Spectroscopic ellipsometry: principles and applications
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Chichester, England
John Wiley & Sons
©2007
|
| Schlagworte: | |
| Online-Zugang: | FRO01 UBG01 UER01 Volltext |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource (xviii, 369 pages) |
| ISBN: | 9780470060193 9780470060186 |
Internformat
MARC
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| 020 | |a 9780470060186 |c electronic bk. |9 978-0-470-06018-6 | ||
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| 100 | 1 | |a Fujiwara, Hiroyuki |e Verfasser |0 (DE-588)140809872 |4 aut | |
| 245 | 1 | 0 | |a Spectroscopic ellipsometry |b principles and applications |c Hiroyuki Fujiwara |
| 264 | 1 | |a Chichester, England |b John Wiley & Sons |c ©2007 | |
| 300 | |a 1 Online-Ressource (xviii, 369 pages) | ||
| 336 | |b txt |2 rdacontent | ||
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| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 650 | 7 | |a SCIENCE / Nanoscience |2 bisacsh | |
| 650 | 7 | |a Ellipsometry |2 fast | |
| 650 | 7 | |a Materials / Optical properties |2 fast | |
| 650 | 7 | |a Spectrum analysis |2 fast | |
| 650 | 4 | |a Ellipsometry | |
| 650 | 4 | |a Spectrum analysis | |
| 650 | 4 | |a Materials / Optical properties | |
| 650 | 0 | 7 | |a Spektralanalyse |0 (DE-588)4132368-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Ellipsometrie |0 (DE-588)4152025-7 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Ellipsometrie |0 (DE-588)4152025-7 |D s |
| 689 | 0 | 1 | |a Spektralanalyse |0 (DE-588)4132368-3 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-0-470-01608-4 |
| 856 | 4 | 0 | |u https://onlinelibrary.wiley.com/doi/book/10.1002/9780470060193 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
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Datensatz im Suchindex
| _version_ | 1804175956013744128 |
|---|---|
| any_adam_object | |
| author | Fujiwara, Hiroyuki |
| author_GND | (DE-588)140809872 |
| author_facet | Fujiwara, Hiroyuki |
| author_role | aut |
| author_sort | Fujiwara, Hiroyuki |
| author_variant | h f hf |
| building | Verbundindex |
| bvnumber | BV043386568 |
| classification_rvk | UH 5500 UP 8300 |
| collection | ZDB-35-WIC |
| ctrlnum | (ZDB-35-WIC)ocn180190013 (OCoLC)180190013 (DE-599)BVBBV043386568 |
| dewey-full | 620.1/1295 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.1/1295 |
| dewey-search | 620.1/1295 |
| dewey-sort | 3620.1 41295 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik |
| format | Electronic eBook |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:24:31Z |
| institution | BVB |
| isbn | 9780470060193 9780470060186 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028805152 |
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| physical | 1 Online-Ressource (xviii, 369 pages) |
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| publishDate | 2007 |
| publishDateSearch | 2007 |
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| publisher | John Wiley & Sons |
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| spelling | Fujiwara, Hiroyuki Verfasser (DE-588)140809872 aut Spectroscopic ellipsometry principles and applications Hiroyuki Fujiwara Chichester, England John Wiley & Sons ©2007 1 Online-Ressource (xviii, 369 pages) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index SCIENCE / Nanoscience bisacsh Ellipsometry fast Materials / Optical properties fast Spectrum analysis fast Ellipsometry Spectrum analysis Materials / Optical properties Spektralanalyse (DE-588)4132368-3 gnd rswk-swf Ellipsometrie (DE-588)4152025-7 gnd rswk-swf Ellipsometrie (DE-588)4152025-7 s Spektralanalyse (DE-588)4132368-3 s 1\p DE-604 Erscheint auch als Druck-Ausgabe 978-0-470-01608-4 https://onlinelibrary.wiley.com/doi/book/10.1002/9780470060193 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Fujiwara, Hiroyuki Spectroscopic ellipsometry principles and applications SCIENCE / Nanoscience bisacsh Ellipsometry fast Materials / Optical properties fast Spectrum analysis fast Ellipsometry Spectrum analysis Materials / Optical properties Spektralanalyse (DE-588)4132368-3 gnd Ellipsometrie (DE-588)4152025-7 gnd |
| subject_GND | (DE-588)4132368-3 (DE-588)4152025-7 |
| title | Spectroscopic ellipsometry principles and applications |
| title_auth | Spectroscopic ellipsometry principles and applications |
| title_exact_search | Spectroscopic ellipsometry principles and applications |
| title_full | Spectroscopic ellipsometry principles and applications Hiroyuki Fujiwara |
| title_fullStr | Spectroscopic ellipsometry principles and applications Hiroyuki Fujiwara |
| title_full_unstemmed | Spectroscopic ellipsometry principles and applications Hiroyuki Fujiwara |
| title_short | Spectroscopic ellipsometry |
| title_sort | spectroscopic ellipsometry principles and applications |
| title_sub | principles and applications |
| topic | SCIENCE / Nanoscience bisacsh Ellipsometry fast Materials / Optical properties fast Spectrum analysis fast Ellipsometry Spectrum analysis Materials / Optical properties Spektralanalyse (DE-588)4132368-3 gnd Ellipsometrie (DE-588)4152025-7 gnd |
| topic_facet | SCIENCE / Nanoscience Ellipsometry Materials / Optical properties Spectrum analysis Spektralanalyse Ellipsometrie |
| url | https://onlinelibrary.wiley.com/doi/book/10.1002/9780470060193 |
| work_keys_str_mv | AT fujiwarahiroyuki spectroscopicellipsometryprinciplesandapplications |