X-ray diffraction: structure, principles, and applications
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Hauppauge, New York
Nova Science Publishers, Inc.
[2013]
|
| Schriftenreihe: | Materials science and technologies series
|
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 |
| Beschreibung: | Includes index An important milestone in the history of science, the diffraction of X-rays, was observed by Max von Laue in 1912. In the last 100 years, X-ray diffraction (XRD) studies have revealed highly valuable information about many ordered atomic structures seen in a variety of common materials. The understanding of material structures opened the door to the reliable application of these materials and allowed scientific discussions about material properties and structural features to become possible. Besides playing this crucial role in history, XRD has now also successfully transformed itself into a m |
| Beschreibung: | pages cm |
| ISBN: | 9781628085938 1628085932 9781628085914 1628085916 |
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| 500 | |a An important milestone in the history of science, the diffraction of X-rays, was observed by Max von Laue in 1912. In the last 100 years, X-ray diffraction (XRD) studies have revealed highly valuable information about many ordered atomic structures seen in a variety of common materials. The understanding of material structures opened the door to the reliable application of these materials and allowed scientific discussions about material properties and structural features to become possible. Besides playing this crucial role in history, XRD has now also successfully transformed itself into a m | ||
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Datensatz im Suchindex
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| dewey-full | 548.028 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 548 - Crystallography |
| dewey-raw | 548.028 |
| dewey-search | 548.028 |
| dewey-sort | 3548.028 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie |
| format | Electronic eBook |
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| id | DE-604.BV043777052 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:34:49Z |
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| isbn | 9781628085938 1628085932 9781628085914 1628085916 |
| language | English |
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| series2 | Materials science and technologies series |
| spelling | X-ray diffraction structure, principles, and applications editor, Kaimin Shih (Department of Civil Engineering, the University of Hong Kong, Hong Kong) Hauppauge, New York Nova Science Publishers, Inc. [2013] pages cm txt rdacontent c rdamedia cr rdacarrier Materials science and technologies series Includes index An important milestone in the history of science, the diffraction of X-rays, was observed by Max von Laue in 1912. In the last 100 years, X-ray diffraction (XRD) studies have revealed highly valuable information about many ordered atomic structures seen in a variety of common materials. The understanding of material structures opened the door to the reliable application of these materials and allowed scientific discussions about material properties and structural features to become possible. Besides playing this crucial role in history, XRD has now also successfully transformed itself into a m SCIENCE / Physics / Crystallography bisacsh Materials / Microscopy fast Transmission electron microscopy fast X-ray crystallography fast X-rays / Diffraction fast Materials / Microscopy Transmission electron microscopy X-ray crystallography X-rays / Diffraction Materials Microscopy X-rays Diffraction Shih, Kaimin Sonstige oth |
| spellingShingle | X-ray diffraction structure, principles, and applications SCIENCE / Physics / Crystallography bisacsh Materials / Microscopy fast Transmission electron microscopy fast X-ray crystallography fast X-rays / Diffraction fast Materials / Microscopy Transmission electron microscopy X-ray crystallography X-rays / Diffraction Materials Microscopy X-rays Diffraction |
| title | X-ray diffraction structure, principles, and applications |
| title_auth | X-ray diffraction structure, principles, and applications |
| title_exact_search | X-ray diffraction structure, principles, and applications |
| title_full | X-ray diffraction structure, principles, and applications editor, Kaimin Shih (Department of Civil Engineering, the University of Hong Kong, Hong Kong) |
| title_fullStr | X-ray diffraction structure, principles, and applications editor, Kaimin Shih (Department of Civil Engineering, the University of Hong Kong, Hong Kong) |
| title_full_unstemmed | X-ray diffraction structure, principles, and applications editor, Kaimin Shih (Department of Civil Engineering, the University of Hong Kong, Hong Kong) |
| title_short | X-ray diffraction |
| title_sort | x ray diffraction structure principles and applications |
| title_sub | structure, principles, and applications |
| topic | SCIENCE / Physics / Crystallography bisacsh Materials / Microscopy fast Transmission electron microscopy fast X-ray crystallography fast X-rays / Diffraction fast Materials / Microscopy Transmission electron microscopy X-ray crystallography X-rays / Diffraction Materials Microscopy X-rays Diffraction |
| topic_facet | SCIENCE / Physics / Crystallography Materials / Microscopy Transmission electron microscopy X-ray crystallography X-rays / Diffraction Materials Microscopy X-rays Diffraction |
| work_keys_str_mv | AT shihkaimin xraydiffractionstructureprinciplesandapplications |