Thin film analysis by X-ray scattering:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Weitere Verfasser: | , |
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Weinheim
Wiley-VCH
©2006
|
| Schlagworte: | |
| Online-Zugang: | FRO01 UBG01 UBM01 Volltext |
| Beschreibung: | Includes bibliographical references and index With contributions by Paul F. Fewster and Christoph Genzel. While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: w |
| Beschreibung: | 1 Online-Ressource (xxii, 356 pages) |
| ISBN: | 9783527607594 9783527607044 9781280854125 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV043385884 | ||
| 003 | DE-604 | ||
| 005 | 20221025 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 160222s2006 |||| o||u| ||||||eng d | ||
| 020 | |a 9783527607594 |c electronic bk. |9 978-3-527-60759-4 | ||
| 020 | |a 9783527607044 |c electronic bk. |9 978-3-527-60704-4 | ||
| 020 | |a 9781280854125 |9 978-1-280-85412-5 | ||
| 024 | 7 | |a 10.1002/3527607595 |2 doi | |
| 035 | |a (ZDB-35-WIC)ocm85821169 | ||
| 035 | |a (OCoLC)917346579 | ||
| 035 | |a (DE-599)BVBBV043385884 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-861 |a DE-19 | ||
| 082 | 0 | |a 530.4275 |2 22 | |
| 084 | |a UP 7500 |0 (DE-625)146433: |2 rvk | ||
| 100 | 1 | |a Birkholz, Mario |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Thin film analysis by X-ray scattering |c Mario Birkholz ; with contributions by Paul F. Fewster, Christoph Genzel |
| 264 | 1 | |a Weinheim |b Wiley-VCH |c ©2006 | |
| 300 | |a 1 Online-Ressource (xxii, 356 pages) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 500 | |a With contributions by Paul F. Fewster and Christoph Genzel. While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: w | ||
| 650 | 7 | |a SCIENCE / Physics / General |2 bisacsh | |
| 650 | 7 | |a SCIENCE / Mechanics / General |2 bisacsh | |
| 650 | 7 | |a SCIENCE / Energy |2 bisacsh | |
| 650 | 7 | |a Thin films |2 fast | |
| 650 | 7 | |a X-ray spectroscopy |2 fast | |
| 650 | 4 | |a Thin films | |
| 650 | 4 | |a X-ray spectroscopy | |
| 650 | 0 | 7 | |a Röntgenstrukturanalyse |0 (DE-588)4137203-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Röntgenstreuung |0 (DE-588)4178324-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Dünne Schicht |0 (DE-588)4136925-7 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Dünne Schicht |0 (DE-588)4136925-7 |D s |
| 689 | 0 | 1 | |a Röntgenstreuung |0 (DE-588)4178324-4 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 689 | 1 | 0 | |a Dünne Schicht |0 (DE-588)4136925-7 |D s |
| 689 | 1 | 1 | |a Röntgenstrukturanalyse |0 (DE-588)4137203-7 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Fewster, Paul F. |4 ctb | |
| 700 | 1 | |a Genzel, Christoph |4 ctb | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-527-31052-4 |
| 856 | 4 | 0 | |u https://onlinelibrary.wiley.com/doi/book/10.1002/3527607595 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-35-WIC | ||
| 940 | 1 | |q UBG_PDA_WIC | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-028804468 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u https://onlinelibrary.wiley.com/doi/book/10.1002/3527607595 |l FRO01 |p ZDB-35-WIC |q FRO_PDA_WIC |x Verlag |3 Volltext | |
| 966 | e | |u https://onlinelibrary.wiley.com/doi/book/10.1002/3527607595 |l UBG01 |p ZDB-35-WIC |q UBG_PDA_WIC |x Verlag |3 Volltext | |
| 966 | e | |u https://onlinelibrary.wiley.com/doi/book/10.1002/3527607595 |l UBM01 |p ZDB-35-WIC |q UBM_Einzelkauf_2022 |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804175954652692480 |
|---|---|
| any_adam_object | |
| author | Birkholz, Mario |
| author2 | Fewster, Paul F. Genzel, Christoph |
| author2_role | ctb ctb |
| author2_variant | p f f pf pff c g cg |
| author_facet | Birkholz, Mario Fewster, Paul F. Genzel, Christoph |
| author_role | aut |
| author_sort | Birkholz, Mario |
| author_variant | m b mb |
| building | Verbundindex |
| bvnumber | BV043385884 |
| classification_rvk | UP 7500 |
| collection | ZDB-35-WIC |
| ctrlnum | (ZDB-35-WIC)ocm85821169 (OCoLC)917346579 (DE-599)BVBBV043385884 |
| dewey-full | 530.4275 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
| dewey-raw | 530.4275 |
| dewey-search | 530.4275 |
| dewey-sort | 3530.4275 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03329nmm a2200661zc 4500</leader><controlfield tag="001">BV043385884</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20221025 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">160222s2006 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527607594</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-3-527-60759-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527607044</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-3-527-60704-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781280854125</subfield><subfield code="9">978-1-280-85412-5</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1002/3527607595</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-35-WIC)ocm85821169</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)917346579</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV043385884</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-861</subfield><subfield code="a">DE-19</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">530.4275</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 7500</subfield><subfield code="0">(DE-625)146433:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Birkholz, Mario</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Thin film analysis by X-ray scattering</subfield><subfield code="c">Mario Birkholz ; with contributions by Paul F. Fewster, Christoph Genzel</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Weinheim</subfield><subfield code="b">Wiley-VCH</subfield><subfield code="c">©2006</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xxii, 356 pages)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">With contributions by Paul F. Fewster and Christoph