Transmission electron microscopy: diffraction, imaging, and spectrometry
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| Format: | Buch |
| Sprache: | English |
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[Cham, Switzerland]
Springer
[2016]
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| Online-Zugang: | Inhaltstext Inhaltsverzeichnis |
| Beschreibung: | Begleitband, laut Vorwort und Einleitung |
| Beschreibung: | xxxiii, 518 Seiten Illustrationen, Diagramme (teilweise farbig) |
| ISBN: | 9783319266497 3319266497 |
Internformat
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| 245 | 1 | 0 | |a Transmission electron microscopy |b diffraction, imaging, and spectrometry |c C. Barry Carter, David B. Williams (Eds.) ; foreword by Sir John Thomas |
| 246 | 1 | 3 | |a Transmission electron microscopy companion |
| 264 | 1 | |a [Cham, Switzerland] |b Springer |c [2016] | |
| 264 | 4 | |c © 2016 | |
| 300 | |a xxxiii, 518 Seiten |b Illustrationen, Diagramme (teilweise farbig) | ||
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| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Begleitband, laut Vorwort und Einleitung | ||
| 650 | 4 | |a Materials |x Microscopy | |
| 650 | 4 | |a Microscopy, Electron, Transmission | |
| 650 | 4 | |a Transmission electron microscopy | |
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| 700 | 1 | |a Carter, C. Barry |0 (DE-588)1114078794 |4 edt | |
| 700 | 1 | |a Williams, David B. |d 1949- |0 (DE-588)172452627 |4 edt | |
| 700 | 1 | |a Thomas, John M. |d 1932-2020 |0 (DE-588)134006143 |4 wpr | |
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| 787 | 0 | 8 | |i Begleitband zu |t Transmission electron microscopy |n David B. Williams, C. Barry Carter, 2009 |
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Contents
1 Electron Sources 2 222 o 0 onen 1
1 1 Introduction and Definitions of Parameters 2
1 2 Schottky Sources 2 es 4
121 Emission Theory 0 ee 4
122 Coulomb Interactions © 2 222222 6
123 Practical Aspects 2 0 ee es 7
1 3 Field Emission Sources 0 ee 8
131 Emission Theory 2 en ern enn 8
132 PracticalAspects 2 ee eee 10
1 4 Photo-Emission Sources 0 0 10
1 5 Effect of the Electron Source Parameters on Resolution in STEM 11
151 Contributions to the Probe Size cr 11
152 CurrentinaProbe 2 0 eee 12
Appendix 2 ee ee ee 14
References es 15
2 Insituand Operando 0 2 00 00 2 es 17
2 1 General Principles 0 eee 18
2 2 Somehistory 6 ee ee 18
2 3 The Possibilities 2 ees 19
231 Post-Mortem Characterization 006 ce eee 20
232 Statistics ee 20
24 Time 2 es 22
241 Recording the Data 2000 eee 22
242 TheCCD Camera 0 cc ees 22
243 Direct-Detection Cameras 2 eee 22
244 Software and Data Handling 200 ee eee 23
245 Drift Correction ee ee 24
246 Ultrafast Electron Microscopy 020005 25
2 55 The Environment 0 ee 29
2 5 1 Ultrahigh Vacuum 20 es 36
252 WorkinginaGasCell 00 ces 37
253 Workingina Liquid Cell 2 es 39
2 6 The Temperature ee 41
261 Temperature Measurement 0 0 0000000 sees 41
262 Heating 0 0 00 ee 42
263 Cooling eee 46
2 7 Other Stimuli eee 48
271 Deformation 2 0 eeereereernenenen 48
272 Magnetic Fields 0 eeeneneeeenennnn 55
