Nanoscale characterization of surfaces and interfaces:
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Weinheim
VCH
©1994
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Schlagworte: | |
Online-Zugang: | FRO01 UBG01 Volltext |
Beschreibung: | Includes bibliographical references (pages 151-158) and index |
Beschreibung: | 1 Online-Ressource (163 pages) 25 cm |
ISBN: | 9783527615957 3527615954 |
Internformat
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500 | |a Includes bibliographical references (pages 151-158) and index | ||
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650 | 7 | |a Nanotechnology |2 fast | |
650 | 7 | |a Scanning tunneling microscopy |2 fast | |
650 | 7 | |a Surfaces (Physics) |2 fast | |
650 | 7 | |a Scanning tunneling microscopy |2 gtt | |
650 | 7 | |a Nanostructuren |2 gtt | |
650 | 7 | |a Oppervlakken |2 gtt | |
650 | 7 | |a Grenslagen |2 gtt | |
650 | 7 | |a AFM. |2 gtt | |
650 | 4 | |a Surfaces (Physics) | |
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Datensatz im Suchindex
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any_adam_object | |
author | DiNardo, N. John |
author_facet | DiNardo, N. John |
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author_sort | DiNardo, N. John |
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dewey-ones | 502 - Miscellany |
dewey-raw | 502.825 |
dewey-search | 502.825 |
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dewey-tens | 500 - Natural sciences and mathematics |
discipline | Allgemeine Naturwissenschaft |
format | Electronic eBook |
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id | DE-604.BV043387545 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T07:24:33Z |
institution | BVB |
isbn | 9783527615957 3527615954 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028806128 |
oclc_num | 212133922 |
open_access_boolean | |
owner | DE-861 |
owner_facet | DE-861 |
physical | 1 Online-Ressource (163 pages) 25 cm |
psigel | ZDB-35-WIC UBG_PDA_WIC ZDB-35-WIC FRO_PDA_WIC ZDB-35-WIC UBG_PDA_WIC |
publishDate | 1994 |
publishDateSearch | 1994 |
publishDateSort | 1994 |
publisher | VCH |
record_format | marc |
spelling | DiNardo, N. John Verfasser aut Nanoscale characterization of surfaces and interfaces N. John DiNardo Weinheim VCH ©1994 1 Online-Ressource (163 pages) 25 cm txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references (pages 151-158) and index Online-Ausgabe Mode of access: World Wide Web Nanotechnology fast Scanning tunneling microscopy fast Surfaces (Physics) fast Scanning tunneling microscopy gtt Nanostructuren gtt Oppervlakken gtt Grenslagen gtt AFM. gtt Surfaces (Physics) Scanning tunneling microscopy Nanotechnology Nanostrukturiertes Material (DE-588)4342626-8 gnd rswk-swf Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Nanostrukturiertes Material (DE-588)4342626-8 s Rastersondenmikroskopie (DE-588)4330328-6 s 1\p DE-604 Reproduktion von DiNardo, N. John Nanoscale characterization of surfaces and interfaces ©1994 https://onlinelibrary.wiley.com/doi/book/10.1002/9783527615957 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | DiNardo, N. John Nanoscale characterization of surfaces and interfaces Nanotechnology fast Scanning tunneling microscopy fast Surfaces (Physics) fast Scanning tunneling microscopy gtt Nanostructuren gtt Oppervlakken gtt Grenslagen gtt AFM. gtt Surfaces (Physics) Scanning tunneling microscopy Nanotechnology Nanostrukturiertes Material (DE-588)4342626-8 gnd Rastersondenmikroskopie (DE-588)4330328-6 gnd |
subject_GND | (DE-588)4342626-8 (DE-588)4330328-6 |
title | Nanoscale characterization of surfaces and interfaces |
title_auth | Nanoscale characterization of surfaces and interfaces |
title_exact_search | Nanoscale characterization of surfaces and interfaces |
title_full | Nanoscale characterization of surfaces and interfaces N. John DiNardo |
title_fullStr | Nanoscale characterization of surfaces and interfaces N. John DiNardo |
title_full_unstemmed | Nanoscale characterization of surfaces and interfaces N. John DiNardo |
title_short | Nanoscale characterization of surfaces and interfaces |
title_sort | nanoscale characterization of surfaces and interfaces |
topic | Nanotechnology fast Scanning tunneling microscopy fast Surfaces (Physics) fast Scanning tunneling microscopy gtt Nanostructuren gtt Oppervlakken gtt Grenslagen gtt AFM. gtt Surfaces (Physics) Scanning tunneling microscopy Nanotechnology Nanostrukturiertes Material (DE-588)4342626-8 gnd Rastersondenmikroskopie (DE-588)4330328-6 gnd |
topic_facet | Nanotechnology Scanning tunneling microscopy Surfaces (Physics) Nanostructuren Oppervlakken Grenslagen AFM. Nanostrukturiertes Material Rastersondenmikroskopie |
url | https://onlinelibrary.wiley.com/doi/book/10.1002/9783527615957 |
work_keys_str_mv | AT dinardonjohn nanoscalecharacterizationofsurfacesandinterfaces |