| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | xiii, 99 Seiten Illustrationen, Diagramme |
| DOI: | 10.14279/depositonce-5460 |
Internformat
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Datensatz im Suchindex
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| spelling | Schäfer, Norbert 1987- Verfasser (DE-588)1116648156 aut Assessing microstrain in polycrystalline thin films by means of various diffraction and spectroscopy techniques vorgelegt von Dipl.-Ing. Norbert Schäfer, geb. in Stuttgart Berlin 2016 xiii, 99 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier Dissertation Technische Universität Berlin 2016 (DE-588)4113937-9 Hochschulschrift gnd-content Erscheint auch als Online-Ausgabe 10.14279/depositonce-5460 BV045010696 https://doi.org/10.14279/depositonce-5460 Resolving-System kostenfrei Volltext |
| spellingShingle | Schäfer, Norbert 1987- Assessing microstrain in polycrystalline thin films by means of various diffraction and spectroscopy techniques |
| subject_GND | (DE-588)4113937-9 |
| title | Assessing microstrain in polycrystalline thin films by means of various diffraction and spectroscopy techniques |
| title_auth | Assessing microstrain in polycrystalline thin films by means of various diffraction and spectroscopy techniques |
| title_exact_search | Assessing microstrain in polycrystalline thin films by means of various diffraction and spectroscopy techniques |
| title_full | Assessing microstrain in polycrystalline thin films by means of various diffraction and spectroscopy techniques vorgelegt von Dipl.-Ing. Norbert Schäfer, geb. in Stuttgart |
| title_fullStr | Assessing microstrain in polycrystalline thin films by means of various diffraction and spectroscopy techniques vorgelegt von Dipl.-Ing. Norbert Schäfer, geb. in Stuttgart |
| title_full_unstemmed | Assessing microstrain in polycrystalline thin films by means of various diffraction and spectroscopy techniques vorgelegt von Dipl.-Ing. Norbert Schäfer, geb. in Stuttgart |
| title_short | Assessing microstrain in polycrystalline thin films by means of various diffraction and spectroscopy techniques |
| title_sort | assessing microstrain in polycrystalline thin films by means of various diffraction and spectroscopy techniques |
| topic_facet | Hochschulschrift |
| url | https://doi.org/10.14279/depositonce-5460 |
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