273 ElectricFields 2 0 56
274 Photons 0 0 64
2 8 Adding or Removing Material 2 2 ee 67
281 Depositing Layers/Particles 2 2 ee 67
282 Deposition Energy: Electron and Jon Irradiation 68
2 9 TheFuture 2 ee 73
Appendix 2 ees 75
References ee 76
Electron Diffraction and Phase Identification 2 220 81
3 1 Introduction 0 ee ee 82
3 2 Spinodal Alloys 222 es 83
321 Example: Ordered FeBe Phases and A2 Matrix 83
3 3 Superalloys with Ordered Precipitates 2 0 00000 85
331 Example: y” and y' Precipitation in Alloy 718 87
332 Example: DO,-Ordered 6 Precipitation in Alloy 718 89
3 4 Carbide Precipitation in fcc Alloys 2 0 ee ee 93
341 Example: M,,C, Precipitation in a Ni-Base Alloy 93
342 Example: MC Carbides in a Ni-Base Alloy 94
3 5 FerriticSteels 0 es 96
351 Relationships Between Austenite and Ferrite, Austenite and
Martensite (fcc/bcc) 2 es 96
352 Relationship Between Cementite (Orthorhombic Fe,C or
M,C) and Ferrite/Tempered Martensite 97
353 Relationships Between Alloy Carbides and Ferrite 97
354 Precipitation in Ferritic Structures 0 0 eee 98
3 6 Epitaxial Oxide on Metal: Presence of Fe,O, on Steel Foils 99
Appendix 200 ee es 101
References ee ee 102
Contents
Convergent-Beam Electron Diffraction: Symmetry and Large-Angle
Patterns eee ee ee ean 103
4 1 Symmetry iin 104
4 2 Point-Group Determination 0 00000 e eee 104
4 3 Space-Group Determination 0 109
431 Forbidden Reflections 0 00 0 0000 109
432 Black Crosses 200 ee een 111
433 Complete Procedure for Space-Group Determination 113
4 4 Ni;Mo-A Worked Example 00000 000 a ee 114
441 Ni,Mo - a Worked Example, Part I: Point Group 114
442 Qualifications 2 ey 118
443 Ni,;Mo — a Worked Example, Part Il: Space Group 119
45 Additional and Alternative Symmetry Methods 120
451 Symmetry Determination from Off-Axis Patterns 120
452 Symmetry from Precession Patterns 122
4 6 MoreonGlide Planes 2 22 ee eee 123
461 GM Lines in HOLZ Reflections , 124
462 Glide Planes Normal tothe Beam 124
AT Beyond Symmetry 0 000000 ec eee 124
471 Enantiomorphous Pairs: Handedness 126
472 Polarlty on 126
473 Coherent Convergent-Beam Diffraction 127
4 8 Tanaka Methods 0 0 00 cc eee eevee 127
4 9 LACBED 220 on 127
491 The Nature of LACBED Patterns 000, 129
492 Obtaining LACBED Patterns in Practice 200 4, , 130
493 Choosing the Parameters 0 0 00004 131
4 10 Spherical Aberration and LACBED 04, 132
4 11 Crystal Defects in LACBED Patterns: Dislocations 132
4 12 Crystal Defects in LACBED Patterns: Stacking Faults and Antiphase
Boundaries 2 eens 134
4 13 Other Tanaka Methods 200 00 cee eeu een 134
4 13 1 Bright- and Dark-Field LACBED , 134
4 13 2 Convergent-Beam Imaging (CBIM) 136
4 13 3 Rastering Techniques 222 ac een 137
Appendix 222er ee eee ene eens 141
References © 6 ee eee ee eee eee ee 142
5
Contents
Electron Crystallography, Charge-Density Mapping, and Nanodiffraction 145
5 1 Can We Quantify Electron Diffraction Data? eee es 146
5 2 Quantitative CBED for Charge-Density Mapping 147
5 3 Strain Mapping, High Voltage, Lattice Parameters Measured
by QCBED «0 onen nn 153
5 4 Spot Patterns - Solving Crystal Structures 6 ee 155
5 5 The Precession Method 2:22 nennen 157
