Microstructural characterization of materials:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Chichester, England
John Wiley
2008
|
| Ausgabe: | 2nd ed |
| Schriftenreihe: | Quantitative software engineering series
|
| Schlagworte: | |
| Online-Zugang: | FRO01 UBG01 Volltext |
| Beschreibung: | Includes bibliographical references and index Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this p |
| Beschreibung: | 1 Online-Ressource |
| ISBN: | 9780470727133 0470727136 9780470027844 0470027843 9780470727126 0470727128 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV043388181 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 160222s2008 |||| o||u| ||||||eng d | ||
| 020 | |a 9780470727133 |9 978-0-470-72713-3 | ||
| 020 | |a 0470727136 |9 0-470-72713-6 | ||
| 020 | |a 9780470027844 |9 978-0-470-02784-4 | ||
| 020 | |a 0470027843 |9 0-470-02784-3 | ||
| 020 | |a 9780470727126 |c electronic bk. |9 978-0-470-72712-6 | ||
| 020 | |a 0470727128 |c electronic bk. |9 0-470-72712-8 | ||
| 024 | 7 | |a 10.1002/9780470727133 |2 doi | |
| 035 | |a (ZDB-35-WIC)ocn232611467 | ||
| 035 | |a (OCoLC)232611467 | ||
| 035 | |a (DE-599)BVBBV043388181 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-861 | ||
| 082 | 0 | |a 620.1/1299 |2 22 | |
| 084 | |a UQ 8000 |0 (DE-625)146584: |2 rvk | ||
| 084 | |a VE 9670 |0 (DE-625)147161:253 |2 rvk | ||
| 084 | |a ZM 3500 |0 (DE-625)159836: |2 rvk | ||
| 100 | 1 | |a Brandon, D. G. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Microstructural characterization of materials |c David Brandon and Wayne Kaplan |
| 250 | |a 2nd ed | ||
| 264 | 1 | |a Chichester, England |b John Wiley |c 2008 | |
| 300 | |a 1 Online-Ressource | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Quantitative software engineering series | |
| 500 | |a Includes bibliographical references and index | ||
| 500 | |a Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this p | ||
| 650 | 7 | |a SCIENCE / Nanoscience |2 bisacsh | |
| 650 | 7 | |a Materials / Microscopy |2 fast | |
| 650 | 7 | |a Microstructure |2 fast | |
| 650 | 7 | |a Materiais |2 larpcal | |
| 650 | 7 | |a Microscopia |2 larpcal | |
| 650 | 7 | |a Materialcharakterisierung |2 swd | |
| 650 | 7 | |a Mikrostruktur |2 swd | |
| 650 | 4 | |a Materials / Microscopy | |
| 650 | 4 | |a Microstructure | |
| 650 | 0 | 7 | |a Festkörperoberfläche |0 (DE-588)4127823-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroskopie |0 (DE-588)4039238-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Werkstoff |0 (DE-588)4065579-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Spektroskopie |0 (DE-588)4056138-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Strukturanalyse |0 (DE-588)4183787-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Materialcharakterisierung |0 (DE-588)4720368-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroanalyse |0 (DE-588)4169804-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Röntgenstrukturanalyse |0 (DE-588)4137203-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikrostruktur |0 (DE-588)4131028-7 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Werkstoff |0 (DE-588)4065579-9 |D s |
| 689 | 0 | 1 | |a Mikrostruktur |0 (DE-588)4131028-7 |D s |
| 689 | 0 | 2 | |a Strukturanalyse |0 (DE-588)4183787-3 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 689 | 1 | 0 | |a Materialcharakterisierung |0 (DE-588)4720368-7 |D s |
| 689 | 1 | 1 | |a Mikrostruktur |0 (DE-588)4131028-7 |D s |
| 689 | 1 | |8 2\p |5 DE-604 | |
| 689 | 2 | 0 | |a Festkörperoberfläche |0 (DE-588)4127823-9 |D s |
| 689 | 2 | 1 | |a Strukturanalyse |0 (DE-588)4183787-3 |D s |
| 689 | 2 | |8 3\p |5 DE-604 | |
| 689 | 3 | 0 | |a Festkörperoberfläche |0 (DE-588)4127823-9 |D s |
| 689 | 3 | 1 | |a Mikroskopie |0 (DE-588)4039238-7 |D s |
| 689 | 3 | |8 4\p |5 DE-604 | |
| 689 | 4 | 0 | |a Festkörperoberfläche |0 (DE-588)4127823-9 |D s |
| 689 | 4 | 1 | |a Mikroanalyse |0 (DE-588)4169804-6 |D s |
| 689 | 4 | |8 5\p |5 DE-604 | |
| 689 | 5 | 0 | |a Festkörperoberfläche |0 (DE-588)4127823-9 |D s |
| 689 | 5 | 1 | |a Spektroskopie |0 (DE-588)4056138-0 |D s |
| 689 | 5 | |8 6\p |5 DE-604 | |
| 689 | 6 | 0 | |a Röntgenstrukturanalyse |0 (DE-588)4137203-7 |D s |
| 689 | 6 | |8 7\p |5 DE-604 | |
| 700 | 1 | |a Kaplan, Wayne D. |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe, Paperback |z 0-470-02785-1 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe, Paperback |z 978-0-470-02785-1 |
