ISTFA 2001: proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
c2001
|
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | Sponsored by EDFAS, ISTFA. Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource (xix, 485 p.) |
| ISBN: | 0871707462 1615030859 9780871707468 9781615030859 |
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Datensatz im Suchindex
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| spelling | International Symposium for Testing and Failure Analysis < 2001, Santa Clara, Calif.> Verfasser aut ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California sponsored by EDFAS. Proceedings of the 27th International Symposium or Testing and Failure Analysis Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis Materials Park, OH ASM International c2001 1 Online-Ressource (xix, 485 p.) txt rdacontent c rdamedia cr rdacarrier Sponsored by EDFAS, ISTFA. Includes bibliographical references and index TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Elektronik (DE-588)4014346-6 s Prüftechnik (DE-588)4047610-8 s DE-604 ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=395850 Aggregator Volltext |
| spellingShingle | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4014346-6 (DE-588)4047610-8 (DE-588)1071861417 |
| title | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California |
| title_alt | Proceedings of the 27th International Symposium or Testing and Failure Analysis Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California |
| title_exact_search | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California |
| title_full | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California sponsored by EDFAS. |
| title_fullStr | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California sponsored by EDFAS. |
| title_full_unstemmed | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California sponsored by EDFAS. |
| title_short | ISTFA 2001 |
| title_sort | istfa 2001 proceedings of the 27th international symposium for testing and failure analysis 11 15 november 2001 santa clara convention center santa clara california |
| title_sub | proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated Electronic apparatus and appliances / Testing Electronics / Materials / Testing Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik Prüftechnik Konferenzschrift |
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