Physical principles of electron microscopy: an introduction to TEM, SEM and AEM
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
[Cham]
Springer
[2016]
|
| Ausgabe: | Second edition |
| Schlagworte: | |
| Beschreibung: | xi, 196 Seiten Illustrationen, Diagramme |
| ISBN: | 9783319398761 |
Internformat
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| 245 | 1 | 0 | |a Physical principles of electron microscopy |b an introduction to TEM, SEM and AEM |c R.F. Egerton |
| 250 | |a Second edition | ||
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| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
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Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Egerton, Ray |
| author_GND | (DE-588)1109912358 |
| author_facet | Egerton, Ray |
| author_role | aut |
| author_sort | Egerton, Ray |
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| building | Verbundindex |
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| classification_rvk | UH 6200 UH 6300 WC 3100 VG 9900 |
| ctrlnum | (OCoLC)956310107 (DE-599)BSZ475558227 |
| discipline | Chemie / Pharmazie Physik Biologie |
| edition | Second edition |
| format | Book |
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| id | DE-604.BV043699451 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T07:32:51Z |
| institution | BVB |
| isbn | 9783319398761 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029111912 |
| oclc_num | 956310107 |
| open_access_boolean | |
| owner | DE-11 DE-83 DE-20 DE-355 DE-BY-UBR |
| owner_facet | DE-11 DE-83 DE-20 DE-355 DE-BY-UBR |
| physical | xi, 196 Seiten Illustrationen, Diagramme |
| publishDate | 2016 |
| publishDateSearch | 2016 |
| publishDateSort | 2016 |
| publisher | Springer |
| record_format | marc |
| spelling | Egerton, Ray Verfasser (DE-588)1109912358 aut Physical principles of electron microscopy an introduction to TEM, SEM and AEM R.F. Egerton Second edition [Cham] Springer [2016] © 2016 xi, 196 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Erscheint auch als Online-Ausgabe 10.1007/978-3-319-39877-8 978-3-319-39877-8 |
| spellingShingle | Egerton, Ray Physical principles of electron microscopy an introduction to TEM, SEM and AEM Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4014327-2 |
| title | Physical principles of electron microscopy an introduction to TEM, SEM and AEM |
| title_auth | Physical principles of electron microscopy an introduction to TEM, SEM and AEM |
| title_exact_search | Physical principles of electron microscopy an introduction to TEM, SEM and AEM |
| title_full | Physical principles of electron microscopy an introduction to TEM, SEM and AEM R.F. Egerton |
| title_fullStr | Physical principles of electron microscopy an introduction to TEM, SEM and AEM R.F. Egerton |
| title_full_unstemmed | Physical principles of electron microscopy an introduction to TEM, SEM and AEM R.F. Egerton |
| title_short | Physical principles of electron microscopy |
| title_sort | physical principles of electron microscopy an introduction to tem sem and aem |
| title_sub | an introduction to TEM, SEM and AEM |
| topic | Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Elektronenmikroskopie |
| work_keys_str_mv | AT egertonray physicalprinciplesofelectronmicroscopyanintroductiontotemsemandaem |