Genzel. While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: w</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Physics / General</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Mechanics / General</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Energy</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Thin films</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">X-ray spectroscopy</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Thin films</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">X-ray spectroscopy</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Röntgenstrukturanalyse</subfield><subfield code="0">(DE-588)4137203-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Röntgenstreuung</subfield><subfield code="0">(DE-588)4178324-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Dünne Schicht</subfield><subfield code="0">(DE-588)4136925-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Dünne Schicht</subfield><subfield code="0">(DE-588)4136925-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Röntgenstreuung</subfield><subfield code="0">(DE-588)4178324-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Dünne Schicht</subfield><subfield code="0">(DE-588)4136925-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Röntgenstrukturanalyse</subfield><subfield code="0">(DE-588)4137203-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Fewster, Paul F.</subfield><subfield code="4">ctb</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Genzel, Christoph</subfield><subfield code="4">ctb</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-527-31052-4</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/3527607595</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-35-WIC</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">UBG_PDA_WIC</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-028804468</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/3527607595</subfield><subfield code="l">FRO01</subfield><subfield code="p">ZDB-35-WIC</subfield><subfield code="q">FRO_PDA_WIC</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/3527607595</subfield><subfield code="l">UBG01</subfield><subfield code="p">ZDB-35-WIC</subfield><subfield code="q">UBG_PDA_WIC</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/3527607595</subfield><subfield code="l">UBM01</subfield><subfield code="p">ZDB-35-WIC</subfield><subfield code="q">UBM_Einzelkauf_2022</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV043385884 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:24:30Z |
| institution | BVB |
| isbn | 9783527607594 9783527607044 9781280854125 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028804468 |
| oclc_num | 85821169 917346579 |
| open_access_boolean | |
| owner | DE-861 DE-19 DE-BY-UBM |
| owner_facet | DE-861 DE-19 DE-BY-UBM |
| physical | 1 Online-Ressource (xxii, 356 pages) |
| psigel | ZDB-35-WIC UBG_PDA_WIC ZDB-35-WIC FRO_PDA_WIC ZDB-35-WIC UBG_PDA_WIC ZDB-35-WIC UBM_Einzelkauf_2022 |
| publishDate | 2006 |
| publishDateSearch | 2006 |
| publishDateSort | 2006 |
| publisher | Wiley-VCH |
| record_format | marc |
| spelling | Birkholz, Mario Verfasser aut Thin film analysis by X-ray scattering Mario Birkholz ; with contributions by Paul F. Fewster, Christoph Genzel Weinheim Wiley-VCH ©2006 1 Online-Ressource (xxii, 356 pages) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index With contributions by Paul F. Fewster and Christoph Genzel. While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: w SCIENCE / Physics / General bisacsh SCIENCE / Mechanics / General bisacsh SCIENCE / Energy bisacsh Thin films fast X-ray spectroscopy fast Thin films X-ray spectroscopy Röntgenstrukturanalyse (DE-588)4137203-7 gnd rswk-swf Röntgenstreuung (DE-588)4178324-4 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 s Röntgenstreuung (DE-588)4178324-4 s 1\p DE-604 Röntgenstrukturanalyse (DE-588)4137203-7 s DE-604 Fewster, Paul F. ctb Genzel, Christoph ctb Erscheint auch als Druck-Ausgabe 978-3-527-31052-4 https://onlinelibrary.wiley.com/doi/book/10.1002/3527607595 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Birkholz, Mario Thin film analysis by X-ray scattering SCIENCE / Physics / General bisacsh SCIENCE / Mechanics / General bisacsh SCIENCE / Energy bisacsh Thin films fast X-ray spectroscopy fast Thin films X-ray spectroscopy Röntgenstrukturanalyse (DE-588)4137203-7 gnd Röntgenstreuung (DE-588)4178324-4 gnd Dünne Schicht (DE-588)4136925-7 gnd |
| subject_GND | (DE-588)4137203-7 (DE-588)4178324-4 (DE-588)4136925-7 |
| title | Thin film analysis by X-ray scattering |
| title_auth | Thin film analysis by X-ray scattering |
| title_exact_search | Thin film analysis by X-ray scattering |
| title_full | Thin film analysis by X-ray scattering Mario Birkholz ; with contributions by Paul F. Fewster, Christoph Genzel |
| title_fullStr | Thin film analysis by X-ray scattering Mario Birkholz ; with contributions by Paul F. Fewster, Christoph Genzel |
| title_full_unstemmed | Thin film analysis by X-ray scattering Mario Birkholz ; with contributions by Paul F. Fewster, Christoph Genzel |
| title_short | Thin film analysis by X-ray scattering |
| title_sort | thin film analysis by x ray scattering |
| topic | SCIENCE / Physics / General bisacsh SCIENCE / Mechanics / General bisacsh SCIENCE / Energy bisacsh Thin films fast X-ray spectroscopy fast Thin films X-ray spectroscopy Röntgenstrukturanalyse (DE-588)4137203-7 gnd Röntgenstreuung (DE-588)4178324-4 gnd Dünne Schicht (DE-588)4136925-7 gnd |
| topic_facet | SCIENCE / Physics / General SCIENCE / Mechanics / General SCIENCE / Energy Thin films X-ray spectroscopy Röntgenstrukturanalyse Röntgenstreuung Dünne Schicht |
| url | https://onlinelibrary.wiley.com/doi/book/10.1002/3527607595 |
| work_keys_str_mv | AT birkholzmario thinfilmanalysisbyxrayscattering AT fewsterpaulf thinfilmanalysisbyxrayscattering AT genzelchristoph thinfilmanalysisbyxrayscattering |