Fringe pattern analysis for optical metrology: theory, algorithms, and applications
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Weinheim
Wiley-VCH
[2014]
|
Ausgabe: | First edition |
Schlagworte: | |
Online-Zugang: | FRO01 UBG01 URL des Erstveröffentlichers |
Beschreibung: | Edition statement from running title area Includes bibliographical references and index |
Beschreibung: | 1 Online-Ressource (xvi, 328 pages) |
ISBN: | 1306840880 3527411526 3527681078 3527681086 3527681094 3527681108 9781306840880 9783527411528 9783527681075 9783527681082 9783527681099 9783527681105 |
Internformat
MARC
LEADER | 00000nmm a2200000zc 4500 | ||
---|---|---|---|
001 | BV043396841 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | cr|uuu---uuuuu | ||
008 | 160222s2014 |||| o||u| ||||||eng d | ||
020 | |a 1306840880 |c electronic bk. |9 1-306-84088-0 | ||
020 | |a 3527411526 |9 3-527-41152-6 | ||
020 | |a 3527681078 |9 3-527-68107-8 | ||
020 | |a 3527681086 |c electronic bk. |9 3-527-68108-6 | ||
020 | |a 3527681094 |9 3-527-68109-4 | ||
020 | |a 3527681108 |c ePub |9 3-527-68110-8 | ||
020 | |a 9781306840880 |c electronic bk. |9 978-1-306-84088-0 | ||
020 | |a 9783527411528 |9 978-3-527-41152-8 | ||
020 | |a 9783527681075 |9 978-3-527-68107-5 | ||
020 | |a 9783527681082 |c electronic bk. |9 978-3-527-68108-2 | ||
020 | |a 9783527681099 |9 978-3-527-68109-9 | ||
020 | |a 9783527681105 |c ePub |9 978-3-527-68110-5 | ||
024 | 7 | |a 10.1002/9783527681075 |2 doi | |
035 | |a (ZDB-35-WIC)ocn881028799 | ||
035 | |a (OCoLC)881028799 | ||
035 | |a (DE-599)BVBBV043396841 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
049 | |a DE-861 | ||
082 | 0 | |a 530.8 | |
084 | |a UH 5400 |0 (DE-625)145660: |2 rvk | ||
084 | |a ZQ 3910 |0 (DE-625)158088: |2 rvk | ||
100 | 1 | |a Servín, Manuel |e Verfasser |4 aut | |
245 | 1 | 0 | |a Fringe pattern analysis for optical metrology |b theory, algorithms, and applications |c Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla |
250 | |a First edition | ||
264 | 1 | |a Weinheim |b Wiley-VCH |c [2014] | |
300 | |a 1 Online-Ressource (xvi, 328 pages) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
500 | |a Edition statement from running title area | ||
500 | |a Includes bibliographical references and index | ||
650 | 7 | |a SCIENCE / Energy |2 bisacsh | |
650 | 7 | |a SCIENCE / Mechanics / General |2 bisacsh | |
650 | 7 | |a SCIENCE / Physics / General |2 bisacsh | |
650 | 7 | |a Diffraction patterns |2 fast | |
650 | 7 | |a Interferometry |2 fast | |
650 | 7 | |a Optical measurements |2 fast | |
650 | 7 | |a Interferometrie |2 gnd | |
650 | 7 | |a Beugungsfigur |2 gnd | |
650 | 4 | |a Interferometry | |
650 | 4 | |a Diffraction patterns | |
650 | 4 | |a Optical measurements | |
650 | 0 | 7 | |a Optische Messung |0 (DE-588)4121429-8 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Interferometrie |0 (DE-588)4027296-5 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Metrologie |0 (DE-588)4169749-2 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Optische Messtechnik |0 (DE-588)4172667-4 |2 gnd |9 rswk-swf |
653 | |a Electronic books | ||
689 | 0 | 0 | |a Metrologie |0 (DE-588)4169749-2 |D s |
689 | 0 | 1 | |a Optische Messtechnik |0 (DE-588)4172667-4 |D s |
689 | 0 | 2 | |a Optische Messung |0 (DE-588)4121429-8 |D s |
689 | 0 | 3 | |a Interferometrie |0 (DE-588)4027296-5 |D s |
689 | 0 | |8 1\p |5 DE-604 | |
700 | 1 | |a Quiroga, J. Antonio |e Sonstige |4 oth | |
700 | 1 | |a Padilla, J. Moisés |e Sonstige |4 oth | |
776 | 0 | 8 | |i Erscheint auch als |n Druckausgabe |z 978-3-527-41152-8 |
856 | 4 | 0 | |u https://onlinelibrary.wiley.com/doi/book/10.1002/9783527681075 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
912 | |a ZDB-35-WIC | ||
940 | 1 | |q UBG_PDA_WIC | |
999 | |a oai:aleph.bib-bvb.de:BVB01-028815425 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
966 | e | |u https://onlinelibrary.wiley.com/doi/book/10.1002/9783527681075 |l FRO01 |p ZDB-35-WIC |q FRO_PDA_WIC |x Verlag |3 Volltext | |
966 | e | |u https://onlinelibrary.wiley.com/doi/book/10.1002/9783527681075 |l UBG01 |p ZDB-35-WIC |q UBG_PDA_WIC |x Verlag |3 Volltext |
Datensatz im Suchindex
_version_ | 1804175978286546944 |
---|---|
any_adam_object | |
author | Servín, Manuel |
author_facet | Servín, Manuel |
author_role | aut |
author_sort | Servín, Manuel |
author_variant | m s ms |
building | Verbundindex |
bvnumber | BV043396841 |
classification_rvk | UH 5400 ZQ 3910 |
collection | ZDB-35-WIC |
ctrlnum | (ZDB-35-WIC)ocn881028799 (OCoLC)881028799 (DE-599)BVBBV043396841 |
dewey-full | 530.8 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 530 - Physics |
dewey-raw | 530.8 |
dewey-search | 530.8 |
dewey-sort | 3530.8 |
dewey-tens | 530 - Physics |
discipline | Physik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik / Mechatronik |
