Holdings: Fringe pattern analysis for optical metrology

Fringe pattern analysis for optical metrology: theory, algorithms, and applications

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Bibliographic Details
Main Author:	Servín, Manuel (Author)
Format:	Electronic eBook
Language:	English
Published:	Weinheim Wiley-VCH [2014]
Edition:	First edition
Subjects:	SCIENCE / Energy SCIENCE / Mechanics / General SCIENCE / Physics / General Diffraction patterns Interferometry Optical measurements Interferometrie Beugungsfigur Optische Messung Metrologie Optische Messtechnik Electronic books
Online Access:	FRO01 UBG01 Volltext
Item Description:	Edition statement from running title area Includes bibliographical references and index
Physical Description:	1 Online-Ressource (xvi, 328 pages)
ISBN:	1306840880 3527411526 3527681078 3527681086 3527681094 3527681108 9781306840880 9783527411528 9783527681075 9783527681082 9783527681099 9783527681105

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Record in the Search Index

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dewey-ones	530 - Physics
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dewey-search	530.8
dewey-sort	3530.8
dewey-tens	530 - Physics
discipline	Physik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik / Mechatronik
edition	First edition
format	Electronic eBook
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id	DE-604.BV043396841
illustrated	Not Illustrated
indexdate	2024-07-10T07:24:52Z
institution	BVB
isbn	1306840880 3527411526 3527681078 3527681086 3527681094 3527681108 9781306840880 9783527411528 9783527681075 9783527681082 9783527681099 9783527681105
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-028815425
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owner	DE-861
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physical	1 Online-Ressource (xvi, 328 pages)
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publishDate	2014
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publisher	Wiley-VCH
record_format	marc
spelling	Servín, Manuel Verfasser aut Fringe pattern analysis for optical metrology theory, algorithms, and applications Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla First edition Weinheim Wiley-VCH [2014] 1 Online-Ressource (xvi, 328 pages) txt rdacontent c rdamedia cr rdacarrier Edition statement from running title area Includes bibliographical references and index SCIENCE / Energy bisacsh SCIENCE / Mechanics / General bisacsh SCIENCE / Physics / General bisacsh Diffraction patterns fast Interferometry fast Optical measurements fast Interferometrie gnd Beugungsfigur gnd Interferometry Diffraction patterns Optical measurements Optische Messung (DE-588)4121429-8 gnd rswk-swf Interferometrie (DE-588)4027296-5 gnd rswk-swf Metrologie (DE-588)4169749-2 gnd rswk-swf Optische Messtechnik (DE-588)4172667-4 gnd rswk-swf Electronic books Metrologie (DE-588)4169749-2 s Optische Messtechnik (DE-588)4172667-4 s Optische Messung (DE-588)4121429-8 s Interferometrie (DE-588)4027296-5 s 1\p DE-604 Quiroga, J. Antonio Sonstige oth Padilla, J. Moisés Sonstige oth Erscheint auch als Druckausgabe 978-3-527-41152-8 https://onlinelibrary.wiley.com/doi/book/10.1002/9783527681075 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Servín, Manuel Fringe pattern analysis for optical metrology theory, algorithms, and applications SCIENCE / Energy bisacsh SCIENCE / Mechanics / General bisacsh SCIENCE / Physics / General bisacsh Diffraction patterns fast Interferometry fast Optical measurements fast Interferometrie gnd Beugungsfigur gnd Interferometry Diffraction patterns Optical measurements Optische Messung (DE-588)4121429-8 gnd Interferometrie (DE-588)4027296-5 gnd Metrologie (DE-588)4169749-2 gnd Optische Messtechnik (DE-588)4172667-4 gnd
subject_GND	(DE-588)4121429-8 (DE-588)4027296-5 (DE-588)4169749-2 (DE-588)4172667-4
title	Fringe pattern analysis for optical metrology theory, algorithms, and applications
title_auth	Fringe pattern analysis for optical metrology theory, algorithms, and applications
title_exact_search	Fringe pattern analysis for optical metrology theory, algorithms, and applications
title_full	Fringe pattern analysis for optical metrology theory, algorithms, and applications Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla
title_fullStr	Fringe pattern analysis for optical metrology theory, algorithms, and applications Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla
title_full_unstemmed	Fringe pattern analysis for optical metrology theory, algorithms, and applications Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla
title_short	Fringe pattern analysis for optical metrology
title_sort	fringe pattern analysis for optical metrology theory algorithms and applications
title_sub	theory, algorithms, and applications
topic	SCIENCE / Energy bisacsh SCIENCE / Mechanics / General bisacsh SCIENCE / Physics / General bisacsh Diffraction patterns fast Interferometry fast Optical measurements fast Interferometrie gnd Beugungsfigur gnd Interferometry Diffraction patterns Optical measurements Optische Messung (DE-588)4121429-8 gnd Interferometrie (DE-588)4027296-5 gnd Metrologie (DE-588)4169749-2 gnd Optische Messtechnik (DE-588)4172667-4 gnd
topic_facet	SCIENCE / Energy SCIENCE / Mechanics / General SCIENCE / Physics / General Diffraction patterns Interferometry Optical measurements Interferometrie Beugungsfigur Optische Messung Metrologie Optische Messtechnik
url	https://onlinelibrary.wiley.com/doi/book/10.1002/9783527681075
work_keys_str_mv	AT servinmanuel fringepatternanalysisforopticalmetrologytheoryalgorithmsandapplications AT quirogajantonio fringepatternanalysisforopticalmetrologytheoryalgorithmsandapplications AT padillajmoises fringepatternanalysisforopticalmetrologytheoryalgorithmsandapplications

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