Microelectronics failure analysis: desk reference
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Materials Park, Ohio
ASM International
c2011
|
| Ausgabe: | 6th ed |
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | "ASM International, 2011, no. 09110Z"--P. 4 of cover. - Some online versions lack accompanying media packaged with the printed version Includes bibliographical references and indexes Section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information |
| Beschreibung: | 1 Online-Ressource (xi, 660 p.) |
| ISBN: | 1613447590 161503725X 1615037268 9781613447598 9781615037254 9781615037261 |
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| 650 | 4 | |a Microelectronics |x Defects |x Testing |v Handbooks, manuals, etc | |
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| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 6th ed |
| format | Electronic eBook |
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| spelling | Microelectronics failure analysis desk reference edited by Richard J. Ross ; EDFAS, ASM International Microelectronics failure analysis desk reference 6th ed Materials Park, Ohio ASM International c2011 1 Online-Ressource (xi, 660 p.) txt rdacontent c rdamedia cr rdacarrier "ASM International, 2011, no. 09110Z"--P. 4 of cover. - Some online versions lack accompanying media packaged with the printed version Includes bibliographical references and indexes Section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Defects Testing Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Electronics Materials Defects Handbooks, manuals, etc Ross, Richard J. Sonstige oth ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=395927 Aggregator Volltext |
| spellingShingle | Microelectronics failure analysis desk reference TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Defects Testing Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Electronics Materials Defects Handbooks, manuals, etc |
| title | Microelectronics failure analysis desk reference |
| title_alt | Microelectronics failure analysis desk reference |
| title_auth | Microelectronics failure analysis desk reference |
| title_exact_search | Microelectronics failure analysis desk reference |
| title_full | Microelectronics failure analysis desk reference edited by Richard J. Ross ; EDFAS, ASM International |
| title_fullStr | Microelectronics failure analysis desk reference edited by Richard J. Ross ; EDFAS, ASM International |
| title_full_unstemmed | Microelectronics failure analysis desk reference edited by Richard J. Ross ; EDFAS, ASM International |
| title_short | Microelectronics failure analysis |
| title_sort | microelectronics failure analysis desk reference |
| title_sub | desk reference |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Defects Testing Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Electronics Materials Defects Handbooks, manuals, etc |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Digital TECHNOLOGY & ENGINEERING / Electronics / Microelectronics Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Defects Testing Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Electronics Materials Defects Handbooks, manuals, etc |
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