edition | First edition |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03434nmm a2200841zc 4500</leader><controlfield tag="001">BV043396841</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">160222s2014 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1306840880</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">1-306-84088-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3527411526</subfield><subfield code="9">3-527-41152-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3527681078</subfield><subfield code="9">3-527-68107-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3527681086</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">3-527-68108-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3527681094</subfield><subfield code="9">3-527-68109-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3527681108</subfield><subfield code="c">ePub</subfield><subfield code="9">3-527-68110-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781306840880</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-1-306-84088-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527411528</subfield><subfield code="9">978-3-527-41152-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527681075</subfield><subfield code="9">978-3-527-68107-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527681082</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-3-527-68108-2</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527681099</subfield><subfield code="9">978-3-527-68109-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527681105</subfield><subfield code="c">ePub</subfield><subfield code="9">978-3-527-68110-5</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1002/9783527681075</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-35-WIC)ocn881028799</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)881028799</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV043396841</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-861</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">530.8</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5400</subfield><subfield code="0">(DE-625)145660:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZQ 3910</subfield><subfield code="0">(DE-625)158088:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Servín, Manuel</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Fringe pattern analysis for optical metrology</subfield><subfield code="b">theory, algorithms, and applications</subfield><subfield code="c">Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">First edition</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Weinheim</subfield><subfield code="b">Wiley-VCH</subfield><subfield code="c">[2014]</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xvi, 328 pages)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Edition statement from running title area</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Energy</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Mechanics / General</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Physics / General</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Diffraction patterns</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Interferometry</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Optical measurements</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Interferometrie</subfield><subfield code="2">gnd</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Beugungsfigur</subfield><subfield code="2">gnd</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Interferometry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Diffraction patterns</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical measurements</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Optische Messung</subfield><subfield code="0">(DE-588)4121429-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Interferometrie</subfield><subfield code="0">(DE-588)4027296-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Metrologie</subfield><subfield code="0">(DE-588)4169749-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Optische Messtechnik</subfield><subfield code="0">(DE-588)4172667-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Electronic books</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Metrologie</subfield><subfield code="0">(DE-588)4169749-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Optische Messtechnik</subfield><subfield code="0">(DE-588)4172667-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Optische Messung</subfield><subfield code="0">(DE-588)4121429-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="3"><subfield code="a">Interferometrie</subfield><subfield code="0">(DE-588)4027296-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Quiroga, J. Antonio</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Padilla, J. Moisés</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druckausgabe</subfield><subfield code="z">978-3-527-41152-8</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527681075</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-35-WIC</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">UBG_PDA_WIC</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-028815425</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527681075</subfield><subfield code="l">FRO01</subfield><subfield code="p">ZDB-35-WIC</subfield><subfield code="q">FRO_PDA_WIC</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527681075</subfield><subfield code="l">UBG01</subfield><subfield code="p">ZDB-35-WIC</subfield><subfield code="q">UBG_PDA_WIC</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