5 6 Diffuse Scattering, Defects, Phonons, and Phase Transitions 158
5 7 Diffractive Imaging, Ptychography, STEM Holography, Ronchigrams,
and All That 022 co ers eneneneenn 159
5 8 Equipment for Quantitative Electron Diffraction 162
Appendix 0 163
References es 164
DigitalMicrograph 6 167
6 1 Introduction 6 es 168
611 What Is DigitalMicrograph? 22 222 168
612 Installing DigitalMicrograph Offline 00 168
613A (Very) Quick Overview a Con 168
6 2 Understanding Data 000 Co vvn nn 170
621 Whatisanlmage? 2 2 2220 on 170
622 Image Display ı oo moon 171
623 Number Formats 2 2 22 Coon 173
624 Image Calibration and Image Tags , 178
625 SomeSimple Tools 00 0 000 eee 180
626 Extracting Subsets of Data , 181
6 3 Digital Image Processing 2 20 0000000 eee ees 183
631 Image Filters rn 185
632 Fourier Transformation inimages 187
633 Fourier Filtering 2 2200 oo en 189
634 Coordinate Transformations 192
6 4 Scripting and Plugins 222m oc een 193
Appendix oe een eens 195
References 2200 onen 195
Electron Waves, Interference, and Coherence 197
71 Introduction 6 ee eee ne 198
7 2 Description of Waves 2 20 on 198
Contents
72 2 Spherical Wave 2:2 Coon 199
723 Modulated Wave oc oo ee 199
73 Interference ee eee 200
7 4 Modulation of a Wave by an Object 2000 002000 e 201
7 5 Propagation of Waves 0 0 eee eee ee 201
751 Fresnel Approximation in the Near-Field of the Object 202
752 Fraunhofer Approximation in the Far-Field of the Object 202
7 6 Imaging: Formation of the Image Wave 0 203
761 Fourier Transform of the Object Exit Wave 203
762 Building the Image Wave by Inverse Fourier Transform of
the Fourier Spectrum 2 nn come 203
7 7 Electron Wave Function © 00 204
7 8 Electron interference 2 ee 205
7 9 Findings 0 0 ee eee 206
7 10 Interpretation, 2 eee 207
7 11 Coherence 2 eee 207
7 41 1 Spatial Coherence 2 ee eee 208
7 11 2 Coherent Current es 210
7 11 3 Temporal Coherence 2 ee ee ee 211
7 11 4 Total Degree of Coherence 0 cee ee ee 211
7 11 5 AGeneralization © 0 00 00 ees 211
7 11 6 Coherence at Inelastic Interaction : 222222200 211
Appendix 222 CC oo n rennen 213
References 2 222 oo onen enn 213
Electron Holography 222222 Coon e ee es 215
8 1 Big Problem with TEM: Phase Contrast 0005 216
82 Wave Modulation and Conventional Imaging 216
82 1 Amplitude Modulation 000 00 cee ee 216
822 Phase Modulation 0 0 ee ee 217
823 What Do We See in an Electron Image? 218
8 3 Principle of Image-Plane Off-Axis Holography 219
831 Recording aHologram 0 0 eee eee 219
832 Reconstructing the Object Exit-Wave 220
833 What Have We Achieved so Far? 2 1 eee 223
8 4 Properties of the Reconstructed Object Exit-Wave 223
8 5 Requirements of Holography 220 00 0 cee eee 224
8 6 Quality Criteria 224
10
8 7 Application to Electric Potentials on Nanometer Scale - - 225
871 Phase Shift Due to Electrostatic Potentials +: 225
872 Experimental Considerations 0000 00ers 226
873 Application Example: p-n Junctions 2 00 227
8 8 Further Derivatives of Electron Holography 22 227
881 Holographic Tomography 120 002 eee 227
882 Dark-Field Holography 0 2 0-00 ee eee ee 228
Appendix 20 ns 230
References 0 Cooler een 230
Focal-Series Reconstruction 0000 233
