Verfügbarkeit: The boundary-scan handbook

The boundary-scan handbook:

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Bibliographische Detailangaben
1. Verfasser:	Parker, Kenneth P. (VerfasserIn)
Format:	Elektronisch E-Book
Sprache:	English
Veröffentlicht:	Cham Springer International Publishing [2016]
Ausgabe:	Fourth edition
Schlagworte:	Engineering Microprocessors Semiconductors Electronic circuits Circuits and Systems Processor Architectures Ingenieurwissenschaften Boundary scan
Online-Zugang:	BTU01 FAB01 FAW01 FHA01 FHI01 FHN01 FHR01 FKE01 FRO01 FWS01 FWS02 UBY01 Volltext Inhaltsverzeichnis Abstract
Beschreibung:	1 Online Ressource (xxxiv, 552 p. 215 illus)
ISBN:	9783319011745
DOI:	10.1007/978-3-319-01174-5

Internformat

MARC


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Datensatz im Suchindex

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adam_text	THE BOUNDARY-SCAN HANDBOOK / PARKER, KENNETH P. : 2016 TABLE OF CONTENTS / INHALTSVERZEICHNIS BOUNDARY-SCAN BASICS AND VOCABULARY.- BOUNDARY-SCAN DESCRIPTION LANGUAGE (BSDL) BOUNDARY-SCAN TESTING ADVANCED BOUNDARY-SCAN TOPICS DESIGN FOR BOUNDARY-SCAN TEST ANALOG MEASUREMENT BASICS IEEE 1149.4 ANALOG BOUNDARY-SCAN.- IEEE 1149.6 TESTING ADVANCED I/O.- IEEE 1532:IN-SYSTEM CONFIGURATION IEEE 1149.8.1: PASSIVE COMPONENTS IEEE 1149.1:THE 2013 REVISION.- IEEE 1149.6: THE 2015 REVISION DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT. THE BOUNDARY-SCAN HANDBOOK / PARKER, KENNETH P. : 2016 ABSTRACT / INHALTSTEXT AIMED AT ELECTRONICS INDUSTRY PROFESSIONALS, THIS 4TH EDITION OF THE BOUNDARY SCANHANDBOOK DESCRIBES RECENT CHANGES TO THE IEEE1149.1 STANDARD TEST ACCESS PORT ANDBOUNDARY-SCAN ARCHITECTURE. THIS UPDATED EDITION FEATURES NEW CHAPTERS ON THE POSSIBLEEFFECTS OF THE CHANGES ON THE WORK OF THE PRACTICING TEST ENGINEERS AND THE NEW1149.8.1 STANDARD. ANYONE NEEDING TO UNDERSTAND THE BASICS OF BOUNDARY SCAN AND ITSPRACTICAL INDUSTRIAL IMPLEMENTATION WILL NEED THIS BOOK. PROVIDES AN OVERVIEW OF THE RECENT CHANGES TO THE 1149.1 STANDARD AND THE EFFECTOF THE CHANGES ON THE WORK OF TEST ENGINEERS; EXPLAINS THE NEW IEEE 1149.8.1 SUBSIDIARY STANDARD AND APPLICATIONS; DESCRIBES THE LATEST UPDATES ON THE SUPPLEMENTARY IEEE TESTING STANDARDS. IN PARTICULAR, ADDRESSES: IEEE STD 1149.1 DIGITAL BOUNDARY-SCAN IEEE STD 1149.4 ANALOG BOUNDARY-SCAN IEEE STD 1149.6 ADVANCED I/O TESTING IEEE STD 1149.8.1 PASSIVE COMPONENT TESTING IEEE STD 1149.1-2013 THE 2013 REVISION OF 1149.1 IEEE STD 1532 IN-SYSTEM CONFIGURATION IEEE STD 1149.6-2015 THE 2015 REVISION OF 1149.6 DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
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author	Parker, Kenneth P.
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isbn	9783319011745
language	English
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spellingShingle	Parker, Kenneth P. The boundary-scan handbook Engineering Microprocessors Semiconductors Electronic circuits Circuits and Systems Processor Architectures Ingenieurwissenschaften Boundary scan (DE-588)4340209-4 gnd
subject_GND	(DE-588)4340209-4
title	The boundary-scan handbook
title_auth	The boundary-scan handbook
title_exact_search	The boundary-scan handbook
title_full	The boundary-scan handbook Kenneth P. Parker
title_fullStr	The boundary-scan handbook Kenneth P. Parker
title_full_unstemmed	The boundary-scan handbook Kenneth P. Parker
title_short	The boundary-scan handbook
title_sort	the boundary scan handbook
topic	Engineering Microprocessors Semiconductors Electronic circuits Circuits and Systems Processor Architectures Ingenieurwissenschaften Boundary scan (DE-588)4340209-4 gnd
topic_facet	Engineering Microprocessors Semiconductors Electronic circuits Circuits and Systems Processor Architectures Ingenieurwissenschaften Boundary scan
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