An introduction to surface analysis by XPS and AES:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Chichester, West Sussex, England
J. Wiley
©2003
|
| Schlagworte: | |
| Online-Zugang: | FRO01 UBG01 Volltext |
| Beschreibung: | Includes bibliographical references (pages 195-202) and index Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods. Includes an accessible introduction to the key spectroscopic techniques in surface analysis. Provides descriptions of latest instruments and techniques. Includes a detailed glossary of key surface analysis terms |
| Beschreibung: | 1 Online-Ressource (x, 212 pages) |
| ISBN: | 0470864427 9780470864425 0470867930 9780470867938 1280556021 9781280556029 |
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Datensatz im Suchindex
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| author | Watts, John F. |
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| dewey-search | 620/.44 |
| dewey-sort | 3620 244 |
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| discipline | Chemie / Pharmazie Physik |
| format | Electronic eBook |
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| indexdate | 2024-07-10T07:24:28Z |
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| spelling | Watts, John F. Verfasser aut An introduction to surface analysis by XPS and AES John F. Watts, John Wolstenholme Chichester, West Sussex, England J. Wiley ©2003 1 Online-Ressource (x, 212 pages) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references (pages 195-202) and index Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods. Includes an accessible introduction to the key spectroscopic techniques in surface analysis. Provides descriptions of latest instruments and techniques. Includes a detailed glossary of key surface analysis terms General Materials Science FACsci ER / Internet / Book / Full text TECHNOLOGY & ENGINEERING / Nanotechnology & MEMS. bisacsh Electron spectroscopy cct Surfaces (Technology) / Analysis cct Electron spectroscopy fast Surfaces (Technology) / Analysis fast Surfaces (Technology) / Analysis Electron spectroscopy Elektronenspektroskopie (DE-588)4014332-6 gnd rswk-swf Auger-Spektroskopie (DE-588)4122843-1 gnd rswk-swf Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 s Auger-Spektroskopie (DE-588)4122843-1 s 1\p DE-604 Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 s 2\p DE-604 Elektronenspektroskopie (DE-588)4014332-6 s 3\p DE-604 Wolstenholme, John Sonstige oth Erscheint auch als Druck-Ausgabe, Hardcover 0-470-84712-3 Erscheint auch als Druck-Ausgabe, Hardcover 978-0-470-84712-1 Erscheint auch als Druck-Ausgabe, Paperback 0-470-84713-1 Erscheint auch als Druck-Ausgabe, Paperback 978-0-470-84713-8 https://onlinelibrary.wiley.com/doi/book/10.1002/0470867930 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Watts, John F. An introduction to surface analysis by XPS and AES General Materials Science FACsci ER / Internet / Book / Full text TECHNOLOGY & ENGINEERING / Nanotechnology & MEMS. bisacsh Electron spectroscopy cct Surfaces (Technology) / Analysis cct Electron spectroscopy fast Surfaces (Technology) / Analysis fast Surfaces (Technology) / Analysis Electron spectroscopy Elektronenspektroskopie (DE-588)4014332-6 gnd Auger-Spektroskopie (DE-588)4122843-1 gnd Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| subject_GND | (DE-588)4014332-6 (DE-588)4122843-1 (DE-588)4076787-5 (DE-588)4172243-7 |
| title | An introduction to surface analysis by XPS and AES |
| title_auth | An introduction to surface analysis by XPS and AES |
| title_exact_search | An introduction to surface analysis by XPS and AES |
| title_full | An introduction to surface analysis by XPS and AES John F. Watts, John Wolstenholme |
| title_fullStr | An introduction to surface analysis by XPS and AES John F. Watts, John Wolstenholme |
| title_full_unstemmed | An introduction to surface analysis by XPS and AES John F. Watts, John Wolstenholme |
| title_short | An introduction to surface analysis by XPS and AES |
| title_sort | an introduction to surface analysis by xps and aes |
| topic | General Materials Science FACsci ER / Internet / Book / Full text TECHNOLOGY & ENGINEERING / Nanotechnology & MEMS. bisacsh Electron spectroscopy cct Surfaces (Technology) / Analysis cct Electron spectroscopy fast Surfaces (Technology) / Analysis fast Surfaces (Technology) / Analysis Electron spectroscopy Elektronenspektroskopie (DE-588)4014332-6 gnd Auger-Spektroskopie (DE-588)4122843-1 gnd Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| topic_facet | General Materials Science FACsci ER / Internet / Book / Full text TECHNOLOGY & ENGINEERING / Nanotechnology & MEMS. Electron spectroscopy Surfaces (Technology) / Analysis Elektronenspektroskopie Auger-Spektroskopie Röntgen-Photoelektronenspektroskopie Oberflächenanalyse |
| url | https://onlinelibrary.wiley.com/doi/book/10.1002/0470867930 |
| work_keys_str_mv | AT wattsjohnf anintroductiontosurfaceanalysisbyxpsandaes AT wolstenholmejohn anintroductiontosurfaceanalysisbyxpsandaes |