3 1 Motivation: Why the Effort? 2 0 ee 234
9 2 Quick Walk Through Electron Diffraction 2222 235
9 3 From the Wavefunction to the Image 0 2 ee 237
931 Imaging with a ‘Neutral’ Microscope 238
932 Linear Imaging with a Constant-Phase-Shift Microscope 240
933 Linear Imaging with a Real Microscope 241
934 From Oscillations to Windings: an Integral View on Linear
Imaging 2 0 00 000 ee ee 247
9 4 From the Images to the Wavefunction 0 000 249
941 Tomographic Interpretation of Focal Series 249
942 Fundamental Properties of Focal Series 250
943 An Explicit Solution to the Linear Inversion Problem 253
944 Nonlinear Reconstruction 2 nn unseren 255
945 Numerical Correction of Residual Aberrations 256
95 Application Examples 0 0 eee 257
951 Twin Boundaries in BaTiO, 2 ee 258
952 Stacking FaultinGaAs 0000 0008 260
Appendix 2 0 ees 263
References 2 ee eee 264
Direct Methods for Image Interpretation 0 0 267
10 1 Introduction 0 es 268
10 2 Basics of Image Formation 2: mm men 268
10 2 1 Realimaging :: Km mon ee es 268
10 2 2 Successive Imaging Steps 0 cee ee 269
10 2 3 Coherentimaging : v2: cm een 269
10 2 4 High-Resolution Imaging inthe TEM : + 270
10 3 Focal-Series Reconstruction of the ExitWave 271
Contents xx
10 4 Interpretation of the Reconstructed Exit Wave 271
10 4 1 Electron Channeling 2 0 eee ee 272
10 4 2 Argand Plot 2 ee eens 273
10 5 Quantitative Structure Refinement 0000 274
10 5 1 Precision Versus Resolution 0 00 00 276
10 5 2 Quantitative Model-Based Structure Determination 276
Appendix 2 ee ens 280
References 0 ee ee eens 280
ImaginginSTEM 6 0 ee ee 283
11 1 Z-Contrast STEM: an Introduction 2 2 oc con 284
11 1 1 Independent Scatterers 6 284
11 1 2 An Array of Scatterers 0 284
11 1 3 As the Crystal Thickens © 0 ee ee 284
11 1 4 Inside and Outside eee 286
11 1 5 The Effect of Defects 2 ee 287
11 1 6 Quasicrystals, 2 ee ee 288
11 2 An Electron’s Eye View of STEM 2 oo oo on 288
11 2 1 Plane Waves and Probes 00000c uae 291
11 2 2 Rayleigh, Airyand Resolution 22 como cn 292
11 3 Lens Aberrations forSTEM 2 2 ee ce ee 293
11 3 1 The Benefits of Aberration Correction 295
11 3 2 Resolution in the Third Dimension - Depth Resolution 300
11 4 Spatial and Temporal Incoherence 0005 305
11 4 1 Spatiallncoherence 2 none 305
11 4 2 Temporal Incoherence 000 000 ae 306
11 4 3 “How Do | Know if | Have a Coherent Probe?” The
Ronchigram 2 ee ees 306
11 5 Coherent or Incoherent Imaging 0 0000, 310
11 51A Point Detector; Coherent Imaging 311
11 5 2 An Infinite Detector: Incoherent Imaging 312
11 5 3, An Annular Detector: Incoherent Dark-Field or Bright-Field
Imaging ee eee 314
11 5 4 Atoms Are Smaller in HAADFSTEM 004 315
11 5 5 Transverse Coherence 000 eee eee 316
11 5 6 The Origin of Contrast in the Scanned Image 317
11 5 7 Transfer Function and Damping Function 318
11 5 8 Longitudinal Coherence 00000 00 e een 319
Contents
11 6 Dynamical Diffraction 2 2 oo oo ooeeeeeeeeen nenn 323
11 7 Other Sources of Image Contrast ee 326
11 8 Image Processing 0 es 329
11 9 Image Simulation © es 332
11 9 1 Bloch Waves 0 ee 333
11 9 2 Multislice 2 es 333
11 9 3 Bloch Waves with Absorption 2 333
