Thin film analysis by X-ray scattering:
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| Main Author: | |
|---|---|
| Other Authors: | , |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Weinheim
Wiley-VCH
©2006
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| Subjects: | |
| Online Access: | FRO01 UBG01 UBM01 Volltext |
| Item Description: | Includes bibliographical references and index With contributions by Paul F. Fewster and Christoph Genzel. While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: w |
| Physical Description: | 1 Online-Ressource (xxii, 356 pages) |
| ISBN: | 9783527607594 9783527607044 9781280854125 |
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Record in the Search Index
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| author | Birkholz, Mario |
| author2 | Fewster, Paul F. Genzel, Christoph |
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| author_facet | Birkholz, Mario Fewster, Paul F. Genzel, Christoph |
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| dewey-full | 530.4275 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
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| id | DE-604.BV043385884 |
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| indexdate | 2024-07-10T07:24:30Z |
| institution | BVB |
| isbn | 9783527607594 9783527607044 9781280854125 |
| language | English |
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| physical | 1 Online-Ressource (xxii, 356 pages) |
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| publishDate | 2006 |
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| spelling | Birkholz, Mario Verfasser aut Thin film analysis by X-ray scattering Mario Birkholz ; with contributions by Paul F. Fewster, Christoph Genzel Weinheim Wiley-VCH ©2006 1 Online-Ressource (xxii, 356 pages) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index With contributions by Paul F. Fewster and Christoph Genzel. While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: w SCIENCE / Physics / General bisacsh SCIENCE / Mechanics / General bisacsh SCIENCE / Energy bisacsh Thin films fast X-ray spectroscopy fast Thin films X-ray spectroscopy Röntgenstrukturanalyse (DE-588)4137203-7 gnd rswk-swf Röntgenstreuung (DE-588)4178324-4 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 s Röntgenstreuung (DE-588)4178324-4 s 1\p DE-604 Röntgenstrukturanalyse (DE-588)4137203-7 s DE-604 Fewster, Paul F. ctb Genzel, Christoph ctb Erscheint auch als Druck-Ausgabe 978-3-527-31052-4 https://onlinelibrary.wiley.com/doi/book/10.1002/3527607595 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Birkholz, Mario Thin film analysis by X-ray scattering SCIENCE / Physics / General bisacsh SCIENCE / Mechanics / General bisacsh SCIENCE / Energy bisacsh Thin films fast X-ray spectroscopy fast Thin films X-ray spectroscopy Röntgenstrukturanalyse (DE-588)4137203-7 gnd Röntgenstreuung (DE-588)4178324-4 gnd Dünne Schicht (DE-588)4136925-7 gnd |
| subject_GND | (DE-588)4137203-7 (DE-588)4178324-4 (DE-588)4136925-7 |
| title | Thin film analysis by X-ray scattering |
| title_auth | Thin film analysis by X-ray scattering |
| title_exact_search | Thin film analysis by X-ray scattering |
| title_full | Thin film analysis by X-ray scattering Mario Birkholz ; with contributions by Paul F. Fewster, Christoph Genzel |
| title_fullStr | Thin film analysis by X-ray scattering Mario Birkholz ; with contributions by Paul F. Fewster, Christoph Genzel |
| title_full_unstemmed | Thin film analysis by X-ray scattering Mario Birkholz ; with contributions by Paul F. Fewster, Christoph Genzel |
| title_short | Thin film analysis by X-ray scattering |
| title_sort | thin film analysis by x ray scattering |
| topic | SCIENCE / Physics / General bisacsh SCIENCE / Mechanics / General bisacsh SCIENCE / Energy bisacsh Thin films fast X-ray spectroscopy fast Thin films X-ray spectroscopy Röntgenstrukturanalyse (DE-588)4137203-7 gnd Röntgenstreuung (DE-588)4178324-4 gnd Dünne Schicht (DE-588)4136925-7 gnd |
| topic_facet | SCIENCE / Physics / General SCIENCE / Mechanics / General SCIENCE / Energy Thin films X-ray spectroscopy Röntgenstrukturanalyse Röntgenstreuung Dünne Schicht |
| url | https://onlinelibrary.wiley.com/doi/book/10.1002/3527607595 |
| work_keys_str_mv | AT birkholzmario thinfilmanalysisbyxrayscattering AT fewsterpaulf thinfilmanalysisbyxrayscattering AT genzelchristoph thinfilmanalysisbyxrayscattering |