Monte Carlo modeling for electron microscopy and microanalysis:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York
Oxford University Press
1995
|
| Schriftenreihe: | Oxford series in optical and imaging sciences
9 |
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | Includes bibliographical references and index 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index 1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations? |
| Beschreibung: | 1 Online-Ressource (viii, 216 pages) |
| ISBN: | 0195088743 0195358465 9780195088748 9780195358469 |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV043153179 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 151126s1995 |||| o||u| ||||||eng d | ||
| 020 | |a 0195088743 |c acidfree paper |9 0-19-508874-3 | ||
| 020 | |a 0195358465 |c electronic bk. |9 0-19-535846-5 | ||
| 020 | |a 9780195088748 |9 978-0-19-508874-8 | ||
| 020 | |a 9780195358469 |c electronic bk. |9 978-0-19-535846-9 | ||
| 035 | |a (OCoLC)435816746 | ||
| 035 | |a (DE-599)BVBBV043153179 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1046 |a DE-1047 | ||
| 082 | 0 | |a 502/.8/25 |2 22 | |
| 100 | 1 | |a Joy, David C. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Monte Carlo modeling for electron microscopy and microanalysis |c David C. Joy |
| 264 | 1 | |a New York |b Oxford University Press |c 1995 | |
| 300 | |a 1 Online-Ressource (viii, 216 pages) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Oxford series in optical and imaging sciences |v 9 | |
| 500 | |a Includes bibliographical references and index | ||
| 500 | |a 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index | ||
| 500 | |a 1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations? | ||
| 650 | 4 | |a Electron microscopy | |
| 650 | 4 | |a Electron probe microanalysis | |
| 650 | 7 | |a SCIENCE / Electron Microscopes & Microscopy |2 bisacsh | |
| 650 | 7 | |a Electron microscopy / Computer simulation |2 fast | |
| 650 | 7 | |a Electron probe microanalysis / Computer simulation |2 fast | |
| 650 | 7 | |a Monte Carlo method |2 fast | |
| 650 | 4 | |a Electron microscopy |x Computer simulation | |
| 650 | 4 | |a Electron probe microanalysis |x Computer simulation | |
| 650 | 4 | |a Monte Carlo method | |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Monte-Carlo-Simulation |0 (DE-588)4240945-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |D s |
| 689 | 0 | 1 | |a Monte-Carlo-Simulation |0 (DE-588)4240945-7 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 689 | 1 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 1 | 1 | |a Monte-Carlo-Simulation |0 (DE-588)4240945-7 |D s |
| 689 | 1 | |8 2\p |5 DE-604 | |
| 856 | 4 | 0 | |u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287517 |x Aggregator |3 Volltext |
| 912 | |a ZDB-4-EBA | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-028577370 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287517 |l FAW01 |p ZDB-4-EBA |q FAW_PDA_EBA |x Aggregator |3 Volltext | |
| 966 | e | |u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287517 |l FAW02 |p ZDB-4-EBA |q FAW_PDA_EBA |x Aggregator |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804175615404802048 |
|---|---|
| any_adam_object | |
| author | Joy, David C. |
| author_facet | Joy, David C. |
| author_role | aut |
| author_sort | Joy, David C. |
| author_variant | d c j dc dcj |
| building | Verbundindex |
| bvnumber | BV043153179 |
| collection | ZDB-4-EBA |
| ctrlnum | (OCoLC)435816746 (DE-599)BVBBV043153179 |
| dewey-full | 502/.8/25 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502/.8/25 |
| dewey-search | 502/.8/25 |
| dewey-sort | 3502 18 225 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03608nmm a2200637zcb4500</leader><controlfield tag="001">BV043153179</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">151126s1995 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0195088743</subfield><subfield code="c">acidfree paper</subfield><subfield code="9">0-19-508874-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0195358465</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">0-19-535846-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780195088748</subfield><subfield code="9">978-0-19-508874-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780195358469</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-0-19-535846-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)435816746</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV043153179</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield><subfield code="a">DE-1047</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502/.8/25</subfield><subfield code="2">22</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Joy, David C.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Monte Carlo modeling for electron microscopy and microanalysis</subfield><subfield code="c">David C. Joy</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York</subfield><subfield code="b">Oxford University Press</subfield><subfield code="c">1995</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (viii, 216 pages)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Oxford series in optical and imaging sciences</subfield><subfield code="v">9</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations?</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron probe microanalysis</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Electron Microscopes & Microscopy</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electron microscopy / Computer simulation</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electron probe microanalysis / Computer simulation</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Monte Carlo method</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield><subfield code="x">Computer simulation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron probe microanalysis</subfield><subfield code="x">Computer simulation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Monte Carlo method</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Monte-Carlo-Simulation</subfield><subfield code="0">(DE-588)4240945-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Monte-Carlo-Simulation</subfield><subfield code="0">(DE-588)4240945-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Monte-Carlo-Simulation</subfield><subfield code="0">(DE-588)4240945-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287517</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-EBA</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-028577370</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287517</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-4-EBA</subfield><subfield code="q">FAW_PDA_EBA</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287517</subfield><subfield code="l">FAW02</subfield><subfield code="p">ZDB-4-EBA</subfield><subfield code="q">FAW_PDA_EBA</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV043153179 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:19:06Z |
| institution | BVB |
| isbn | 0195088743 0195358465 9780195088748 9780195358469 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028577370 |
| oclc_num | 435816746 |
| open_access_boolean | |
| owner | DE-1046 DE-1047 |
| owner_facet | DE-1046 DE-1047 |
| physical | 1 Online-Ressource (viii, 216 pages) |
| psigel | ZDB-4-EBA ZDB-4-EBA FAW_PDA_EBA |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Oxford University Press |
| record_format | marc |
| series2 | Oxford series in optical and imaging sciences |
| spelling | Joy, David C. Verfasser aut Monte Carlo modeling for electron microscopy and microanalysis David C. Joy New York Oxford University Press 1995 1 Online-Ressource (viii, 216 pages) txt rdacontent c rdamedia cr rdacarrier Oxford series in optical and imaging sciences 9 Includes bibliographical references and index 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index 1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations? Electron microscopy Electron probe microanalysis SCIENCE / Electron Microscopes & Microscopy bisacsh Electron microscopy / Computer simulation fast Electron probe microanalysis / Computer simulation fast Monte Carlo method fast Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Monte-Carlo-Simulation (DE-588)4240945-7 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Monte-Carlo-Simulation (DE-588)4240945-7 s 1\p DE-604 Elektronenmikroskopie (DE-588)4014327-2 s 2\p DE-604 http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287517 Aggregator Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Joy, David C. Monte Carlo modeling for electron microscopy and microanalysis Electron microscopy Electron probe microanalysis SCIENCE / Electron Microscopes & Microscopy bisacsh Electron microscopy / Computer simulation fast Electron probe microanalysis / Computer simulation fast Monte Carlo method fast Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Elektronenmikroskopie (DE-588)4014327-2 gnd Monte-Carlo-Simulation (DE-588)4240945-7 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4240945-7 (DE-588)4151898-6 |
| title | Monte Carlo modeling for electron microscopy and microanalysis |
| title_auth | Monte Carlo modeling for electron microscopy and microanalysis |
| title_exact_search | Monte Carlo modeling for electron microscopy and microanalysis |
| title_full | Monte Carlo modeling for electron microscopy and microanalysis David C. Joy |
| title_fullStr | Monte Carlo modeling for electron microscopy and microanalysis David C. Joy |
| title_full_unstemmed | Monte Carlo modeling for electron microscopy and microanalysis David C. Joy |
| title_short | Monte Carlo modeling for electron microscopy and microanalysis |
| title_sort | monte carlo modeling for electron microscopy and microanalysis |
| topic | Electron microscopy Electron probe microanalysis SCIENCE / Electron Microscopes & Microscopy bisacsh Electron microscopy / Computer simulation fast Electron probe microanalysis / Computer simulation fast Monte Carlo method fast Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Elektronenmikroskopie (DE-588)4014327-2 gnd Monte-Carlo-Simulation (DE-588)4240945-7 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
| topic_facet | Electron microscopy Electron probe microanalysis SCIENCE / Electron Microscopes & Microscopy Electron microscopy / Computer simulation Electron probe microanalysis / Computer simulation Monte Carlo method Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Elektronenmikroskopie Monte-Carlo-Simulation Elektronenstrahlmikroanalyse |
| url | http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287517 |
| work_keys_str_mv | AT joydavidc montecarlomodelingforelectronmicroscopyandmicroanalysis |