| 856 | 4 | 0 | |u https://onlinelibrary.wiley.com/doi/book/10.1002/9780470727133 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-35-WIC | ||
| 940 | 1 | |q UBG_PDA_WIC | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-028806765 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 3\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 4\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 5\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 6\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 7\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u https://onlinelibrary.wiley.com/doi/book/10.1002/9780470727133 |l FRO01 |p ZDB-35-WIC |q FRO_PDA_WIC |x Verlag |3 Volltext | |
| 966 | e | |u https://onlinelibrary.wiley.com/doi/book/10.1002/9780470727133 |l UBG01 |p ZDB-35-WIC |q UBG_PDA_WIC |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804175959385964544 |
|---|---|
| any_adam_object | |
| author | Brandon, D. G. |
| author_facet | Brandon, D. G. |
| author_role | aut |
| author_sort | Brandon, D. G. |
| author_variant | d g b dg dgb |
| building | Verbundindex |
| bvnumber | BV043388181 |
| classification_rvk | UQ 8000 VE 9670 ZM 3500 |
| collection | ZDB-35-WIC |
| ctrlnum | (ZDB-35-WIC)ocn232611467 (OCoLC)232611467 (DE-599)BVBBV043388181 |
| dewey-full | 620.1/1299 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.1/1299 |
| dewey-search | 620.1/1299 |
| dewey-sort | 3620.1 41299 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Chemie / Pharmazie Physik Werkstoffwissenschaften / Fertigungstechnik |
| edition | 2nd ed |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>05202nmm a2201081zc 4500</leader><controlfield tag="001">BV043388181</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">160222s2008 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780470727133</subfield><subfield code="9">978-0-470-72713-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0470727136</subfield><subfield code="9">0-470-72713-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780470027844</subfield><subfield code="9">978-0-470-02784-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0470027843</subfield><subfield code="9">0-470-02784-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780470727126</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-0-470-72712-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0470727128</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">0-470-72712-8</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1002/9780470727133</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-35-WIC)ocn232611467</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)232611467</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV043388181</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-861</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620.1/1299</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 8000</subfield><subfield code="0">(DE-625)146584:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VE 9670</subfield><subfield code="0">(DE-625)147161:253</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZM 3500</subfield><subfield code="0">(DE-625)159836:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Brandon, D. G.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Microstructural characterization of materials</subfield><subfield code="c">David Brandon and Wayne Kaplan</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">2nd ed</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Chichester, England</subfield><subfield code="b">John Wiley</subfield><subfield code="c">2008</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Quantitative software engineering series</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this p</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Nanoscience</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Materials / Microscopy</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Microstructure</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Materiais</subfield><subfield code="2">larpcal</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Microscopia</subfield><subfield code="2">larpcal</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Materialcharakterisierung</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Mikrostruktur</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials / Microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microstructure</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Festkörperoberfläche</subfield><subfield