Verfügbarkeit: CMOS RF circuit design for reliability and variability

CMOS RF circuit design for reliability and variability:

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Bibliographische Detailangaben
1. Verfasser:	Yuan, JianPing (VerfasserIn)
Format:	Elektronisch E-Book
Sprache:	English
Veröffentlicht:	Singapore Springer [2016]
Schriftenreihe:	SpringerBriefs in applied sciences and technology : Reliability
Schlagworte:	Engineering Electronic circuits Microwaves Optical engineering Circuits and Systems Electronic Circuits and Devices Microwaves, RF and Optical Engineering Ingenieurwissenschaften
Online-Zugang:	BTU01 FAB01 FAW01 FHA01 FHI01 FHN01 FHR01 FKE01 FRO01 FWS01 FWS02 UBY01 Volltext Inhaltsverzeichnis Abstract
Beschreibung:	1 Online-Ressource (vi, 106 Seiten)
ISBN:	9789811008849
DOI:	10.1007/978-981-10-0884-9

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MARC


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Datensatz im Suchindex

DE-BY-FWS_katkey	617199
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adam_text	CMOS RF CIRCUIT DESIGN FOR RELIABILITY AND VARIABILITY / YUAN, JIANN-SHIUN : 2016 TABLE OF CONTENTS / INHALTSVERZEICHNIS CMOS TRANSISTOR RELIABILITY AND VARIABILITY WIRELESS RECEIVER AND TRANSMITTER CIRCUIT RELIABILITY LOW NOISE AMPLIFIER RELIABILITY AND VARIABILITY POWER AMPLIFIER RELIABILITY AND VARIABILITY VOLTAGE CONTROLLED OSCILLATOR RELIABILITY AND VARIABILITY MIXER RELIABILITY DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT. CMOS RF CIRCUIT DESIGN FOR RELIABILITY AND VARIABILITY / YUAN, JIANN-SHIUN : 2016 ABSTRACT / INHALTSTEXT THE SUBJECT OF THIS BOOK IS CMOS RF CIRCUIT DESIGN FOR RELIABILITY. THE DEVICE RELIABILITY AND PROCESS VARIATION ISSUES ON RF TRANSMITTER AND RECEIVER CIRCUITS WILL BE PARTICULAR INTEREST TO THE READERS IN THE FIELD OF SEMICONDUCTOR DEVICES AND CIRCUITS. THIS PROPOSED BOOK IS UNIQUE TO EXPLORE TYPICAL RELIABILITY ISSUES IN THE DEVICE AND TECHNOLOGY LEVEL AND THEN TO EXAMINE THEIR IMPACT ON RF WIRELESS TRANSCEIVER CIRCUIT PERFORMANCE. ANALYTICAL EQUATIONS, EXPERIMENTAL DATA, DEVICE AND CIRCUIT SIMULATION RESULTS WILL BE GIVEN FOR CLEAR EXPLANATION. THE MAIN BENEFIT THE READER DERIVE FROM THIS BOOK WILL BE CLEAR UNDERSTANDING ON HOW DEVICE RELIABILITY ISSUES AFFECTS THE RF CIRCUIT PERFORMANCE SUBJECTED TO OPERATION AGING AND PROCESS VARIATIONS DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
any_adam_object	1
author	Yuan, JianPing
author_facet	Yuan, JianPing
author_role	aut
author_sort	Yuan, JianPing
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dewey-full	621.3815
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	621 - Applied physics
dewey-raw	621.3815
dewey-search	621.3815
dewey-sort	3621.3815
dewey-tens	620 - Engineering and allied operations
discipline	Elektrotechnik / Elektronik / Nachrichtentechnik
doi_str_mv	10.1007/978-981-10-0884-9
format	Electronic eBook
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illustrated	Not Illustrated
indexdate	2024-08-01T12:13:51Z
institution	BVB
isbn	9789811008849
language	English
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publisher	Springer
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series2	SpringerBriefs in applied sciences and technology : Reliability
spellingShingle	Yuan, JianPing CMOS RF circuit design for reliability and variability Engineering Electronic circuits Microwaves Optical engineering Circuits and Systems Electronic Circuits and Devices Microwaves, RF and Optical Engineering Ingenieurwissenschaften
title	CMOS RF circuit design for reliability and variability
title_auth	CMOS RF circuit design for reliability and variability
title_exact_search	CMOS RF circuit design for reliability and variability
title_full	CMOS RF circuit design for reliability and variability Jiann-Shiun Yuan
title_fullStr	CMOS RF circuit design for reliability and variability Jiann-Shiun Yuan
title_full_unstemmed	CMOS RF circuit design for reliability and variability Jiann-Shiun Yuan
title_short	CMOS RF circuit design for reliability and variability
title_sort	cmos rf circuit design for reliability and variability
topic	Engineering Electronic circuits Microwaves Optical engineering Circuits and Systems Electronic Circuits and Devices Microwaves, RF and Optical Engineering Ingenieurwissenschaften
topic_facet	Engineering Electronic circuits Microwaves Optical engineering Circuits and Systems Electronic Circuits and Devices Microwaves, RF and Optical Engineering Ingenieurwissenschaften
url	https://doi.org/10.1007/978-981-10-0884-9 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028961714&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028961714&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA
work_keys_str_mv	AT yuanjianping cmosrfcircuitdesignforreliabilityandvariability

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