Materials characterization: introduction to microscopic and spectroscopic methods
Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Leng, Y. (VerfasserIn)
Format: Elektronisch E-Book
Sprache:English
Veröffentlicht: Singapore J. Wiley & Sons ©2008
Schlagworte:
Online-Zugang:FRO01
UBG01
URL des Erstveröffentlichers
Beschreibung:Includes bibliographical references and index
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered
Beschreibung:1 Online-Ressource (xii, 337 pages)
ISBN:0470822996
9780470822999
1282031406
9781282031401
9780470823002
0470823003

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