Quantitative data processing in scanning probe microscopy: SPM applications for nanometrology
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
Elsevier
2013
|
| Ausgabe: | First edition |
| Schriftenreihe: | Micro & nano technologies series
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | xi, 321 Seiten Illustrationen |
| ISBN: | 9781455730582 |
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Datensatz im Suchindex
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| id | DE-604.BV043792801 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T07:35:17Z |
| institution | BVB |
| isbn | 9781455730582 |
| language | English |
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| physical | xi, 321 Seiten Illustrationen |
| publishDate | 2013 |
| publishDateSearch | 2013 |
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| publisher | Elsevier |
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| series2 | Micro & nano technologies series |
| spelling | Klapetek, Petr Verfasser aut Quantitative data processing in scanning probe microscopy SPM applications for nanometrology Petr Klapetek First edition Amsterdam Elsevier 2013 xi, 321 Seiten Illustrationen txt rdacontent n rdamedia nc rdacarrier Micro & nano technologies series Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Rastersondenmikroskopie (DE-588)4330328-6 s DE-604 DE-601 pdf/application http://www.gbv.de/dms/bowker/toc/9781455730582.pdf Inhaltsverzeichnis |
| spellingShingle | Klapetek, Petr Quantitative data processing in scanning probe microscopy SPM applications for nanometrology Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| subject_GND | (DE-588)4330328-6 |
| title | Quantitative data processing in scanning probe microscopy SPM applications for nanometrology |
| title_auth | Quantitative data processing in scanning probe microscopy SPM applications for nanometrology |
| title_exact_search | Quantitative data processing in scanning probe microscopy SPM applications for nanometrology |
| title_full | Quantitative data processing in scanning probe microscopy SPM applications for nanometrology Petr Klapetek |
| title_fullStr | Quantitative data processing in scanning probe microscopy SPM applications for nanometrology Petr Klapetek |
| title_full_unstemmed | Quantitative data processing in scanning probe microscopy SPM applications for nanometrology Petr Klapetek |
| title_short | Quantitative data processing in scanning probe microscopy |
| title_sort | quantitative data processing in scanning probe microscopy spm applications for nanometrology |
| title_sub | SPM applications for nanometrology |
| topic | Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| topic_facet | Rastersondenmikroskopie |
| url | http://www.gbv.de/dms/bowker/toc/9781455730582.pdf |
| work_keys_str_mv | AT klapetekpetr quantitativedataprocessinginscanningprobemicroscopyspmapplicationsfornanometrology |