id | DE-604.BV043396841 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T07:24:52Z |
institution | BVB |
isbn | 1306840880 3527411526 3527681078 3527681086 3527681094 3527681108 9781306840880 9783527411528 9783527681075 9783527681082 9783527681099 9783527681105 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028815425 |
oclc_num | 881028799 |
open_access_boolean | |
owner | DE-861 |
owner_facet | DE-861 |
physical | 1 Online-Ressource (xvi, 328 pages) |
psigel | ZDB-35-WIC UBG_PDA_WIC ZDB-35-WIC FRO_PDA_WIC ZDB-35-WIC UBG_PDA_WIC |
publishDate | 2014 |
publishDateSearch | 2014 |
publishDateSort | 2014 |
publisher | Wiley-VCH |
record_format | marc |
spelling | Servín, Manuel Verfasser aut Fringe pattern analysis for optical metrology theory, algorithms, and applications Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla First edition Weinheim Wiley-VCH [2014] 1 Online-Ressource (xvi, 328 pages) txt rdacontent c rdamedia cr rdacarrier Edition statement from running title area Includes bibliographical references and index SCIENCE / Energy bisacsh SCIENCE / Mechanics / General bisacsh SCIENCE / Physics / General bisacsh Diffraction patterns fast Interferometry fast Optical measurements fast Interferometrie gnd Beugungsfigur gnd Interferometry Diffraction patterns Optical measurements Optische Messung (DE-588)4121429-8 gnd rswk-swf Interferometrie (DE-588)4027296-5 gnd rswk-swf Metrologie (DE-588)4169749-2 gnd rswk-swf Optische Messtechnik (DE-588)4172667-4 gnd rswk-swf Electronic books Metrologie (DE-588)4169749-2 s Optische Messtechnik (DE-588)4172667-4 s Optische Messung (DE-588)4121429-8 s Interferometrie (DE-588)4027296-5 s 1\p DE-604 Quiroga, J. Antonio Sonstige oth Padilla, J. Moisés Sonstige oth Erscheint auch als Druckausgabe 978-3-527-41152-8 https://onlinelibrary.wiley.com/doi/book/10.1002/9783527681075 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Servín, Manuel Fringe pattern analysis for optical metrology theory, algorithms, and applications SCIENCE / Energy bisacsh SCIENCE / Mechanics / General bisacsh SCIENCE / Physics / General bisacsh Diffraction patterns fast Interferometry fast Optical measurements fast Interferometrie gnd Beugungsfigur gnd Interferometry Diffraction patterns Optical measurements Optische Messung (DE-588)4121429-8 gnd Interferometrie (DE-588)4027296-5 gnd Metrologie (DE-588)4169749-2 gnd Optische Messtechnik (DE-588)4172667-4 gnd |
subject_GND | (DE-588)4121429-8 (DE-588)4027296-5 (DE-588)4169749-2 (DE-588)4172667-4 |
title | Fringe pattern analysis for optical metrology theory, algorithms, and applications |
title_auth | Fringe pattern analysis for optical metrology theory, algorithms, and applications |
title_exact_search | Fringe pattern analysis for optical metrology theory, algorithms, and applications |
title_full | Fringe pattern analysis for optical metrology theory, algorithms, and applications Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla |
title_fullStr | Fringe pattern analysis for optical metrology theory, algorithms, and applications Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla |
title_full_unstemmed | Fringe pattern analysis for optical metrology theory, algorithms, and applications Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla |
title_short | Fringe pattern analysis for optical metrology |
title_sort | fringe pattern analysis for optical metrology theory algorithms and applications |
title_sub | theory, algorithms, and applications |
topic | SCIENCE / Energy bisacsh SCIENCE / Mechanics / General bisacsh SCIENCE / Physics / General bisacsh Diffraction patterns fast Interferometry fast Optical measurements fast Interferometrie gnd Beugungsfigur gnd Interferometry Diffraction patterns Optical measurements Optische Messung (DE-588)4121429-8 gnd Interferometrie (DE-588)4027296-5 gnd Metrologie (DE-588)4169749-2 gnd Optische Messtechnik (DE-588)4172667-4 gnd |
topic_facet | SCIENCE / Energy SCIENCE / Mechanics / General SCIENCE / Physics / General Diffraction patterns Interferometry Optical measurements Interferometrie Beugungsfigur Optische Messung Metrologie Optische Messtechnik |
url | https://onlinelibrary.wiley.com/doi/book/10.1002/9783527681075 |
work_keys_str_mv | AT servinmanuel fringepatternanalysisforopticalmetrologytheoryalgorithmsandapplications AT quirogajantonio fringepatternanalysisforopticalmetrologytheoryalgorithmsandapplications AT padillajmoises fringepatternanalysisforopticalmetrologytheoryalgorithmsandapplications |