VLSI-SoC: design for reliability, security, and low power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015 : revised selected papers
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Bibliographic Details
Corporate Author: IFIP/IEEE International Conference on Very Large Scale Integration Daejon (Author)
Other Authors: Shin, Youngsoo (Editor), Tsui, Chi Ying (Editor), Kim, Jae-Joon (Editor), Choi, Ki-Young (Editor), Reis, Ricardo (Editor)
Format: Electronic Conference Proceeding eBook
Language:English
Published: [Cham] Springer [2016]
Series:IFIP Advances in Information and Communication Technology 483
Subjects:
Online Access:BTU01
FHA01
FHI01
FHM01
FHN01
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FKE01
FRO01
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Physical Description:1 Online-Ressource (XIII, 223 Seiten, 121 illus)
ISBN:9783319460970
ISSN:1868-4238
DOI:10.1007/978-3-319-46097-0

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