Surface analysis with STM and AFM: experimental and theoretical aspects of image analysis
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Weinheim
VCH
©1996
|
| Schlagworte: | |
| Online-Zugang: | FRO01 UBG01 Volltext |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource (xii, 323 pages) 25 cm |
| ISBN: | 9783527615117 3527615113 |
Internformat
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| 100 | 1 | |a Magonov, Sergei N. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Surface analysis with STM and AFM |b experimental and theoretical aspects of image analysis |c Sergei N. Magonov, Myung-Hwan Whangbo |
| 246 | 1 | 3 | |a Experimental and theoretic aspects of image analysis |
| 246 | 1 | 3 | |a Image analysis |
| 264 | 1 | |a Weinheim |b VCH |c ©1996 | |
| 300 | |a 1 Online-Ressource (xii, 323 pages) |c 25 cm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 533 | |a Online-Ausgabe |n Mode of access: World Wide Web | ||
| 650 | 7 | |a Scanning tunneling microscopy |2 gtt | |
| 650 | 7 | |a AFM. |2 gtt | |
| 650 | 7 | |a Oppervlakken |2 gtt | |
| 650 | 4 | |a Surfaces (Technology) / Analysis | |
| 650 | 4 | |a Scanning tunneling microscopy | |
| 650 | 4 | |a Atomic force microscopy | |
| 650 | 4 | |a Metals / Surfaces / Analysis | |
| 650 | 4 | |a Semiconductors / Testing | |
| 650 | 4 | |a Electric insulators and insulation / Testing | |
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| 650 | 0 | 7 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Rastertunnelmikroskopie |0 (DE-588)4252995-5 |2 gnd |9 rswk-swf |
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| 689 | 1 | |8 2\p |5 DE-604 | |
| 700 | 1 | |a Whangbo, Myung-Hwan |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Reproduktion von |a Magonov, Sergei N. |t Surface analysis with STM and AFM |d ©1996 |
| 856 | 4 | 0 | |u https://onlinelibrary.wiley.com/doi/book/10.1002/9783527615117 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
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Datensatz im Suchindex
| _version_ | 1804175958045884416 |
|---|---|
| any_adam_object | |
| author | Magonov, Sergei N. |
| author_facet | Magonov, Sergei N. |
| author_role | aut |
| author_sort | Magonov, Sergei N. |
| author_variant | s n m sn snm |
| building | Verbundindex |
| bvnumber | BV043387523 |
| collection | ZDB-35-WIC |
| ctrlnum | (ZDB-35-WIC)ocn212132381 (OCoLC)212132381 (DE-599)BVBBV043387523 |
| dewey-full | 502.82 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.82 |
| dewey-search | 502.82 |
| dewey-sort | 3502.82 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| format | Electronic eBook |
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| id | DE-604.BV043387523 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:24:33Z |
| institution | BVB |
| isbn | 9783527615117 3527615113 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028806106 |
| oclc_num | 212132381 |
| open_access_boolean | |
| owner | DE-861 |
| owner_facet | DE-861 |
| physical | 1 Online-Ressource (xii, 323 pages) 25 cm |
| psigel | ZDB-35-WIC UBG_PDA_WIC ZDB-35-WIC FRO_PDA_WIC ZDB-35-WIC UBG_PDA_WIC |
| publishDate | 1996 |
| publishDateSearch | 1996 |
| publishDateSort | 1996 |
| publisher | VCH |
| record_format | marc |
| spelling | Magonov, Sergei N. Verfasser aut Surface analysis with STM and AFM experimental and theoretical aspects of image analysis Sergei N. Magonov, Myung-Hwan Whangbo Experimental and theoretic aspects of image analysis Image analysis Weinheim VCH ©1996 1 Online-Ressource (xii, 323 pages) 25 cm txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Online-Ausgabe Mode of access: World Wide Web Scanning tunneling microscopy gtt AFM. gtt Oppervlakken gtt Surfaces (Technology) / Analysis Scanning tunneling microscopy Atomic force microscopy Metals / Surfaces / Analysis Semiconductors / Testing Electric insulators and insulation / Testing Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 s Rasterkraftmikroskopie (DE-588)4274473-8 s 1\p DE-604 Rastertunnelmikroskopie (DE-588)4252995-5 s 2\p DE-604 Whangbo, Myung-Hwan Sonstige oth Reproduktion von Magonov, Sergei N. Surface analysis with STM and AFM ©1996 https://onlinelibrary.wiley.com/doi/book/10.1002/9783527615117 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Magonov, Sergei N. Surface analysis with STM and AFM experimental and theoretical aspects of image analysis Scanning tunneling microscopy gtt AFM. gtt Oppervlakken gtt Surfaces (Technology) / Analysis Scanning tunneling microscopy Atomic force microscopy Metals / Surfaces / Analysis Semiconductors / Testing Electric insulators and insulation / Testing Rasterkraftmikroskopie (DE-588)4274473-8 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd |
| subject_GND | (DE-588)4274473-8 (DE-588)4172243-7 (DE-588)4252995-5 |
| title | Surface analysis with STM and AFM experimental and theoretical aspects of image analysis |
| title_alt | Experimental and theoretic aspects of image analysis Image analysis |
| title_auth | Surface analysis with STM and AFM experimental and theoretical aspects of image analysis |
| title_exact_search | Surface analysis with STM and AFM experimental and theoretical aspects of image analysis |
| title_full | Surface analysis with STM and AFM experimental and theoretical aspects of image analysis Sergei N. Magonov, Myung-Hwan Whangbo |
| title_fullStr | Surface analysis with STM and AFM experimental and theoretical aspects of image analysis Sergei N. Magonov, Myung-Hwan Whangbo |
| title_full_unstemmed | Surface analysis with STM and AFM experimental and theoretical aspects of image analysis Sergei N. Magonov, Myung-Hwan Whangbo |
| title_short | Surface analysis with STM and AFM |
| title_sort | surface analysis with stm and afm experimental and theoretical aspects of image analysis |
| title_sub | experimental and theoretical aspects of image analysis |
| topic | Scanning tunneling microscopy gtt AFM. gtt Oppervlakken gtt Surfaces (Technology) / Analysis Scanning tunneling microscopy Atomic force microscopy Metals / Surfaces / Analysis Semiconductors / Testing Electric insulators and insulation / Testing Rasterkraftmikroskopie (DE-588)4274473-8 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd |
| topic_facet | Scanning tunneling microscopy AFM. Oppervlakken Surfaces (Technology) / Analysis Atomic force microscopy Metals / Surfaces / Analysis Semiconductors / Testing Electric insulators and insulation / Testing Rasterkraftmikroskopie Oberflächenanalyse Rastertunnelmikroskopie |
| url | https://onlinelibrary.wiley.com/doi/book/10.1002/9783527615117 |
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