ISTFA 2006: proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
2006
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| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource (xx, 524 p.) |
| ISBN: | 0871708442 1615030891 9780871708441 9781615030897 |
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| 246 | 1 | 3 | |a Proceedings of the 32nd International Symposium for Testing and Failure Analysis |
| 246 | 1 | 3 | |a Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis |
| 264 | 1 | |a Materials Park, OH |b ASM International |c 2006 | |
| 300 | |a 1 Online-Ressource (xx, 524 p.) | ||
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Datensatz im Suchindex
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| dewey-full | 621.3815/48 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| isbn | 0871708442 1615030891 9780871708441 9781615030897 |
| language | English |
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| spelling | International Symposium for Testing and Failure Analysis < 2006, Austin, Tex.> Verfasser aut ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2006, ASM International Proceedings of the 32nd International Symposium for Testing and Failure Analysis Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis Materials Park, OH ASM International 2006 1 Online-Ressource (xx, 524 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Materials Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content Electronic Device Failure Analysis Society Sonstige oth ASM International Sonstige oth http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=395897 Aggregator Volltext |
| spellingShingle | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Materials Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA |
| title_alt | Proceedings of the 32nd International Symposium for Testing and Failure Analysis Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA |
| title_exact_search | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA |
| title_full | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2006, ASM International |
| title_fullStr | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2006, ASM International |
| title_full_unstemmed | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2006, ASM International |
| title_short | ISTFA 2006 |
| title_sort | istfa 2006 proceedings of the 32nd international symposium for testing and failure analysis november 12 16 2006 renaissance austin hotel austin texas usa |
| title_sub | proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Materials Testing Congresses |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated Electronic apparatus and appliances / Testing Electronics / Materials / Testing Materials / Testing Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Materials Testing Congresses Konferenzschrift |
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