Testing for EMC compliance: approaches and techniques
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Hoboken, NJ
John Wiley
2004
|
| Schlagworte: | |
| Online-Zugang: | FRO01 UBG01 FHI01 FHN01 URL des Erstveröffentlichers |
| Beschreibung: | Includes bibliographical references (pages 447-451) and index The Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages |
| Beschreibung: | 1 Online-Ressource (xviii, 460 pages) |
| ISBN: | 0471644684 9780471644682 047164465X 9780471644651 1280367997 9781280367991 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV043385048 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 160222s2004 |||| o||u| ||||||eng d | ||
| 020 | |a 0471644684 |c electronic bk. |9 0-471-64468-4 | ||
| 020 | |a 9780471644682 |c electronic bk. |9 978-0-471-64468-2 | ||
| 020 | |a 047164465X |c electronic bk. |9 0-471-64465-X | ||
| 020 | |a 9780471644651 |c electronic bk. |9 978-0-471-64465-1 | ||
| 020 | |a 1280367997 |9 1-280-36799-7 | ||
| 020 | |a 9781280367991 |9 978-1-280-36799-1 | ||
| 024 | 7 | |a 10.1002/047164465X |2 doi | |
| 035 | |a (ZDB-35-WIC)ocm56354508 | ||
| 035 | |a (OCoLC)56354508 | ||
| 035 | |a (DE-599)BVBBV043385048 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-861 |a DE-573 |a DE-92 | ||
| 082 | 0 | |a 621.382/24 |2 22 | |
| 084 | |a ZN 4050 |0 (DE-625)157345: |2 rvk | ||
| 100 | 1 | |a Montrose, Mark I. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Testing for EMC compliance |b approaches and techniques |c Mark I. Montrose, Edward M. Nakauchi |
| 264 | 1 | |a Hoboken, NJ |b John Wiley |c 2004 | |
| 300 | |a 1 Online-Ressource (xviii, 460 pages) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references (pages 447-451) and index | ||
| 500 | |a The Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages | ||
| 650 | 4 | |a Electromagnetic compatibility / Power electronics / Mobile wireless communications | |
| 650 | 7 | |a COMPUTERS / Information Theory |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Signals & Signal Processing |2 bisacsh | |
| 650 | 7 | |a Electromagnetic compatibility |2 fast | |
| 650 | 7 | |a Electromagnetic interference |2 fast | |
| 650 | 4 | |a Electromagnetic compatibility | |
| 650 | 4 | |a Electromagnetic interference | |
| 650 | 0 | 7 | |a Messung |0 (DE-588)4038852-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Test |0 (DE-588)4059549-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektromagnetische Verträglichkeit |0 (DE-588)4138552-4 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektromagnetische Verträglichkeit |0 (DE-588)4138552-4 |D s |
| 689 | 0 | 1 | |a Messung |0 (DE-588)4038852-9 |D s |
| 689 | 0 | 2 | |a Test |0 (DE-588)4059549-3 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Nakauchi, Edward M. |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe, Hardcover |z 0-471-43308-X |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe, Hardcover |z 978-0-471-43308-8 |
| 856 | 4 | 0 | |u https://onlinelibrary.wiley.com/doi/book/10.1002/047164465X |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-35-WIC |a ZDB-35-WEL | ||
| 940 | 1 | |q UBG_PDA_WIC | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-028803632 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u https://onlinelibrary.wiley.com/doi/book/10.1002/047164465X |l FRO01 |p ZDB-35-WIC |q FRO_PDA_WIC |x Verlag |3 Volltext | |
| 966 | e | |u https://onlinelibrary.wiley.com/doi/book/10.1002/047164465X |l UBG01 |p ZDB-35-WIC |q UBG_PDA_WIC |x Verlag |3 Volltext | |
| 966 | e | |u https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237008 |l FHI01 |p ZDB-35-WEL |x Aggregator |3 Volltext | |
| 966 | e | |u https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237008 |l FHN01 |p ZDB-35-WEL |x Aggregator |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804175952923590656 |
|---|---|
| any_adam_object | |
| author | Montrose, Mark I. |
| author_facet | Montrose, Mark I. |
| author_role | aut |
| author_sort | Montrose, Mark I. |
| author_variant | m i m mi mim |
| building | Verbundindex |
| bvnumber | BV043385048 |
| classification_rvk | ZN 4050 |
| collection | ZDB-35-WIC ZDB-35-WEL |
| ctrlnum | (ZDB-35-WIC)ocm56354508 (OCoLC)56354508 (DE-599)BVBBV043385048 |
| dewey-full | 621.382/24 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.382/24 |
| dewey-search | 621.382/24 |
| dewey-sort | 3621.382 224 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03447nmm a2200685zc 4500</leader><controlfield tag="001">BV043385048</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">160222s2004 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0471644684</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">0-471-64468-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780471644682</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-0-471-64468-2</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">047164465X</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">0-471-64465-X</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780471644651</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-0-471-64465-1</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1280367997</subfield><subfield code="9">1-280-36799-7</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781280367991</subfield><subfield code="9">978-1-280-36799-1</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1002/047164465X</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-35-WIC)ocm56354508</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)56354508</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV043385048</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-861</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-92</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.382/24</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4050</subfield><subfield code="0">(DE-625)157345:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Montrose, Mark I.