11 9 4 There Is No Stobb’s Factor in HAADF 2 ee ee es 334
11 10 Future Directions © nenne 335
Appendix 2 0 es 337
References 2 338
Electron Tomography 2000 00200 0000 ce es 343
12 1 Theory of Projection 0 es 344
12 2 Back-Projection © ee ee 346
12 3 Constrained Reconstruction 22er een 347
12 3 1 Constraint by Projection Consistency 2 222000 347
12 3 2 Constraint by Discrete Methods - 0000s 348
12 3 3 Constraint by Symmetry 0 000 ee 348
12 3 4 Metric-Based Constraint 0 ee ee ee 348
12 4 Other Reconstruction Approaches 0 0 ee 350
12 5 Meeting the Projection Requirement 0 2 06 ee ees 350
12 6 STEM Tomography 0 0 ce es 351
12 7 Element-Selected Tomography 2 0 000 ee eee 354
12 8 Dark-Field TEM Tomography 10 0 0 cece eee 356
12 9 Holographic Tomography 2 6 eee ees 358
12 10 Atomistic Tomography 2 0 es 359
12 11 Experimental Limitations 0 ee 360
12 12 Beam Damage and Contamination 2 6 eee eee 364
12 13 Automated Acquisition 2 ee 365
12 14 Tilt-Series Alignment © 60 es 366
12 15 Visualization of Three-Dimensional Datasets --5 368
12 16 Segmentation 6 nennen 369
12 17 Quantitative Analysis of Volumetric Data 6 6 ee 371
Appendix 2 ee ee 373
References es 373
EFTEM 0 ees 377
13 1 Introduction 0 es 378
Contents
13 3 Instrumentation for EFTEM 22: como 379
13 3 1 General TEM Considerations 2 22 c 2er 379
13 3 2 Thelmaging Filter 2 222 oo Con eeee nen 379
13 3 3 Detector Considerations 2 2220 n onen 380
13 4 Limitations and Artefacts 2 222 oo meer 381
13 4 1 Spatial Resolution in EFTEM Images 381
13 4 2 Non-Isochromaticity 0 0 ee 383
13 4 3 Sample Drift 0 ee 383
13 4 4 Diffraction Contrast 2 ee nn 384
13 4 5 Illumination Convergence 21 000000 eee 384
13 5 Application of EFTEM oo Con 385
13 5 1 Zero-Loss Imaging and Diffraction 2 2 2222 385
13 5 2 Measuring Relative Thickness (t/A Mapping) 386
13 6 Core-Loss Elemental Mapping 0 0 00005 387
13 6 1 Elemental Mapping (Three-Window Method) 387
13 6 2 Jump-Ratio Mapping (Two-Window Method) 388
13 7 EFTEM Spectrum-Imaging 2222 HH es 389
13 8 Low-Loss Imaging 222222 Cocoon 392
13 9 Alternative Imaging Techniques for Biological Specimens 393
13 10 Quantitative Elemental Mapping 0 200008 394
13 11 Chemical State Mapping Using ELNES 0 0,4 396
13 12 Hybrid EFTEM Modes (w-q, Line Spectrum EFTEM) 397
13 13 EFTEM Tomography 002 0c ee 398
Appendix 2 eee 401
References 222 u urn 401
Calculating EELS ee 405
14 1 Introduction 22c ee ee 406
14 2 Density Functional Theory (DFT) m cn onen 407
14 2 1 Introduction t0DFT 2 2 cc eee 407
14 2 2 The Exchange Correlation Potential 409
14 2 3 Approximations to the Potential 409
14 2 4 BasisSets 2 ee ee es 410
14 2 5 The Korringa—Kohn-Rostoker (KKR) Method 412
14 3 Calculations of the ELNES © 1 ees 412
14 3 1 ELNES Theory 2 ee es 412
14 3 2 TheCoreHole 222 ees 414
14 3 3 Multiplet Theory 2 2 20 co onen 415
14 3 4 Multiple Scattering (MS) Methods 416
Contents
14 4 Calculating Low-Loss EELS 0 0 es
Appendix nee
References es
Diffraction amp; X-ray Excitation 000 ee
15 1 Introduction ees
15 2 ALCHEMI 0 es
15 3 Gedanken ALCHEMI 20 0
15 4 Two Examples 2 2 oe
15 4 1 Dilute Solution/Partition Coefficient Analysis
15 4 2 Concentrated Solution/OTL Analysis
