Defects and Impurities in Silicon Materials: An Introduction to Atomic-Level Silicon Engineering
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Tokyo
Springer Japan
2015
2015 |
| Schriftenreihe: | Lecture Notes in Physics
916 |
| Schlagworte: | |
| Online-Zugang: | TUM01 UBM01 UBT01 URL des Erstveröffentlichers Inhaltsverzeichnis Abstract |
| Beschreibung: | 1 Online-Ressource (XV, 487 p. 292 illus., 180 illus. in color) |
| ISBN: | 9784431558002 9784431557999 |
| ISSN: | 0075-8450 |
| DOI: | 10.1007/978-4-431-55800-2 |
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Datensatz im Suchindex
| _version_ | 1804176141798342656 |
|---|---|
| adam_text | DEFECTS AND IMPURITIES IN SILICON MATERIALS
/
: 2015
TABLE OF CONTENTS / INHALTSVERZEICHNIS
DIFFUSION AND POINT DEFECTS IN SILICON MATERIALS
DENSITY FUNCTIONAL MODELING OF DEFECTS AND IMPURITIES IN SILICON
MATERIALS
ELECTRICAL AND OPTICAL DEFECT EVALUATION TECHNIQUES FOR ELECTRONIC AND
SOLAR GRADE SILICON
INTRINSIC POINT DEFECT ENGINEERING DURING SINGLE CRYSTAL SI AND GE
GROWTH FROM A MELT
COMPUTER SIMULATION OF CRYSTAL GROWTH FOR CZ-SI SINGLE CRYSTALS AND SI
SOLAR CELLS
OXYGEN PRECIPITATION IN SILICON
DEFECT CHARACTERIZATION BY ELECTRON BEAM INDUCED CURRENT AND CATHODE
LUMINESCENCE METHODS
NUCLEAR METHODS TO STUDY DEFECTS AND IMPURITIES IN SI MATERIALS USING
HEAVY ION ACCELERATORS
DEFECT ENGINEERING IN SILICON MATERIALS
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
DEFECTS AND IMPURITIES IN SILICON MATERIALS
/
: 2015
ABSTRACT / INHALTSTEXT
THIS BOOK EMPHASIZES THE IMPORTANCE OF THE FASCINATING ATOMISTIC
INSIGHTS INTO THE DEFECTS AND THE IMPURITIES AS WELL AS THE DYNAMIC
BEHAVIORS IN SILICON MATERIALS, WHICH HAVE BECOME MORE DIRECTLY
ACCESSIBLE OVER THE PAST 20 YEARS. SUCH PROGRESS HAS BEEN MADE POSSIBLE
BY NEWLY DEVELOPED EXPERIMENTAL METHODS, FIRST PRINCIPLE THEORIES, AND
COMPUTER SIMULATION TECHNIQUES. THE BOOK IS AIMED AT YOUNG RESEARCHERS,
SCIENTISTS, AND TECHNICIANS IN RELATED INDUSTRIES. THE MAIN PURPOSES ARE
TO PROVIDE READERS WITH 1) THE BASIC PHYSICS BEHIND DEFECTS IN SILICON
MATERIALS, 2) THE ATOMISTIC MODELING AS WELL AS THE CHARACTERIZATION
TECHNIQUES RELATED TO DEFECTS AND IMPURITIES IN SILICON MATERIALS, AND
3) AN OVERVIEW OF THE WIDE RANGE OF THE RESEARCH FIELDS INVOLVED
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
|
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| discipline | Physik |
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| format | Electronic eBook |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:27:28Z |
| institution | BVB |
| isbn | 9784431558002 9784431557999 |
| issn | 0075-8450 |
| language | English |
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| spelling | Defects and Impurities in Silicon Materials An Introduction to Atomic-Level Silicon Engineering edited by Yutaka Yoshida, Guido Langouche Tokyo Springer Japan 2015 2015 1 Online-Ressource (XV, 487 p. 292 illus., 180 illus. in color) txt rdacontent c rdamedia cr rdacarrier Lecture Notes in Physics 916 0075-8450 Physics Solid state physics Nanoscale science Nanoscience Nanostructures Semiconductors Nanotechnology Engineering / Materials Materials Engineering Nanotechnology and Microengineering Solid State Physics Nanoscale Science and Technology Ingenieurwissenschaften Silicium (DE-588)4077445-4 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Silicium (DE-588)4077445-4 s Gitterbaufehler (DE-588)4125030-8 s 1\p DE-604 Yoshida, Yutaka Sonstige (DE-588)1043899480 oth Langouche, Guido Sonstige oth Lecture Notes in Physics 916 (DE-604)BV013615055 916 https://doi.org/10.1007/978-4-431-55800-2 Verlag URL des Erstveröffentlichers Volltext Springer Fremddatenuebernahme application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028920567&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis Springer Fremddatenuebernahme application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028920567&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA Abstract 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Defects and Impurities in Silicon Materials An Introduction to Atomic-Level Silicon Engineering Lecture Notes in Physics Physics Solid state physics Nanoscale science Nanoscience Nanostructures Semiconductors Nanotechnology Engineering / Materials Materials Engineering Nanotechnology and Microengineering Solid State Physics Nanoscale Science and Technology Ingenieurwissenschaften Silicium (DE-588)4077445-4 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| subject_GND | (DE-588)4077445-4 (DE-588)4125030-8 |
| title | Defects and Impurities in Silicon Materials An Introduction to Atomic-Level Silicon Engineering |
| title_auth | Defects and Impurities in Silicon Materials An Introduction to Atomic-Level Silicon Engineering |
| title_exact_search | Defects and Impurities in Silicon Materials An Introduction to Atomic-Level Silicon Engineering |
| title_full | Defects and Impurities in Silicon Materials An Introduction to Atomic-Level Silicon Engineering edited by Yutaka Yoshida, Guido Langouche |
| title_fullStr | Defects and Impurities in Silicon Materials An Introduction to Atomic-Level Silicon Engineering edited by Yutaka Yoshida, Guido Langouche |
| title_full_unstemmed | Defects and Impurities in Silicon Materials An Introduction to Atomic-Level Silicon Engineering edited by Yutaka Yoshida, Guido Langouche |
| title_short | Defects and Impurities in Silicon Materials |
| title_sort | defects and impurities in silicon materials an introduction to atomic level silicon engineering |
| title_sub | An Introduction to Atomic-Level Silicon Engineering |
| topic | Physics Solid state physics Nanoscale science Nanoscience Nanostructures Semiconductors Nanotechnology Engineering / Materials Materials Engineering Nanotechnology and Microengineering Solid State Physics Nanoscale Science and Technology Ingenieurwissenschaften Silicium (DE-588)4077445-4 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| topic_facet | Physics Solid state physics Nanoscale science Nanoscience Nanostructures Semiconductors Nanotechnology Engineering / Materials Materials Engineering Nanotechnology and Microengineering Solid State Physics Nanoscale Science and Technology Ingenieurwissenschaften Silicium Gitterbaufehler |
| url | https://doi.org/10.1007/978-4-431-55800-2 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028920567&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028920567&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA |
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