code="0">(DE-588)4127823-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroskopie</subfield><subfield code="0">(DE-588)4039238-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Werkstoff</subfield><subfield code="0">(DE-588)4065579-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Spektroskopie</subfield><subfield code="0">(DE-588)4056138-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Strukturanalyse</subfield><subfield code="0">(DE-588)4183787-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Materialcharakterisierung</subfield><subfield code="0">(DE-588)4720368-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroanalyse</subfield><subfield code="0">(DE-588)4169804-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Röntgenstrukturanalyse</subfield><subfield code="0">(DE-588)4137203-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikrostruktur</subfield><subfield code="0">(DE-588)4131028-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Werkstoff</subfield><subfield code="0">(DE-588)4065579-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Mikrostruktur</subfield><subfield code="0">(DE-588)4131028-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Strukturanalyse</subfield><subfield code="0">(DE-588)4183787-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Materialcharakterisierung</subfield><subfield code="0">(DE-588)4720368-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Mikrostruktur</subfield><subfield code="0">(DE-588)4131028-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Festkörperoberfläche</subfield><subfield code="0">(DE-588)4127823-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2="1"><subfield code="a">Strukturanalyse</subfield><subfield code="0">(DE-588)4183787-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Festkörperoberfläche</subfield><subfield code="0">(DE-588)4127823-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2="1"><subfield code="a">Mikroskopie</subfield><subfield code="0">(DE-588)4039238-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="8">4\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Festkörperoberfläche</subfield><subfield code="0">(DE-588)4127823-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2="1"><subfield code="a">Mikroanalyse</subfield><subfield code="0">(DE-588)4169804-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="8">5\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="5" ind2="0"><subfield code="a">Festkörperoberfläche</subfield><subfield code="0">(DE-588)4127823-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2="1"><subfield code="a">Spektroskopie</subfield><subfield code="0">(DE-588)4056138-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2=" "><subfield code="8">6\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="6" ind2="0"><subfield code="a">Röntgenstrukturanalyse</subfield><subfield code="0">(DE-588)4137203-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="6" ind2=" "><subfield code="8">7\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kaplan, Wayne D.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe, Paperback</subfield><subfield code="z">0-470-02785-1</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe, Paperback</subfield><subfield code="z">978-0-470-02785-1</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/9780470727133</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-35-WIC</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">UBG_PDA_WIC</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-028806765</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">4\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">5\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">6\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">7\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/9780470727133</subfield><subfield code="l">FRO01</subfield><subfield code="p">ZDB-35-WIC</subfield><subfield code="q">FRO_PDA_WIC</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/9780470727133</subfield><subfield code="l">UBG01</subfield><subfield code="p">ZDB-35-WIC</subfield><subfield code="q">UBG_PDA_WIC</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV043388181 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:24:34Z |
| institution | BVB |
| isbn | 9780470727133 0470727136 9780470027844 0470027843 9780470727126 0470727128 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028806765 |