15 5 Delocalization and Axial Channeling 0 00000
15 6 Optimizing ALCHEMI: ‘Statistical’ ALCHEMI 000
15 7 incoherent Channeling Patterns 000 000-000
15 8 Vacancies and Interstitials 600 0000 00 cc eae
15 9 Chemistry on
Appendix 22 200 eee ey
References ee ne eee
X-ray and EELS Imaging © 2200 00 0 cee
16 1 What Are Spectral Images and Why Should We Collect Them?
16 2 Some History 2 2 Con
16 3 Acquisition and Analysis of Spectral mages
16 3 1 Sampling and the Effect of Probe Versus Pixel Size (STEM-
XEDS/EELS) or Magnification (EFTEM)
16 3 2 Signal: Count Rate, Dwell Time, Spectral Image Size, and
Acquisition Time 600 0000 ee ee
16 3 3 Drift Correction and Beam Damage
16 3 4 Conventional Data Analysis Methods
16 4 Multivariate Statistical Analysis Methods
16 4 1 Principal Components Analysis (PCA)
16 4 2 Factor Rotations 2 000 nn
16 5 Example of X-ray and Electron Energy-Loss Spectral Image
Acquisition and Analysis 2 002 0
16 5 1 Fe-Ni Spectral Image Acquisition and Quantification
16 5 2 Mn-Doped SrTiO, Grain Boundary Spectral Image
Acquisition and Quantification ,
16 5 3 Plasmon Mapping of AG Nanorods: EELS Spectral Image
Analysis ee eee nay
Contents
Appendix rn
References 2220000
17 Practical Aspects and Advanced Applications of XEDS ,
17 2 X-ray Spectrum Simulation - a Tutorial and Applications of DTSA
17 22A Brief Tutorial of X-ray Spectrum Simulation for a Thin
Specimen Using DTSA 2 rim
17 2 3 Details of X-ray Simulation in DISA
17 2 4 Application 1: Confirmation of Peak Overlap
17 2 5 Application 2: Evaluation of X-ray Absorption into a Thin
Specimen ene
17 2 6 Application 3: Evaluation of the AEM-XEDS Interface
17 2 7, Application 4: Estimation of the Detectability Limits
17 3 The Z-factor Method: a New Approach for Quantitative X-ray
Analysis of Thin Specimens 222220 ee ee
17 3 3 Quantification Procedure in the @-factor Method
17 3 4 Determination of factors 2 0 0
17 3 5 Applications of J-factor Method ,
17 4 Contemporary Aplications of X-ray Analysis 222 2222220
17 4 1 Renaissance of X-ray Analysis 2 2 oo con
17 4 2 XEDS Tomography for 3D Elemental Distribution
17 4 3 Atomic Resolution X-ray Mapping
Appendix 2 ee ee eens
References ee nee neces |
| any_adam_object | 1 |
| author2 | Carter, C. Barry Williams, David B. 1949- |
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| dewey-hundreds | 500 - Natural sciences and mathematics 600 - Technology (Applied sciences) |
| dewey-ones | 502 - Miscellany 620 - Engineering and allied operations |
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| id | DE-604.BV043768503 |
| illustrated | Illustrated |
| indexdate | 2024-11-15T17:00:22Z |
| institution | BVB |
| isbn | 9783319266497 3319266497 |
| language | English |
| lccn | 2016945257 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029179683 |
| oclc_num | 949667612 |
| open_access_boolean | |
| owner | DE-11 DE-20 DE-83 DE-860 DE-19 DE-BY-UBM |
| owner_facet | DE-11 DE-20 DE-83 DE-860 DE-19 DE-BY-UBM |
| physical | xxxiii, 518 Seiten Illustrationen, Diagramme (teilweise farbig) |
| publishDate | 2016 |
| publishDateSearch | 2016 |