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Testing for EMC compliance</subfield><subfield code="b">approaches and techniques</subfield><subfield code="c">Mark I. Montrose, Edward M. Nakauchi</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hoboken, NJ</subfield><subfield code="b">John Wiley</subfield><subfield code="c">2004</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xviii, 460 pages)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references (pages 447-451) and index</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">The Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electromagnetic compatibility / Power electronics / Mobile wireless communications</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">COMPUTERS / Information Theory</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Signals & Signal Processing</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electromagnetic compatibility</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electromagnetic interference</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electromagnetic compatibility</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electromagnetic interference</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Messung</subfield><subfield code="0">(DE-588)4038852-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektromagnetische Verträglichkeit</subfield><subfield code="0">(DE-588)4138552-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektromagnetische Verträglichkeit</subfield><subfield code="0">(DE-588)4138552-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Messung</subfield><subfield code="0">(DE-588)4038852-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Nakauchi, Edward M.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe, Hardcover</subfield><subfield code="z">0-471-43308-X</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe, Hardcover</subfield><subfield code="z">978-0-471-43308-8</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/047164465X</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-35-WIC</subfield><subfield code="a">ZDB-35-WEL</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">UBG_PDA_WIC</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-028803632</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/047164465X</subfield><subfield code="l">FRO01</subfield><subfield code="p">ZDB-35-WIC</subfield><subfield code="q">FRO_PDA_WIC</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/047164465X</subfield><subfield code="l">UBG01</subfield><subfield code="p">ZDB-35-WIC</subfield><subfield code="q">UBG_PDA_WIC</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237008</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-35-WEL</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237008</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-35-WEL</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV043385048 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:24:28Z |
| institution | BVB |
| isbn | 0471644684 9780471644682 047164465X 9780471644651 1280367997 9781280367991 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028803632 |
| oclc_num | 56354508 |
| open_access_boolean | |
| owner | DE-861 DE-573 DE-92 |
| owner_facet | DE-861 DE-573 DE-92 |
| physical | 1 Online-Ressource (xviii, 460 pages) |
| psigel | ZDB-35-WIC ZDB-35-WEL UBG_PDA_WIC ZDB-35-WIC FRO_PDA_WIC ZDB-35-WIC UBG_PDA_WIC |
| publishDate | 2004 |
| publishDateSearch | 2004 |
| publishDateSort | 2004 |
| publisher | John Wiley |
| record_format | marc |
| spelling | Montrose, Mark I. Verfasser aut Testing for EMC compliance approaches and techniques Mark I. Montrose, Edward M. Nakauchi Hoboken, NJ John Wiley 2004 1 Online-Ressource (xviii, 460 pages) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references (pages 447-451) and index The Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages Electromagnetic compatibility / Power electronics / Mobile wireless communications COMPUTERS / Information Theory bisacsh TECHNOLOGY & ENGINEERING / Signals & Signal Processing bisacsh Electromagnetic compatibility fast Electromagnetic interference fast Electromagnetic compatibility Electromagnetic interference Messung (DE-588)4038852-9 gnd rswk-swf Test (DE-588)4059549-3 gnd rswk-swf Elektromagnetische Verträglichkeit (DE-588)4138552-4 gnd rswk-swf Elektromagnetische Verträglichkeit (DE-588)4138552-4 s Messung (DE-588)4038852-9 s Test (DE-588)4059549-3 s 1\p DE-604 Nakauchi, Edward M. Sonstige oth Erscheint auch als Druck-Ausgabe, Hardcover 0-471-43308-X Erscheint auch als Druck-Ausgabe, Hardcover 978-0-471-43308-8 https://onlinelibrary.wiley.com/doi/book/10.1002/047164465X Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Montrose, Mark I. Testing for EMC compliance approaches and techniques Electromagnetic compatibility / Power electronics / Mobile wireless communications COMPUTERS / Information Theory bisacsh TECHNOLOGY & ENGINEERING / Signals & Signal Processing bisacsh Electromagnetic compatibility fast Electromagnetic interference fast Electromagnetic compatibility Electromagnetic interference Messung (DE-588)4038852-9 gnd Test (DE-588)4059549-3 gnd Elektromagnetische Verträglichkeit (DE-588)4138552-4 gnd |
| subject_GND | (DE-588)4038852-9 (DE-588)4059549-3 (DE-588)4138552-4 |
| title | Testing for EMC compliance approaches and techniques |
| title_auth | Testing for EMC compliance approaches and techniques |
| title_exact_search | Testing for EMC compliance approaches and techniques |
| title_full | Testing for EMC compliance approaches and techniques Mark I. Montrose, Edward M. Nakauchi |
| title_fullStr | Testing for EMC compliance approaches and techniques Mark I. Montrose, Edward M. Nakauchi |
| title_full_unstemmed | Testing for EMC compliance approaches and techniques Mark I. Montrose, Edward M. Nakauchi |
| title_short | Testing for EMC compliance |
| title_sort | testing for emc compliance approaches and techniques |
| title_sub | approaches and techniques |
| topic | Electromagnetic compatibility / Power electronics / Mobile wireless communications COMPUTERS / Information Theory bisacsh TECHNOLOGY & ENGINEERING / Signals & Signal Processing bisacsh Electromagnetic compatibility fast Electromagnetic interference fast Electromagnetic compatibility Electromagnetic interference Messung (DE-588)4038852-9 gnd Test (DE-588)4059549-3 gnd Elektromagnetische Verträglichkeit (DE-588)4138552-4 gnd |
| topic_facet | Electromagnetic compatibility / Power electronics / Mobile wireless communications COMPUTERS / Information Theory TECHNOLOGY & ENGINEERING / Signals & Signal Processing Electromagnetic compatibility Electromagnetic interference Messung Test Elektromagnetische Verträglichkeit |
| url | https://onlinelibrary.wiley.com/doi/book/10.1002/047164465X |
| work_keys_str_mv | AT montrosemarki testingforemccomplianceapproachesandtechniques AT nakauchiedwardm testingforemccomplianceapproachesandtechniques |