| oclc_num | 232611467 |
| open_access_boolean | |
| owner | DE-861 |
| owner_facet | DE-861 |
| physical | 1 Online-Ressource |
| psigel | ZDB-35-WIC UBG_PDA_WIC ZDB-35-WIC FRO_PDA_WIC ZDB-35-WIC UBG_PDA_WIC |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | John Wiley |
| record_format | marc |
| series2 | Quantitative software engineering series |
| spelling | Brandon, D. G. Verfasser aut Microstructural characterization of materials David Brandon and Wayne Kaplan 2nd ed Chichester, England John Wiley 2008 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Quantitative software engineering series Includes bibliographical references and index Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this p SCIENCE / Nanoscience bisacsh Materials / Microscopy fast Microstructure fast Materiais larpcal Microscopia larpcal Materialcharakterisierung swd Mikrostruktur swd Materials / Microscopy Microstructure Festkörperoberfläche (DE-588)4127823-9 gnd rswk-swf Mikroskopie (DE-588)4039238-7 gnd rswk-swf Werkstoff (DE-588)4065579-9 gnd rswk-swf Spektroskopie (DE-588)4056138-0 gnd rswk-swf Strukturanalyse (DE-588)4183787-3 gnd rswk-swf Materialcharakterisierung (DE-588)4720368-7 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Röntgenstrukturanalyse (DE-588)4137203-7 gnd rswk-swf Mikrostruktur (DE-588)4131028-7 gnd rswk-swf Werkstoff (DE-588)4065579-9 s Mikrostruktur (DE-588)4131028-7 s Strukturanalyse (DE-588)4183787-3 s 1\p DE-604 Materialcharakterisierung (DE-588)4720368-7 s 2\p DE-604 Festkörperoberfläche (DE-588)4127823-9 s 3\p DE-604 Mikroskopie (DE-588)4039238-7 s 4\p DE-604 Mikroanalyse (DE-588)4169804-6 s 5\p DE-604 Spektroskopie (DE-588)4056138-0 s 6\p DE-604 Röntgenstrukturanalyse (DE-588)4137203-7 s 7\p DE-604 Kaplan, Wayne D. Sonstige oth Erscheint auch als Druck-Ausgabe, Paperback 0-470-02785-1 Erscheint auch als Druck-Ausgabe, Paperback 978-0-470-02785-1 https://onlinelibrary.wiley.com/doi/book/10.1002/9780470727133 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 7\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Brandon, D. G. Microstructural characterization of materials SCIENCE / Nanoscience bisacsh Materials / Microscopy fast Microstructure fast Materiais larpcal Microscopia larpcal Materialcharakterisierung swd Mikrostruktur swd Materials / Microscopy Microstructure Festkörperoberfläche (DE-588)4127823-9 gnd Mikroskopie (DE-588)4039238-7 gnd Werkstoff (DE-588)4065579-9 gnd Spektroskopie (DE-588)4056138-0 gnd Strukturanalyse (DE-588)4183787-3 gnd Materialcharakterisierung (DE-588)4720368-7 gnd Mikroanalyse (DE-588)4169804-6 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Mikrostruktur (DE-588)4131028-7 gnd |
| subject_GND | (DE-588)4127823-9 (DE-588)4039238-7 (DE-588)4065579-9 (DE-588)4056138-0 (DE-588)4183787-3 (DE-588)4720368-7 (DE-588)4169804-6 (DE-588)4137203-7 (DE-588)4131028-7 |
| title | Microstructural characterization of materials |
| title_auth | Microstructural characterization of materials |
| title_exact_search | Microstructural characterization of materials |
| title_full | Microstructural characterization of materials David Brandon and Wayne Kaplan |
| title_fullStr | Microstructural characterization of materials David Brandon and Wayne Kaplan |
| title_full_unstemmed | Microstructural characterization of materials David Brandon and Wayne Kaplan |
| title_short | Microstructural characterization of materials |
| title_sort | microstructural characterization of materials |
| topic | SCIENCE / Nanoscience bisacsh Materials / Microscopy fast Microstructure fast Materiais larpcal Microscopia larpcal Materialcharakterisierung swd Mikrostruktur swd Materials / Microscopy Microstructure Festkörperoberfläche (DE-588)4127823-9 gnd Mikroskopie (DE-588)4039238-7 gnd Werkstoff (DE-588)4065579-9 gnd Spektroskopie (DE-588)4056138-0 gnd Strukturanalyse (DE-588)4183787-3 gnd Materialcharakterisierung (DE-588)4720368-7 gnd Mikroanalyse (DE-588)4169804-6 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Mikrostruktur (DE-588)4131028-7 gnd |
| topic_facet | SCIENCE / Nanoscience Materials / Microscopy Microstructure Materiais Microscopia Materialcharakterisierung Mikrostruktur Festkörperoberfläche Mikroskopie Werkstoff Spektroskopie Strukturanalyse Mikroanalyse Röntgenstrukturanalyse |
| url | https://onlinelibrary.wiley.com/doi/book/10.1002/9780470727133 |
| work_keys_str_mv | AT brandondg microstructuralcharacterizationofmaterials AT kaplanwayned microstructuralcharacterizationofmaterials |