| publishDateSort | 2016 |
| publisher | Springer |
| record_format | marc |
| spelling | Transmission electron microscopy diffraction, imaging, and spectrometry C. Barry Carter, David B. Williams (Eds.) ; foreword by Sir John Thomas Transmission electron microscopy companion [Cham, Switzerland] Springer [2016] © 2016 xxxiii, 518 Seiten Illustrationen, Diagramme (teilweise farbig) txt rdacontent n rdamedia nc rdacarrier Begleitband, laut Vorwort und Einleitung Materials Microscopy Microscopy, Electron, Transmission Transmission electron microscopy Werkstoff (DE-588)4065579-9 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Werkstoff (DE-588)4065579-9 s DE-604 Carter, C. Barry (DE-588)1114078794 edt Williams, David B. 1949- (DE-588)172452627 edt Thomas, John M. 1932-2020 (DE-588)134006143 wpr Erscheint auch als Online-Ausgabe 10.1007/978-3-319-26651-0 Erscheint auch als Online-Ausgabe (PDF, ePub) 978-3-319-26651-0 Begleitband zu Transmission electron microscopy David B. Williams, C. Barry Carter, 2009 text/html http://deposit.dnb.de/cgi-bin/dokserv?id=afea080460ae4bc3a3468c14f1aca577&prov=M&dok_var=1&dok_ext=htm Inhaltstext HEBIS Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029179683&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Transmission electron microscopy diffraction, imaging, and spectrometry Materials Microscopy Microscopy, Electron, Transmission Transmission electron microscopy Werkstoff (DE-588)4065579-9 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4065579-9 (DE-588)4014327-2 |
| title | Transmission electron microscopy diffraction, imaging, and spectrometry |
| title_alt | Transmission electron microscopy companion |
| title_auth | Transmission electron microscopy diffraction, imaging, and spectrometry |
| title_exact_search | Transmission electron microscopy diffraction, imaging, and spectrometry |
| title_full | Transmission electron microscopy diffraction, imaging, and spectrometry C. Barry Carter, David B. Williams (Eds.) ; foreword by Sir John Thomas |
| title_fullStr | Transmission electron microscopy diffraction, imaging, and spectrometry C. Barry Carter, David B. Williams (Eds.) ; foreword by Sir John Thomas |
| title_full_unstemmed | Transmission electron microscopy diffraction, imaging, and spectrometry C. Barry Carter, David B. Williams (Eds.) ; foreword by Sir John Thomas |
| title_short | Transmission electron microscopy |
| title_sort | transmission electron microscopy diffraction imaging and spectrometry |
| title_sub | diffraction, imaging, and spectrometry |
| topic | Materials Microscopy Microscopy, Electron, Transmission Transmission electron microscopy Werkstoff (DE-588)4065579-9 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Materials Microscopy Microscopy, Electron, Transmission Transmission electron microscopy Werkstoff Elektronenmikroskopie |
| url | http://deposit.dnb.de/cgi-bin/dokserv?id=afea080460ae4bc3a3468c14f1aca577&prov=M&dok_var=1&dok_ext=htm http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029179683&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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