X-ray diffraction by polycrystalline materials:
Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Guinebretiere, Rene (VerfasserIn)
Format: Elektronisch E-Book
Sprache:English
Veröffentlicht: London ISTE 2007
Schlagworte:
Online-Zugang:FRO01
UBG01
URL des Erstveröffentlichers
Beschreibung:Includes bibliographical references (pages 319-347) and index
This book presents a physical approach to the diffraction phenomenon and its applications in materials science. Part One is a historical presentation of the discovery of X-ray diffraction. Part Two is devoted to a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. A detailed analysis of the instruments used for the characterization of powdered materials or thin films is proposed in part three. The description of the processing of measured signals and their results is given. In the final part, the author presents recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction
Beschreibung:1 Online-Ressource (xxxii, 351 pages)
ISBN:9780470612408
0470612401
9781847045713
1847045715
9780470394533
0470394536
1280847646
9781280847646
9781905209217
1905209215

Es ist kein Print-Exemplar vorhanden.

Fernleihe Bestellen Achtung: Nicht im THWS-Bestand! Volltext öffnen