ESD: failure mechanisms and models
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Chichester, West Sussex, U.K.
J. Wiley
2009
|
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | Includes bibliographical references and index Failure analysis and ESD -- Failure analysis tools, models, and physics of failure -- CMOS failure mechanisms -- CMOS circuits : receivers and off-chip drivers -- CMOS integration -- SOI ESD failure mechanisms -- RF CMOS and ESD -- Micro-electromechanical systems -- Gallium arsenide -- Smart power, LDMOS and BCD technology -- Magnetic recording -- Photo-masks and reticles : failure mechanisms |
| Beschreibung: | 1 Online-Ressource (xxiv, 384 p.) |
| ISBN: | 0470747250 0470747269 9780470747254 9780470747261 |
Internformat
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| 246 | 1 | 3 | |a Electrostatic discharge |
| 264 | 1 | |a Chichester, West Sussex, U.K. |b J. Wiley |c 2009 | |
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| 500 | |a Includes bibliographical references and index | ||
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| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Microelectronics |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Digital |2 bisacsh | |
| 650 | 7 | |a Electric discharges |2 fast | |
| 650 | 7 | |a Electrostatics |2 fast | |
| 650 | 7 | |a Integrated circuits / Protection |2 fast | |
| 650 | 7 | |a Integrated circuits / Reliability |2 fast | |
| 650 | 7 | |a Integrated circuits / Testing |2 fast | |
| 650 | 7 | |a Semiconductors / Failures |2 fast | |
| 650 | 4 | |a Semiconductors |x Failures | |
| 650 | 4 | |a Integrated circuits |x Protection | |
| 650 | 4 | |a Integrated circuits |x Testing | |
| 650 | 4 | |a Integrated circuits |x Reliability | |
| 650 | 4 | |a Electric discharges | |
| 650 | 4 | |a Electrostatics | |
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Datensatz im Suchindex
| _version_ | 1804175579074789376 |
|---|---|
| any_adam_object | |
| author | Voldman, Steven H. |
| author_facet | Voldman, Steven H. |
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| author_sort | Voldman, Steven H. |
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| bvnumber | BV043135497 |
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| ctrlnum | (OCoLC)441888589 (DE-599)BVBBV043135497 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:18:32Z |
| institution | BVB |
| isbn | 0470747250 0470747269 9780470747254 9780470747261 |
| language | English |
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| physical | 1 Online-Ressource (xxiv, 384 p.) |
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| publishDate | 2009 |
| publishDateSearch | 2009 |
| publishDateSort | 2009 |
| publisher | J. Wiley |
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| spelling | Voldman, Steven H. Verfasser aut ESD failure mechanisms and models Steven H. Voldman Electrostatic discharge Chichester, West Sussex, U.K. J. Wiley 2009 1 Online-Ressource (xxiv, 384 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Failure analysis and ESD -- Failure analysis tools, models, and physics of failure -- CMOS failure mechanisms -- CMOS circuits : receivers and off-chip drivers -- CMOS integration -- SOI ESD failure mechanisms -- RF CMOS and ESD -- Micro-electromechanical systems -- Gallium arsenide -- Smart power, LDMOS and BCD technology -- Magnetic recording -- Photo-masks and reticles : failure mechanisms TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh Electric discharges fast Electrostatics fast Integrated circuits / Protection fast Integrated circuits / Reliability fast Integrated circuits / Testing fast Semiconductors / Failures fast Semiconductors Failures Integrated circuits Protection Integrated circuits Testing Integrated circuits Reliability Electric discharges Electrostatics Wiley InterScience (Online service) Sonstige oth Erscheint auch als Druck-Ausgabe, Hardcover 0-470-51137-0 Erscheint auch als Druck-Ausgabe, Hardcover 978-0-470-51137-4 http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=323309 Aggregator Volltext |
| spellingShingle | Voldman, Steven H. ESD failure mechanisms and models TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh Electric discharges fast Electrostatics fast Integrated circuits / Protection fast Integrated circuits / Reliability fast Integrated circuits / Testing fast Semiconductors / Failures fast Semiconductors Failures Integrated circuits Protection Integrated circuits Testing Integrated circuits Reliability Electric discharges Electrostatics |
| title | ESD failure mechanisms and models |
| title_alt | Electrostatic discharge |
| title_auth | ESD failure mechanisms and models |
| title_exact_search | ESD failure mechanisms and models |
| title_full | ESD failure mechanisms and models Steven H. Voldman |
| title_fullStr | ESD failure mechanisms and models Steven H. Voldman |
| title_full_unstemmed | ESD failure mechanisms and models Steven H. Voldman |
| title_short | ESD |
| title_sort | esd failure mechanisms and models |
| title_sub | failure mechanisms and models |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh Electric discharges fast Electrostatics fast Integrated circuits / Protection fast Integrated circuits / Reliability fast Integrated circuits / Testing fast Semiconductors / Failures fast Semiconductors Failures Integrated circuits Protection Integrated circuits Testing Integrated circuits Reliability Electric discharges Electrostatics |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Microelectronics TECHNOLOGY & ENGINEERING / Electronics / Digital Electric discharges Electrostatics Integrated circuits / Protection Integrated circuits / Reliability Integrated circuits / Testing Semiconductors / Failures Semiconductors Failures Integrated circuits Protection Integrated circuits Testing Integrated circuits Reliability |
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